SLS
Super-Resolution X-ray Microscopy unveils the buried secrets of the nanoworld
Show Full VersionPublication in Science. A novel super-resolution X-ray microscope developed by a team of researchers from the Paul Scherrer Institut (PSI) and EPFL in Switzerland combines the high penetration power of x-rays with high spatial resolution, making it possible for the first time to shed light on the detailed interior composition of semiconductor devices and cellular structures.