List of Publications of the LMN
Papers Published 2020
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Armand Pilon FT, Niquet Y-M, Reboud V, Calvo V, Pauc N, Widiez J, et al.
Continuous wave lasing in strained germanium microbridge
In: 2020 IEEE photonics conference (IPC). Proceedings. IEEE photonics conference (IPC). Danvers, MA: IEEE; 2020:9252547 (2 pp.). https://doi.org/10.1109/IPC47351.2020.9252547
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Beckert A, Sigg H, Aeppli G
Taking advantage of multiplet structure for lineshape analysis in Fourier space
Optics Express. 2020; 28(17): 24937-24950. https://doi.org/10.1364/OE.395877
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Bokai KA, Tarasov AV, Shevelev VO, Vilkov OY, Makarova AA, Marchenko D, et al.
Hybrid h-BN-graphene monolayer with B-C boundaries on a lattice-matched surface
Chemistry of Materials. 2020; 32(3): 1172-1181. https://doi.org/10.1021/acs.chemmater.9b04207
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Choi J, Ivashko O, Blackburn E, Liang R, Bonn DA, Hardy WN, et al.
Spatially inhomogeneous competition between superconductivity and the charge density wave in YBa2Cu3O6.67
Nature Communications. 2020; 11: 990 (8 pp.). https://doi.org/10.1038/s41467-020-14536-1
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Chretien J, Pauc N, Thai QM, Armand Pilon F, Casiez L, Frauenrath M, et al.
Correlation between strain and maximum lasing temperature in GeSn microbridges
In: 2020 IEEE photonics conference (IPC). Proceedings. Vol. 2020. IEEE photonics conference (IPC). sine loco: IEEE; 2020:9252430 (2 pp.). https://doi.org/10.1109/IPC47351.2020.9252430
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De Ninno G, Wätzel J, Ribič PR, Allaria E, Coreno M, Danailov MB, et al.
Photoelectric effect with a twist
Nature Photonics. 2020; 14: 554-558. https://doi.org/10.1038/s41566-020-0669-y
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Debarre T, Watts B, Rösner B, Unser M
Hessian splines for scanning transmission X-ray microscopy
In: 2020 IEEE 17th international symposium on biomedical imaging (ISBI) proceedings. IEEE international symposium on biomedical imaging. Danvers: IEEE; 2020:199-202. https://doi.org/10.1109/ISBI45749.2020.9098539
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Dieleman CD, Ding W, Wu L, Thakur N, Bespalov I, Daiber B, et al.
Universal direct patterning of colloidal quantum dots by (extreme) ultraviolet and electron beam lithography
Nanoscale. 2020; 12(20): 11306-11316. https://doi.org/10.1039/d0nr01077d
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Driencourt L, Federspiel F, Kazazis D, Tseng L-T, Frantz R, Ekinci Y, et al.
Electrically tunable filter based on plasmonic phase retarder and liquid crystals
In: Chang-Hasnain CJ, Faraon A, Zhou W, eds. High contrast metastructures IX. Vol. 11290. Proceedings of SPIE. Bellingham, USA: SPIE; 2020:112901A (6 pp.). https://doi.org/10.1117/12.2543569
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Driencourt L, Federspiel F, Kazazis D, Tseng L-T, Frantz R, Ekinci Y, et al.
Electrically tunable multicolored filter using birefringent plasmonic resonators and liquid crystals
ACS Photonics. 2020; 7(2): 444-453. https://doi.org/10.1021/acsphotonics.9b01404
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Döring F, Rösner B, Langer M, Kubec A, Kleibert A, Raabe J, et al.
Multifocus off-axis zone plates for x-ray free-electron laser experiments
Optica. 2020; 7(8): 1007-1014. https://doi.org/10.1364/OPTICA.398022
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Engel RY, Miedema PS, Turenne D, Vaskivskyi I, Brenner G, Dziarzhytski S, et al.
Parallel broadband femtosecond reflection spectroscopy at a soft X-ray free-electron laser
Applied Sciences. 2020; 10(19): 6947 (8 pp.). https://doi.org/10.3390/app10196947
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Falkenberg G, Seiboth F, Koch F, Falch KV, Schropp A, Brückner D, et al.
CRL optics and silicon drift detector for P06 Microprobe experiments at 35 keV
Powder Diffraction. 2020; 35(S1): S34-S37. https://doi.org/10.1017/S0885715620000536
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Finizio S, Wintz S, Mayr S, Huxtable AJ, Langer M, Bailey J, et al.
Current-induced dynamical tilting of chiral domain walls in curved microwires
Applied Physics Letters. 2020; 116: 182404 (5 pp.). https://doi.org/10.1063/5.0005186
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Finizio S, Wintz S, Mayr S, Huxtable AJ, Langer M, Bailey J, et al.
Time-resolved visualization of the magnetization canting induced by field-like spin–orbit torques
Applied Physics Letters. 2020; 117(21): 212404 (6 pp.). https://doi.org/10.1063/5.0029816
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Flenner S, Kubec A, David C, Storm M, Schaber CF, Vollrath F, et al.
Hard X-ray nano-holotomography with a Fresnel zone plate
Optics Express. 2020; 28(25): 37514 (12 pp.). https://doi.org/10.1364/OE.406074
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Flenner S, Storm M, Kubec A, Longo E, Döring F, Pelt DM, et al.
Pushing the temporal resolution in absorption and Zernike phase contrast nanotomography: enabling fast in situ experiments
Journal of Synchrotron Radiation. 2020; 27: 1339-1346. https://doi.org/10.1107/S1600577520007407
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Frey M, Adelmann A, Locans U
On architecture and performance of adaptive mesh refinement in an electrostatics Particle-In-Cell code
Computer Physics Communications. 2020; 247: 106912 (18 pp.). https://doi.org/10.1016/j.cpc.2019.106912
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Frolov AS, Sánchez-Barriga J, Callaert C, Hadermann J, Fedorov AV, Usachov DY, et al.
Atomic and electronic structure of a multidomain GeTe crystal
ACS Nano. 2020; 14(12): 16576-16589. https://doi.org/10.1021/acsnano.0c05851
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Förster S, Schenk S, Zollner EM, Krahn O, Chiang C-T, Schumann FO, et al.
Quasicrystals and their approximants in 2D ternary oxides
Physica Status Solidi B: Basic Research. 2020; 257(7): 1900624 (11 pp.). https://doi.org/10.1002/pssb.201900624
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Grimm O, Bednarzik M, Birrer G, Commichau V
Changes in detection characteristics of CdTe X-ray sensors by proton irradiation
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2020; 972: 164116 (9 pp.). https://doi.org/10.1016/j.nima.2020.164116
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Grimm A, Frattini NE, Puri S, Mundhada SO, Touzard S, Mirrahimi M, et al.
Stabilization and operation of a Kerr-cat qubit
Nature. 2020; 584(7820): 205-209. https://doi.org/10.1038/s41586-020-2587-z
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Hengsberger M, Leuenberger D, Schuler A, Roth S, Muntwiler M
Dynamics of excited interlayer states in hexagonal boron nitride monolayers
Journal of Physics D: Applied Physics. 2020; 53(20): 203001 (28 pp.). https://doi.org/10.1088/1361-6463/ab70c6
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Holler M, Odstrčil M, Guizar-Sicairos M, Lebugle M, Frommherz U, Lachat T, et al.
LamNI - an instrument for X-ray scanning microscopy in laminography geometry
Journal of Synchrotron Radiation. 2020; 27: 730-736. https://doi.org/10.1107/S1600577520003586
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Ischebeck R, Bettoni S, Borrelli S, Calvi M, Dijkstal P, Ferrari E, et al.
Characterization of the electron beam in the ACHIP chamber in SwissFEL
In: Cianchi A, Assmann R, Ferrario M, Holzer B, Nghiem P, Delerue N, et al., eds. 4th European advanced accelerator concepts workshop 15-20 September 2019, Isola d'Elba, Italy. Vol. 1596. Journal of physics: conference series. sine loco: IOP Publishing; 2020:012019 (6 pp.). https://doi.org/10.1088/1742-6596/1596/1/012019
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Jarząbek DM, Milczarek M, Nosewicz S, Bazarnik P, Schift H
Size effects of hardness and strain rate sensitivity in amorphous silicon measured by nanoindentation
Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science. 2020; 51: 1625-1633. https://doi.org/10.1007/s11661-020-05648-w
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Karpik A, Martiel I, Kristiansen PM, Padeste C
Fabrication of ultrathin suspended polymer membranes as supports for serial protein crystallography
Micro and Nano Engineering. 2020; 7: 100053 (6 pp.). https://doi.org/10.1016/j.mne.2020.100053
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Kazazis D, Tseng L-T, Ekinci Y
Achromatic Talbot lithography with nano-ring masks for high-throughput periodic patterning
Microelectronic Engineering. 2020; 225: 111273 (7 pp.). https://doi.org/10.1016/j.mee.2020.111273
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Kim YY, Gelisio L, Mercurio G, Dziarzhytski S, Beye M, Bocklage L, et al.
Ghost imaging at an XUV free-electron laser
Physical Review A. 2020; 101(1): 013820 (7 pp.). https://doi.org/10.1103/PhysRevA.101.013820
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Kim H, Locans U, Nebling R, Dejkameh A, Kazazis D, Ekinci Y, et al.
High resolution and uniform image reconstruction in a large field-of-view for EUV actinic mask review
In: Preil ME, ed. Photomask technology 2020. Vol. 11518. Proceedings of SPIE. Bellingham, USA: SPIE; 2020:115180X (7 pp.).
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Kirchner R, Neumann V, Winkler F, Strobel C, Völkel S, Hiess A, et al.
Anisotropic etching of pyramidal silica reliefs with metal masks and hydrofluoric acid
Small. 2020; 16(43): 2002290 (7 pp.). https://doi.org/10.1002/smll.202002290
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Kirk E, Bull C, Finizio S, Sepehri-Amin H, Wintz S, Suszka AK, et al.
Anisotropy-induced spin reorientation in chemically modulated amorphous ferrimagnetic films
Physical Review Materials. 2020; 4(7): 074403 (7 pp.). https://doi.org/10.1103/PhysRevMaterials.4.074403
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Krucker S, Hurford GJ, Grimm O, Kögl S, Gröbelbauer H-P, Etesi L, et al.
The spectrometer/telescope for imaging X-rays (STIX)
Astronomy and Astrophysics. 2020; 642: A15 (21 pp.). https://doi.org/10.1051/0004-6361/201937362
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Longo E, Sancey L, Flenner S, Kubec A, Bonnin A, David C, et al.
X-ray Zernike phase contrast tomography: 3D ROI visualization of mm-sized mice organ tissues down to sub-cellular components
Biomedical Optics Express. 2020; 11(10): 5506 (12 pp.). https://doi.org/10.1364/BOE.396695
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Makita M, Seniutinas G, Seaberg MH, Lee HJ, Galtier EC, Liang M, et al.
Double grating shearing interferometry for X-ray free-electron laser beams
Optica. 2020; 7(5): 404-409. https://doi.org/10.1364/OPTICA.390601
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Martiel I, Mozzanica A, Opara NL, Panepucci E, Leonarski F, Redford S, et al.
X-ray fluorescence detection for serial macromolecular crystallography using a JUNGFRAU pixel detector
Journal of Synchrotron Radiation. 2020; 27: 329-339. https://doi.org/10.1107/S1600577519016758
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Mochi I, Kim H-S, Locans U, Dejkameh A, Nebling R, Kazazis D, et al.
Illumination control in lensless imaging for EUV mask inspection and review
In: Felix NM, Lio A, eds. Extreme ultraviolet (EUV) lithography XI. Vol. 11323. Proceedings of SPIE. Bellingham, USA: SPIE; 2020:113231I (9 pp.). https://doi.org/10.1117/12.2552014
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Mochi I, Vockenhuber M, Allenet T, Ekinci Y
Open-source software for SEM metrology
In: Preil ME, ed. Photomask technology 2020. Vol. 11518. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2020:115180G (10 pp.).
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Mochi I, Fernandez S, Nebling R, Locans U, Rajeev R, Dejkameh A, et al.
Quantitative characterization of absorber and phase defects on EUV reticles using coherent diffraction imaging
Journal of Micro/Nanolithography, MEMS, and MOEMS. 2020; 19(1): 014002 (11 pp.). https://doi.org/10.1117/1.JMM.19.1.014002
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Mortelmans T, Kazazis D, Guzenko VA, Padeste C, Braun T, Li X, et al.
Grayscale e-beam lithography: effects of a delayed development for well-controlled 3D patterning
Microelectronic Engineering. 2020; 225: 111272 (5 pp.). https://doi.org/10.1016/j.mee.2020.111272
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Nebling R, Kim H-S, Locans U, Dejkameh A, Ekinci Y, Mochi I
Effects of the illumination NA on EUV mask inspection with coherent diffraction imaging
In: Naulleau PP, Gargini PA, Itani T, Ronse KG, eds. Extreme Ultraviolet Lithography 2020. Vol. 11517. Proceedings of SPIE. Sine loco: SPIE; 2020:115170W (6 pp.). https://doi.org/10.1117/12.2573181
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Nipoti R, Parisini A, Boldrini V, Vantaggio S, Gorni M, Canino M, et al.
Ion implanted phosphorous for 4h-sic vdmosfets source regions: effect of the post implantation annealing time
In: Yano H, Ohshima T, Eto K, Harada S, Mitani T, Tanaka Y, eds. Vol. 1004. Materials science forum. sine loco: Trans Tech Publications Ltd; 2020:698-704. https://doi.org/10.4028/www.scientific.net/MSF.1004.698
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Nishijima Y, Kurotsu T, Yamasaku N, Takahashii H, Kurihara K, Beni T, et al.
Improvement and stabilization of optical hydrogen sensing ability of Au-Pd alloys
Optics Express. 2020; 28(17): 25383-25391. https://doi.org/10.1364/OE.398784
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Orlandi GL, David C, Ferrari E, Guzenko VA, Ischebeck R, Prat E, et al.
Nanofabricated free-standing wire scanners for beam diagnostics with submicrometer resolution
Physical Review Accelerators and Beams. 2020; 23(4): 042802 (10 pp.). https://doi.org/10.1103/PhysRevAccelBeams.23.042802
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Osmani B, Schift H, Vogelsang K, Guzman R, Kristiansen PM, Crockett R, et al.
Hierarchically structured polydimethylsiloxane films for ultra-soft neural interfaces
Micro and Nano Engineering. 2020; 7: 100051 (5 pp.). https://doi.org/10.1016/j.mne.2020.100051
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Resnick D, Schift H
Imprint lithography
In: Smith BW, Suzuki K, eds. Microlithograph. Science and Technology. Boca Raton: CRC Press; 2020:595-677. https://doi.org/10.1201/9781315117171-11
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Robinson T, LeClaire J, Mochi I, Nebling RM, Ekinci Y, Kazazis D
Laser repair and clean of extreme ultraviolet lithography photomasks
In: Preil ME, ed. Photomask technology 2020. Vol. 11518. Proceedings of SPIE. Bellingham, USA: SPIE; 2020:1151809 (15 pp.).
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Romano L, Kagias M, Vila-Comamala J, Jefimovs K, Tseng L-T, Guzenko VA, et al.
Metal assisted chemical etching of silicon in the gas phase: a nanofabrication platform for X-ray optics
Nanoscale Horizons. 2020; 5(5): 869-879. https://doi.org/10.1039/C9NH00709A
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Rumo M, Nicholson CW, Pulkkinen A, Hildebrand B, Kremer G, Salzmann B, et al.
Examining the surface phase diagram of IrTe2 with photoemission
Physical Review B. 2020; 101(23): 235120 (8 pp.). https://doi.org/10.1103/PhysRevB.101.235120
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Rösner B, Fallica R, Johnson M, Späth A, Fink R, Ekinci Y, et al.
Nanolithographic top-down patterning of polyoxovanadate‐based nanostructures with switchable electrical resistivity
ChemNanoMat. 2020; 6(11): 1620-1624. https://doi.org/10.1002/cnma.202000425
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Rösner B, Vodungbo B, Chardonnet V, Döring F, Guzenko VA, Hennes M, et al.
Simultaneous two-color snapshot view on ultrafast charge and spin dynamics in a Fe-Cu-Ni tri-layer
Structural Dynamics. 2020; 7(5): 054302 (9 pp.). https://doi.org/10.1063/4.0000033
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Rösner B, Finizio S, Koch F, Döring F, Guzenko VA, Langer M, et al.
Soft x-ray microscopy with 7 nm resolution
Optica. 2020; 7(11): 1602-1608. https://doi.org/10.1364/OPTICA.399885
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Sassa Y, Johansson FOL, Lindblad A, Yazdi MG, Simonov K, Weissenrieder J, et al.
Kagome-like silicene: a novel exotic form of two-dimensional epitaxial silicon
Applied Surface Science. 2020; 530: 147195 (7 pp.). https://doi.org/10.1016/j.apsusc.2020.147195
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Seiboth F, Brückner D, Kahnt M, Lyubomirskiy M, Wittwer F, Dzhigaev D, et al.
Hard X-ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques
Journal of Synchrotron Radiation. 2020; 27(5): 1121-1130. https://doi.org/10.1107/S1600577520007900
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Seo J, Kim DY, An ES, Kim K, Kim G-Y, Hwang S-Y, et al.
Nearly room temperature ferromagnetism in a magnetic metal-rich van der Waals metal
Science Advances. 2020; 6(3): eaay8912 (9 pp.). https://doi.org/10.1126/sciadv.aay8912
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Stachnik K, Warmer M, Mohacsi I, Hennicke V, Fischer P, Meyer J, et al.
Multimodal X-ray imaging of nanocontainer-treated macrophages and calcium distribution in the perilacunar bone matrix
Scientific Reports. 2020; 10(1): 1784 (9 pp.). https://doi.org/10.1038/s41598-020-58318-7
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Storm M, Döring F, Marathe S, David C, Rau C
The Diamond I13 full-field transmission X-ray microscope: a Zernike phase-contrast setup for material sciences
Powder Diffraction. 2020. https://doi.org/10.1017/S0885715620000238
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Thakkar P, Guzenko V, Abrahams JP, Tsujino S, Lu PH, Dunin-Borkowski RE
Demonstration of the voltage-controlled three-beam interference of high-energy coherent electron beam
In: 33rd international vacuum nanoelectronics conference (IVNC) July 6-7, 2020. 2020 33rd international vacuum nanoelectronics conference (IVNC). Piscataway, New Jersey, United States: Institute of Electrical and Electronics Engineers; 2020:9203341 (2 pp.). https://doi.org/10.1109/IVNC49440.2020.9203341
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Thakkar P, Guzenko VA, Lu P-H, Dunin-Borkowski RE, Abrahams JP, Tsujino S
Fabrication of low aspect ratio three-element Boersch phase shifters for voltage-controlled three electron beam interference
Journal of Applied Physics. 2020; 128(13): 134502 (13 pp.). https://doi.org/10.1063/5.0020383
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Thakur N, Bliem R, Mochi I, Vockenhuber M, Ekinci Y, Castellanos S
Mixed-ligand zinc-oxoclusters: efficient chemistry for high resolution nanolithography
Journal of Materials Chemistry C. 2020; 8(41): 14499-14506. https://doi.org/10.1039/d0tc03597a
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Usachov DY, Tarasov AV, Schulz S, Bokai KA, Tupitsyn II, Poelchen G, et al.
Photoelectron diffraction for probing valency and magnetism of 4f-based materials: a view on valence-fluctuating EuIr2Si2
Physical Review B. 2020; 102(20): 205102 (11 pp.). https://doi.org/10.1103/PhysRevB.102.205102
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Wu Q, Hauldenschild M, Rösner B, Lombardo T, Schmidt-Ott K, Watts B, et al.
Does substrate colour affect the visual appearance of gilded medieval sculptures? Part I: colorimetry and interferometric microscopy of gilded models
Heritage Science. 2020; 8(1): 118 (15 pp.). https://doi.org/10.1186/s40494-020-00463-3
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Wu L, Bespalov I, Witte K, Lugier O, Haitjema J, Vockenhuber M, et al.
Unravelling the effect of fluorinated ligands in hybrid EUV photoresists by X-ray spectroscopy
Journal of Materials Chemistry C. 2020; 8(42): 14757-14765. https://doi.org/10.1039/d0tc03216f
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Xie S, Horváth B, Werder J, Schift H
Sub-micron silver wires on non-planar polymer substrates fabricated by thermal nanoimprint and back injection molding
Micro and Nano Engineering. 2020; 8: 100062 (8 pp.). https://doi.org/10.1016/j.mne.2020.100062
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Yurgens V, Koch F, Scheel M, Weitkamp T, David C
Measurement and compensation of misalignment in double-sided hard X-ray Fresnel zone plates
Journal of Synchrotron Radiation. 2020; 27: 583-589. https://doi.org/10.1107/S1600577520001757
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Zhou JS, Reining L, Nicolaou A, Bendounan A, Ruotsalainen K, Vanzini M, et al.
Unraveling intrinsic correlation effects with angle-resolved photoemission spectroscopy
Proceedings of the National Academy of Sciences of the United States of America PNAS. 2020. https://doi.org/10.1073/pnas.2012625117
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de Lima LH, Greber T, Muntwiler M
The true corrugation of a h-BN nanomesh layer
2D Materials. 2020; 7(3): 035006 (7 pp.). https://doi.org/10.1088/2053-1583/ab81ae
DORA PSI
Papers Published 2019
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Pilon FTA, Lyasota A, Niquet Y-M, Reboud V, Calvo V, Pauc N, et al.
Strained germanium lasing in the mid-infrared
In: 2019 IEEE 16th international conference on group IV photonics (GFP). Danvers, MA: IEEE; 2019:(2 pp.). https://doi.org/10.1109/GROUP4.2019.8925921
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Beni T, Yamasaku N, Kurotsu T, To N, Okazaki S, Arakawa T, et al.
Metamaterial for hydrogen sensing
ACS Sensors. 2019; 4(9): 2389-2394. https://doi.org/10.1021/acssensors.9b00980
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Gruber DP, Todt J, Wöhrl N, Zalesak J, Tkadletz M, Kubec A, et al.
Gradients of microstructure, stresses and mechanical properties in a multi-layered diamond thin film revealed by correlative cross-sectional nano-analytics
Carbon. 2019; 144: 666-674. https://doi.org/10.1016/j.carbon.2018.12.093
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Szmyt W, Calame M, Padeste C, Dransfeld C
Nanoengineering of fibre surface for carbon fibre-carbon nanotube hierarchical composites
In: Mouritz A, Wang C, Fox B, eds. Proceedings of the 2019 international conference on composite materials (ICCM 2019). Melbourne, Australia: RMIT University; 2019:(9 pp.). www.iccm-central.org/Proceedings/ICCM22proceedings/papers/ICCM22_Full_Paper_260.pdf.
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Orlandi GL, Borrelli S, David C, Ferrari E, Guzenko V, Hermann B, et al.
Wire-scanners with sub-micrometer resolution: Developments and measurements
In: Decking W, Sinn H, Geloni G, Schreiber S, Marx M, Schaa VRW, eds. 39th international free-electron laser conference. FEL2019. Proceedings. Vol. 39. Free electron laser conference. Geneva: JACoW Publishing; 2019:307-310. https://doi.org/10.18429/JACoW-FEL2019-WEB02
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Woerle J, Šimonka V, Müller E, Hössinger A, Sigg H, Selberherr S, et al.
Surface morphology of 4H-SiC after thermal oxidation
In: Gammon PM, Shah VA, McMahon RA, Jennings MR, Vavasour O, Padfield F, et al., eds. Vol. 963. Materials science forum. sine loco: Trans Tech Publications Ltd.; 2019:180-183. https://doi.org/10.4028/www.scientific.net/MSF.963.180
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Chretien J, Pauc N, Pilon FA, Bertrand M, Thai Q-M, Casiez L, et al.
GeSn lasers with uniaxial tensile strain in the gain medium
In: 2019 IEEE 16th international conference on group IV photonics (GFP). Danvers: IEEE; 2019:8926113 (2 pp.). https://doi.org/10.1109/GROUP4.2019.8926113
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Chick S, Matmon G, Murdin B, Naftaly M
Metrology of complex refractive index for solids in the terahertz regime using frequency domain spectroscopy
In: 2019 44th international conference on infrared, millimeter, and terahertz waves (IRMMW-THz). Danvers: IEEE; 2019:8873778 (3 pp.). https://doi.org/10.1109/IRMMW-THz.2019.8873778
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Ng SH, Seniutinas G, Ryu M, Katkus T, Le NHA, Stoddart P, et al.
UV illumination for electron and ion beam microscopy and nanofabrication
In: Lérondel G, Cho Y-H, Taguchi A, Kawata S, eds. UV and higher energy photonics: from materials to applications 2019. Vol. 11086. Proceedings of SPIE. Bellingham, USA: SPIE; 2019:110860U (5 pp.). https://doi.org/10.1117/12.2528681
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Schropp A, Brückner D, Bulda J, Falkenberg G, Garrevoet J, Hagemann J, et al.
Full-field hard X-ray microscopy based on aberration-corrected Be CRLs
In: Lai B, Somogyi A, eds. X-Ray nanoimaging: instruments and methods IV. Vol. 11112. Proceedings of SPIE. Bellingham, USA: SPIE; 2019:1111208 (7 pp.). https://doi.org/10.1117/12.2528422
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Wang X, Tseng L-T, Mochi I, Vockenhuber M, van Lent-Protasova L, Custers R, et al.
Progress overview of EUV resists status towards high-NA EUV lithography
In: Itani T, Gargini PA, Naulleau PP, Ronse KG, eds. International conference on extreme ultraviolet lithography 2019. Vol. 11147. Proceedings of SPIE. Bellingham, USA: SPIE; 2019:1114711 (10 pp.). https://doi.org/10.1117/12.2536923
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Marathe S, Storm M, Kuppilli VSC, Harrison R, Das G, Schroeder SLM, et al.
Development of synchrotron pink beam X-ray grating interferometer at the Diamond Light Source I13-2 beamline
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Journal of Physics and Chemistry of Solids. 2019; 128: 237-244. https://doi.org/10.1016/j.jpcs.2017.11.010
DORA PSI -
Kagias M, Wang Z, Guzenko VA, David C, Stampanoni M, Jefimovs K
Fabrication of Au gratings by seedless electroplating for X-ray grating interferometry
Materials Science in Semiconductor Processing. 2019; 92: 73-79. https://doi.org/10.1016/j.mssp.2018.04.015
DORA PSI
Papers Published 2018
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Nishijima Y, Balčytis A, Naganuma S, Seniutinas G, Juodkazis S
Tailoring metal and insulator contributions in plasmonic perfect absorber metasurfaces
ACS Applied Nano Materials. 2018; 1(7): 3557-3564. https://doi.org/10.1021/acsanm.8b00710
DORA PSI -
Szmyt W, Marot L, Calame M, Padeste C, Dransfeld C
Carbon fibre-carbon nanotube multiscale composites - nanoengineering of the fibre surface for protection in extreme processing conditions
In: 18th European conference on composite materials (ECCM-18). Patras: Applied Mechanics Laboratory; 2018:(9 pp.).
DORA PSI -
von den Driesch N, Stange D, Rainko D, Povstugar I, Breuer U, Ikonic Z, et al.
Epitaxy of direct bandgap group IV Si-Ge-Sn alloys towards heterostructure light emitters
In: Liu Q, Hartmann JM, Thean A, Miyazaki S, Ogura A, Gong X, et al., eds. SiGe, Ge, and related materials: materials, processing, and devices 8. Vol. 86. ECS transactions. sine loco: IOP Publishing; 2018:189-197. https://doi.org/10.1149/08607.0189ecst
DORA PSI -
Armand Pilon F, Pauc N, Widiez J, Reboud V, Calvo V, Hartmann JM, et al.
Emerging optical gain in highly strained Germanium
In: Advanced photonics 2018 (BGPP, IPR, NP, NOMA, sensors, networks, SPPCom, SOF). Vol. ITu4I. Integrated photonics research, silicon and nanophotonics. Washington D.C.: OSA - The Optical Society; 2018:ITu4I.3 (2 pp.). https://doi.org/10.1364/IPRSN.2018.ITu4I.3
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Stange D, von den Driesch N, Rainko D, Zabel T, Marzban B, Ikonic Z, et al.
Quantum confinement effects in GeSn/SiGeSn heterostructure lasers
In: 2017 IEEE international electron devices meeting (IEDM). International electron devices meeting (IEDM). sine loco: IEEE; 2018:24.2.1-24.2.4. https://doi.org/10.1109/IEDM.2017.8268451
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Zdora M-C, Zanette I, Zhou T, Koch FJ, Romell J, Sala S, et al.
At-wavelength optics characterisation via X-ray speckle- and grating-based unified modulated pattern analysis
Optics Express. 2018; 26(4): 4989-5004. https://doi.org/10.1364/OE.26.004989
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Schluck J, Hund M, Heckenthaler T, Heinzel T, Siboni NH, Horbach J, et al.
Linear negative magnetoresistance in two-dimensional Lorentz gases
Physical Review B. 2018; 97(11): 115301 (7 pp.). https://doi.org/10.1103/PhysRevB.97.115301
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Siboni NH, Schluck J, Pierz K, Schumacher HW, Kazazis D, Horbach J, et al.
Nonmonotonic classical magnetoconductivity of a two-dimensional electron gas in a disordered array of obstacles
Physical Review Letters. 2018; 120(5): 056601 (5 pp.). https://doi.org/10.1103/PhysRevLett.120.056601
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Stange D, von den Driesch N, Zabel T, Armand-Pilon F, Rainko D, Marzban B, et al.
GeSn/SiGeSn heterostructure and multi quantum well lasers
ACS Photonics. 2018; 5(11): 4628-4636. https://doi.org/10.1021/acsphotonics.8b01116
DORA PSI -
von den Driesch N, Stange D, Rainko D, Povstugar I, Zaumseil P, Capellini G, et al.
Advanced GeSn/SiGeSn group IV heterostructure lasers
Advanced Science. 2018; 5(6): 1700955 (7 pp.). https://doi.org/10.1002/advs.201700955
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Nachawaty A, Yang M, Nanot S, Kazazis D, Yakimova R, Escoffier W, et al.
Large nonlocality in macroscopic Hall bars made of epitaxial graphene
Physical Review B. 2018; 98(4): 045403 (8 pp.). https://doi.org/10.1103/PhysRevB.98.045403
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Schluck J, Feilhauer J, Pierz K, Schumacher HW, Kazazis D, Gennser U, et al.
Quantum signatures of competing electron trajectories in antidot superlattices
Physical Review B. 2018; 98(16): 165415 (6 pp.). https://doi.org/10.1103/PhysRevB.98.165415
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Ekinci Y, Garvey T, Rivkin L, Streun A, Wrulich A
A compact high-brightness accelerator-based EUV source for actinic mask inspection
In: High-brightness sources and light-driven interactions. Compact EUV & X-ray light sources. Washington D.C., USA: The Optical Society; 2018:ET3B.5 (2 pp.). https://doi.org/10.1364/EUVXRAY.2018.ET3B.5
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Fernandez S, Kazazis D, Rajeev R, Mochi I, Helfenstein P, Yoshitake S, et al.
A comparative study of EUV absorber materials using lensless actinic imaging of EUV photomasks
In: Goldberg KA, ed. Extreme ultraviolet (EUV) lithography IX. Vol. 10583. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018:105831H (8 pp.). https://doi.org/10.1117/12.2297381
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Mochi I, Rajeev R, Helfenstein P, Fernandez S, Kazazis D, Ekinci Y
Through-pellicle inspection of EUV masks
In: Goldberg KA, ed. Extreme ultraviolet (EUV) lithography IX. Vol. 10583. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018:105831I (7 pp.). https://doi.org/10.1117/12.2297436
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Castellanos S, Wu L, Baljozovic M, Portale G, Kazazis D, Vockenhuber M, et al.
Ti, Zr, and Hf-based molecular hybrid materials as EUV photoresists
In: Goldberg KA, ed. Extreme ultraviolet (EUV) lithography IX. Vol. 10583. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018:105830A (12 pp.). https://doi.org/10.1117/12.2297167
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Manouras T, Kazazis D, Koufakis E, Ekinci Y, Vamvakaki M, Argitis P
Ultra-sensitive EUV resists based on acid-catalyzed polymer backbone breaking
In: Goldberg KA, ed. SPIE advanced lithography. Vol. 10583. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018:105831R (10 pp.). https://doi.org/10.1117/12.2299853
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Wang X, Tseng L-T, Kazazis D, Tasdemir Z, Vockenhuber M, Mochi I, et al.
Studying resist performance for contact holes printing using EUV interference lithography
In: Ronse KG, Hendrickx E, Naulleau PP, Gargini PA, Itani T, eds. International conference on extreme ultraviolet lithography 2018. Vol. 10809. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018:108091Z (13 pp.). https://doi.org/10.1117/12.2501949
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Rajeev R, Mochi I, Kazazis D, Fernandez S, Li-Teng T, Helfenstein P, et al.
Phase defect inspection on EUV masks using RESCAN
In: Ronse KG, Hendrickx E, Naulleau PP, Gargini PA, Itani T, eds. International conference on extreme ultraviolet lithography 2018. Vol. 10809. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018:108090Q (10 pp.). https://doi.org/10.1117/12.2502726
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Tasdemir Z, Vockenhuber M, Mochi I, Garrido Olvera K, Meeuwissen M, Yildirim O, et al.
Chemically-amplified EUV resists approaching 11nm half-pitch
In: Goldberg KA, ed. Extreme ultraviolet (EUV) lithography IX. Vol. 10583. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018:105831W (7 pp.). https://doi.org/10.1117/12.2299643
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Krempaský J, Koch F, Vagovič P, Mikeš L, Jaggi A, Svetina C, et al.
Inspecting adaptive optics with at-wavelength wavefront metrology
In: Spiga D, Mimura H, eds. Adaptive X-ray optics V. Vol. 10761. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018:107610D (8 pp.). https://doi.org/10.1117/12.2320532
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Rantala J, Gädda T, Laukkanen M, Nguyen Dang L, Karaste K, Kazazis D, et al.
New resist and underlayer approaches toward EUV lithography
In: Ronse KG, Hendrickx E, Naulleau PP, Gargini PA, Itani T, eds. International conference on extreme ultraviolet lithography 2018. Vol. 10809. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018:108090X (8 pp.). https://doi.org/10.1117/12.2503107
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Dejkameh A, Erdmann A, Evanschitzky P, Ekinci Y
Fourier ptychography for lithography high NA systems
In: Smith DG, Wyrowski F, Erdmann A, eds. Computational optics II. Vol. 10694. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018:106940B (10 pp.). https://doi.org/10.1117/12.2311332
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Tasdemir Z, Wang X, Mochi I, van Lent-Protasova L, Meeuwissen M, Custers R, et al.
Evaluation of EUV resists for 5 nm technology node and beyond
In: Ronse KG, Hendrickx E, Naulleau PP, Gargini PA, Itani T, eds. International conference on extreme ultraviolet lithography 2018. Vol. 10809. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018:108090L (10 pp.). https://doi.org/10.1117/12.2502688
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Popescu C, Kazazis D, McClelland A, Dawson G, Roth J, Theis W, et al.
High-resolution EUV lithography using a multi-trigger resist
In: Goldberg KA, ed. Extreme ultraviolet (EUV) lithography IX. Vol. 10583. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018:105831L (10 pp.). https://doi.org/10.1117/12.2297406
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Popescu C, McClelland A, Kazazis D, Dawson G, Roth J, Ekinci Y, et al.
Multi-trigger resist for electron beam and extreme ultraviolet lithography
In: Behringer UFW, Finders J, eds. 34th European mask and lithography conference. Vol. 10775. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018:1077502 (6 pp.). https://doi.org/10.1117/12.2316628
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Ekinci Y, Garvey T, Streun A, Wrulich A, Rivkin L
A high-brightness accelerator-based EUV source for metrology applications
In: Gallagher EE, Rankin JH, eds. Photomask technology 2018. Vol. 10810. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018:108100W (9 pp.). https://doi.org/10.1117/12.2501930
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Mochi I, Timmermans M, Gallagher E, Mariano M, Pollentier I, Rajeev R, et al.
Experimental evaluation of the impact of EUV pellicles on reticle imaging
In: Gallagher EE, Rankin JH, eds. Photomask technology 2018. Vol. 10810. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018:108100Y (9 pp.). https://doi.org/10.1117/12.2502480
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Matmon G, Ginossar E, Villis BJ, Kölker A, Lim T, Solanki H, et al.
Two- to three-dimensional crossover in a dense electron liquid in silicon
Physical Review B. 2018; 97: 155306 (8 pp.). https://doi.org/10.1103/PhysRevB.97.155306
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Chikina A, Lechermann F, Husanu M-A, Caputo M, Cancellieri C, Wang X, et al.
Orbital ordering of the mobile and localized electrons at oxygen-deficient LaAlO3/SrTiO3 interfaces
ACS Nano. 2018; 12(8): 7927-7935. https://doi.org/10.1021/acsnano.8b02335
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Fallica R, Haitjema J, Wu L, Castellanos S, Brouwer AM, Ekinci Y
Absorption coefficient of metal-containing photoresists in the extreme ultraviolet
Journal of Micro/Nanolithography, MEMS, and MOEMS. 2018; 17(2): 023505 (7 pp.). https://doi.org/10.1117/1.JMM.17.2.023505
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Rau C, Storm M, Marathe S, Bodey AJ, Cipiccia S, Batey D, et al.
Multi-scale imaging at the coherence and imaging beamline I13 at diamond
In: Proceedings of the 14th international conference on X-ray microscopy (XRM2018). Vol. 24. Microscopy and Microanalysi. sine loco: Cambridge University Press; 2018:254-255. https://doi.org/10.1017/S1431927618013624
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Choi J, Ivashko O, Dennler N, Aoki D, von Arx K, Gerber S, et al.
Pressure-induced rotational symmetry breaking in URu2Si2
Physical Review B. 2018; 98(24): 241113 (5 pp.). https://doi.org/10.1103/PhysRevB.98.241113
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Villanueva-Perez P, Pedrini B, Mokso R, Vagovic P, Guzenko VA, Leake SJ, et al.
Hard x-ray multi-projection imaging for single-shot approaches
Optica. 2018; 5(12): 1521-1524. https://doi.org/10.1364/OPTICA.5.001521
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Bray K, Regan B, Trycz A, Previdi R, Seniutinas G, Ganesan K, et al.
Single crystal diamond membranes and photonic resonators containing germanium vacancy color centers
ACS Photonics. 2018; 5(12): 4817-4822. https://doi.org/10.1021/acsphotonics.8b00930
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Fallica R, Ekinci Y
Photoacid generator-polymer interaction on the quantum yield of chemically amplified resists for extreme ultraviolet lithography
Journal of Materials Chemistry C. 2018; 6(27): 7267-7273. https://doi.org/10.1039/c8tc01446a
DORA PSI -
Gottlieb S, Kazazis D, Mochi I, Evangelio L, Fernández-Regúlez M, Ekinci Y, et al.
Nano-confinement of block copolymers in high accuracy topographical guiding patterns: modelling the emergence of defectivity due to incommensurability
Soft Matter. 2018; 14(33): 6799-6808. https://doi.org/10.1039/c8sm01045e
DORA PSI -
Kazazis D, Tseng L-T, Ekinci Y
Improving the resolution and throughput of achromatic Talbot lithography
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 2018; 36(6): 06J501 (11 pp.). https://doi.org/10.1116/1.5048506
DORA PSI -
Chen X, Tao Z, Chen C, Wang C, Wang L, Jiang H, et al.
All-dielectric metasurface-based roll-angle sensor
Sensors and Actuators A: Physical. 2018; 279: 509-517. https://doi.org/10.1016/j.sna.2018.06.058
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Gerspach MA, Mojarad N, Sharma D, Ekinci Y, Pfohl T
Pneumatically controlled nanofluidic devices for contact-free trapping and manipulation of nanoparticles
Particle and Particle Systems Characterization. 2018; 35(12): 1800161 (7 pp.). https://doi.org/10.1002/ppsc.201800161
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Bergamaschi A, Andrä M, Barten R, Borca C, Brückner M, Chiriotti S, et al.
The MÖNCH detector for soft X-ray, high-resolution, and energy resolved applications
Synchrotron Radiation News. 2018; 31(6): 11-15. https://doi.org/10.1080/08940886.2018.1528428
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Usachov DY, Tarasov AV, Bokai KA, Shevelev VO, Vilkov OY, Petukhov AE, et al.
Site- and spin-dependent coupling at the highly ordered h-BN/Co(0001) interface
Physical Review B. 2018; 98(19): 195438. https://doi.org/10.1103/PhysRevB.98.195438
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Lebugle M, Dworkowski F, Pauluhn A, Guzenko VA, Romano L, Meier N, et al.
High-intensity x-ray microbeam for macromolecular crystallography using silicon kinoform diffractive lenses
Applied Optics. 2018; 57(30): 9032-9039. https://doi.org/10.1364/AO.57.009032
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Do A, Briat M, Chaleil A, Rubbelynck C, Lebugle M, David C, et al.
Characterization of a two-channel, high resolution hard x-ray microscope using Fresnel zone plates for laser-plasma interaction experiments
Review of Scientific Instruments. 2018; 89(10): 10G122 (4 pp.). https://doi.org/10.1063/1.5039326
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Ferrari E, Ischebeck R, Bednarzik M, Bettoni S, Borrelli S, Braun H-H, et al.
The ACHIP experimental chambers at the Paul Scherrer Institut
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2018; 907: 244-247. https://doi.org/10.1016/j.nima.2018.02.112
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Bergamaschi A, Andrä M, Barten R, Brückner M, Chiriotti S, David C, et al.
Hybrid detectors for high resolution imaging
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 316-318. https://doi.org/10.1017/S1431927618013910
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Scheel M, Perrin J, Koch F, Yurgens V, Le Roux V, Giorgetta J-L, et al.
Toward hard X-ray transmission microscopy at the ANATOMIX beamline of synchrotron SOLEIL
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 246-247. https://doi.org/10.1017/S1431927618013582
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Greving I, Flenner S, Larsson E, Storm M, Wilde F, Lilleodden E, et al.
Full-field hard X-ray microscope designed for materials science applications
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 226-227. https://doi.org/10.1017/S143192761801348X
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Storm M, Cipiccia S, Marathe S, Kuppili VSC, Döring F, David C, et al.
The diamond I13-2 transmission X-ray microscope: current status and future developments
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 216-217. https://doi.org/10.1017/S1431927618013430
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Schropp A, Brückner D, Bulda J, Falkenberg G, Garrevoet J, Seiboth F, et al.
Scanning hard X-ray microscopy based on Be CRLs
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 186-187. https://doi.org/10.1017/S1431927618013284
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Villanueva-Perez P, Pedrini B, Mokso R, Vagovic P, Guzenko V, Leake S, et al.
Coherent hard X-ray multiprojection imaging
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 50-51. https://doi.org/10.1017/S1431927618012680
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Stania R, Seitsonen AP, Kunhardt D, Büchner B, Popov AA, Muntwiler M, et al.
Electrostatic interaction across a single-layer carbon shell
Journal of Physical Chemistry Letters. 2018; 9(13): 3586-3590. https://doi.org/10.1021/acs.jpclett.8b01326
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Matsui F, Nishikawa H, Daimon H, Muntwiler M, Takizawa M, Namba H, et al.
The 4π kz periodicity in photoemission from graphite
Physical Review B. 2018; 97(4): 045430 (6 pp.). https://doi.org/10.1103/PhysRevB.97.045430
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Suszka AK, Gliga S, Warnicke P, Wintz S, Saha S, Charipar KM, et al.
Observation of the out-of-plane magnetization in a mesoscopic ferromagnetic structure superjacent to a superconductor
Applied Physics Letters. 2018; 113(16): 162601 (4 pp.). https://doi.org/10.1063/1.5051653
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Nijs T, Klein YM, Mousavi SF, Ahsan A, Nowakowska S, Constable EC, et al.
The Different Faces of 4′-Pyrimidinyl-Functionalized 4,2′:6′,4′′-Terpyridines: Metal-Organic Assemblies from Solution and on Au(111) and Cu(111) Surface Platforms
Journal of the American Chemical Society. 2018; 140(8): 2933-2939. https://doi.org/10.1021/jacs.7b12624
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Nowakowska S, Mazzola F, Alberti MN, Song F, Voigt T, Nowakowski J, et al.
Adsorbate-induced modification of the confining barriers in a quantum box array
ACS Nano. 2018; 12(1): 768-778. https://doi.org/10.1021/acsnano.7b07989
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Müller V, Hinaut A, Moradi M, Baljozovic M, Jung TA, Shahgaldian P, et al.
A two-dimensional polymer synthesized at the air/water interface
Angewandte Chemie International Edition. 2018; 57(33): 10584-10588. https://doi.org/10.1002/anie.201804937
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Lazarević-Pašti T, Anićijević V, Baljozović M, Vasić Anićijević D, Gutić S, Vasić V, et al.
The impact of the structure of graphene-based materials on the removal of organophosphorus pesticides from water
Environmental Science: Nano. 2018; 5(6): 1482-1494. https://doi.org/10.1039/c8en00171e
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Zhang Y, Haitjema J, Baljozovic M, Vockenhuber M, Kazazis D, Jung TA, et al.
Dual-tone application of a tin-oxo cage photoresist under e-beam and EUV exposure
Journal of Photopolymer Science and Technology. 2018; 31(2): 249-255. https://doi.org/10.2494/photopolymer.31.249
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Flenner S, Larsson E, Furlan K, Laipple D, Storm M, Wilde F, et al.
Nanotomography of inverse photonic crystals using zernike phase contrast
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 146-147. https://doi.org/10.1017/S1431927618013120
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Fallica R, Watts B, Rösner B, Della Giustina G, Brigo L, Brusatin G, et al.
Changes in the near edge x-ray absorption fine structure of hybrid organic-inorganic resists upon exposure
Nanotechnology. 2018; 29(36): 36LT03 (6 pp.). https://doi.org/10.1088/1361-6528/aaccd4
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Fink RH, Rösner B, Du X, Späth A, Johnson M, Hawly T, et al.
In-operando soft X-ray microspectroscopy of organic electronics devices
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 424-425. https://doi.org/10.1017/S143192761801437X
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Ribič PR, Rösner B, Gauthier D, Döring F, Masciovecchio C, Principi E, et al.
Extreme-ultraviolet vortices at a free-electron laser
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 292-293. https://doi.org/10.1017/S1431927618013806
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Rösner B, Koch F, Döring F, Guzenko VA, Meyer M, Ornelas JL, et al.
7 nm spatial resolution in soft X-ray microscopy
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 270-271. https://doi.org/10.1017/S1431927618013697
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Ornelas JL, Rösner B, Späth A, Fink RH
STXM_deconv – a MATLAB script for the deconvolution of STXM images
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 120-121. https://doi.org/10.1017/S1431927618012990
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Döring F, Marschall F, Yin Z, Rösner B, Beye M, Miedema P, et al.
1D-full field microscopy of elastic and inelastic scattering with transmission off-axis fresnel zone plates
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 182-183. https://doi.org/10.1017/S1431927618013260
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David C, Rösner B, Döring F, Guzenko V, Koch F, Lebugle M, et al.
Diffractive X-ray optics for synchrotrons and free-electron lasers
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 264-267. https://doi.org/10.1017/S1431927618013673
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Helfenstein P, Rajeev R, Mochi I, Kleibert A, Vaz CAF, Ekinci Y
Beam drift and partial probe coherence effects in EUV reflective-mode coherent diffractive imaging
Optics Express. 2018; 26(9): 12242-12256. https://doi.org/10.1364/OE.26.012242
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Tsujino S
Transverse structure of the wave function of field emission electron beam determined by intrinsic transverse energy
Journal of Applied Physics. 2018; 124(4): 044304 (12 pp.). https://doi.org/10.1063/1.5035284
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Lee C, Tsujino S, Miller RJD
Transmission low-energy electron diffraction using double-gated single nanotip field emitter
Applied Physics Letters. 2018; 113(1): 013505 (4 pp.). https://doi.org/10.1063/1.5030889
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Finizio S, Wintz S, Gliga S, Kirk E, Suszka AK, Wohlhüter P, et al.
Unexpected field-induced dynamics in magnetostrictive microstructured elements under isotropic strain
Journal of Physics: Condensed Matter. 2018; 30(31): 314001 (6 pp.). https://doi.org/10.1088/1361-648X/aacddd
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Olbinado MP, Grenzer J, Pradel P, De Resseguier T, Vagovic P, Zdora M-C, et al.
Advances in indirect detector systems for ultra high-speed hard X-ray imaging with synchrotron light
Journal of Instrumentation. 2018; 13(4): C04004 (8 pp.). https://doi.org/10.1088/1748-0221/13/04/C04004
DORA PSI -
Seniutinas G, Weber A, Padeste C, Sakellari I, Farsari M, David C
Beyond 100 nm resolution in 3D laser lithography — post processing solutions
Microelectronic Engineering. 2018; 191: 25-31. https://doi.org/10.1016/j.mee.2018.01.018
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Graczyk M, Cattoni A, Rösner B, Seniutinas G, Löfstrand A, Kvennefors A, et al.
Nanoimprint stamps with ultra-high resolution: optimal fabrication techniques
Microelectronic Engineering. 2018; 190: 73-78. https://doi.org/10.1016/j.mee.2018.01.008
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Cattoni A, Mailly D, Dalstein O, Faustini M, Seniutinas G, Rösner B, et al.
Sub-10 nm electron and helium ion beam lithography using a recently developed alumina resist
Microelectronic Engineering. 2018; 193: 18-22. https://doi.org/10.1016/j.mee.2018.02.015
DORA PSI -
Matsui F, Ota H, Sugita K, Muntwiler M, Stania R, Greber T
Parallel and antiparallel angular momentum transfer of circularly polarized light to photoelectrons and Auger electrons at the Ni L3 absorption threshold
Physical Review B. 2018; 97(3): 035424. https://doi.org/10.1103/PhysRevB.97.035424
DORA PSI -
Horvath B, Dai Y, Lee Y
Annealing effect on the microstructure of tungsten irradiated in SINQ target
Journal of Nuclear Materials. 2018; 506: 19-25. https://doi.org/10.1016/j.jnucmat.2017.12.020
DORA PSI -
De Bardi M, Müller R, Grünzweig C, Mannes D, Boillat P, Rigollet M, et al.
On the needle clogging of staked-in-needle pre-filled syringes: mechanism of liquid entering the needle and solidification process
European Journal of Pharmaceutics and Biopharmaceutics. 2018; 128: 272-281. https://doi.org/10.1016/j.ejpb.2018.05.006
DORA PSI -
De Bardi M, Müller R, Grünzweig C, Mannes D, Rigollet M, Bamberg F, et al.
Clogging in staked-in needle pre-filled syringes (SIN-PFS): influence of water vapor transmission through the needle shield
European Journal of Pharmaceutics and Biopharmaceutics. 2018; 127: 104-111. https://doi.org/10.1016/j.ejpb.2018.02.016
DORA PSI -
Arava H, Derlet PM, Vijayakumar J, Cui J, Bingham NS, Kleibert A, et al.
Computational logic with square rings of nanomagnets
Nanotechnology. 2018; 29(26): 265205 (7 pp.). https://doi.org/10.1088/1361-6528/aabbc3
DORA PSI -
Chaix L, Huang EW, Gerber S, Lu X, Jia C, Huang Y, et al.
Resonant inelastic x-ray scattering studies of magnons and bimagnons in the lightly doped cuprate La2-xSrxCuO4
Physical Review B. 2018; 97(15): 155144 (8 pp.). https://doi.org/10.1103/PhysRevB.97.155144
DORA PSI -
Monney C, Schuler A, Jaouen T, Mottas M-L, Wolf T, Merz M, et al.
Robustness of the charge-ordered phases in IrTe2 against photoexcitation
Physical Review B. 2018; 97(7): 075110 (8 pp.). https://doi.org/10.1103/PhysRevB.97.075110
DORA PSI -
Wilklow-Marnell M, Moglia D, Steimle B, Cardineau B, Al-Mashat H, Nastasi P, et al.
First-row transitional-metal oxalate resists for EUV
Journal of Micro/Nanolithography, MEMS, and MOEMS. 2018; 17(4): 043507 (9 pp.). https://doi.org/10.1117/1.JMM.17.4.043507
DORA PSI -
Tudisco S, La Via F, Agodi C, Altana C, Borghi G, Boscardin M, et al.
SiCILIA—silicon carbide detectors for intense luminosity investigations and applications
Sensors. 2018; 18(7): 2289 (16 pp.). https://doi.org/10.3390/s18072289
DORA PSI -
Borrelli S, Orlandi GL, Bednarzik M, David C, Ferrari E, Guzenko VA, et al.
Generation and measurement of sub-micrometer relativistic electron beams
Communications Physics. 2018; 1: 52 (8 pp.). https://doi.org/10.1038/s42005-018-0048-x
DORA PSI -
Seniutinas G, Brasselet E, Balčytis A, David C, Juodkazis S
Diamond: a gem for micro-optics
Materials Today. 2018; 21(7): 798-799. https://doi.org/10.1016/j.mattod.2018.08.001
DORA PSI -
Juranić P, Rehanek J, Arrell CA, Pradervand C, Cassar A, Calvi M, et al.
SwissFEL Aramis beamline photon diagnostics
Journal of Synchrotron Radiation. 2018; 25(4): 1238-1248. https://doi.org/10.1107/S1600577518005775
DORA PSI -
Opara NL, Mohacsi I, Makita M, Castano-Diez D, Diaz A, Juranić P, et al.
Demonstration of femtosecond X-ray pump X-ray probe diffraction on protein crystals
Structural Dynamics. 2018; 5(5): 054303 (15 pp.). https://doi.org/10.1063/1.5050618
DORA PSI -
Lutz-Bueno V, Arboleda C, Leu L, Blunt MJ, Busch A, Georgiadis A, et al.
Model-free classification of X-ray scattering signals applied to image segmentation
Journal of Applied Crystallography. 2018; 51(5): 1378-1386. https://doi.org/10.1107/S1600576718011032
DORA PSI -
Lev LL, Maiboroda IO, Husanu M-A, Grichuk ES, Chumakov NK, Ezubchenko IS, et al.
k-space imaging of anisotropic 2D electron gas in GaN/GaAlN high-electron-mobility transistor heterostructures
Nature Communications. 2018; 9(1): 2653 (9 pp.). https://doi.org/10.1038/s41467-018-04354-x
DORA PSI -
Leo N, Holenstein S, Schildknecht D, Sendetskyi O, Luetkens H, Derlet PM, et al.
Collective magnetism in an artificial 2D XY spin system
Nature Communications. 2018; 9(1): 2850 (8 pp.). https://doi.org/10.1038/s41467-018-05216-2
DORA PSI -
Sloetjes SD, Digernes E, Olsen FK, Chopdekar RV, Retterer ST, Folven E, et al.
Interplay between bulk and edge-bound topological defects in a square micromagnet
Applied Physics Letters. 2018; 112(4): 042401. https://doi.org/10.1063/1.5010166
DORA PSI -
Ranamukhaarachchi SA, Padeste C, Häfeli UO, Stoeber B, Cadarso VJ
Design considerations of a hollow microneedle-optofluidic biosensing platform incorporating enzyme-linked assays
Journal of Micromechanics and Microengineering. 2018; 28(2): 024002 (9 pp.). https://doi.org/10.1088/1361-6439/aa9c9c
DORA PSI -
Di Giovannantonio M, Deniz O, Urgel JI, Widmer R, Dienel T, Stolz S, et al.
On-surface growth dynamics of graphene nanoribbons: the role of halogen functionalization
ACS Nano. 2018; 12(1): 74-81. https://doi.org/10.1021/acsnano.7b07077
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Casadei CM, Tsai C-J, Barty A, Hunter MS, Zatsepin NA, Padeste C, et al.
Resolution extension by image summing in serial femtosecond crystallography of two-dimensional membrane-protein crystals
IUCrJ. 2018; 5(1): 103-117. https://doi.org/10.1107/S2052252517017043
DORA PSI -
Rösner B, Koch F, Döring F, Bosgra J, Guzenko VA, Kirk E, et al.
Exploiting atomic layer deposition for fabricating sub-10 nm X-ray lenses
Microelectronic Engineering. 2018; 191: 91-96. https://doi.org/10.1016/j.mee.2018.01.033
DORA PSI -
Kirchner R, Chidambaram N, Schift H
Benchmarking surface selective vacuum ultraviolet and thermal postprocessing of thermoplastics for ultrasmooth 3-D-printed micro-optics
Optical Engineering. 2018; 57(4): 041403 (11 pp.). https://doi.org/10.1117/1.OE.57.4.041403
DORA PSI
Papers Published 2017
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Schift H, Kirchner R, Chidambaram N, Altana M
Surface smoothening of the inherent roughness of micro-lenses fabricated with 2-photon lithography
In: Chon JWM, Jia B, eds. Nanophotonics Australasia 2017. Vol. 10456. Proceedings of SPIE. Bellingham, USA: SPIE; 2017:104561Z (9 pp.). https://doi.org/10.1117/12.2283236
DORA PSI -
Schift H, Kristensen A
Nanoimprint lithography
In: Bhushan B, ed. Springer handbook of nanotechnology. Berlin: Springer; 2017:113-142. https://doi.org/10.1007/978-3-662-54357-3_5
DORA PSI -
Urwyler P, Schift H
Nanostructured polymers for medical applications
In: Müller B, Van de Voorde M, eds. Nanoscience and nanotechnology for human health. Weinheim: Wiley; 2017:293-313. https://doi.org/10.1002/9783527692057.ch14
DORA PSI -
Garvey T, Rivkin L, Streun A, Wrulich A, Ekinci Y
A compact storage ring for the production of EUV radiation
In: 13th international topical meeting on nuclear applications of accelerators (AccApp '17). La Grange Park, USA: American Nuclear Society; 2017:217-225.
DORA PSI -
Camarda M, Woerle J, Souliere V, Ferro G, Sigg H, Grossner U, et al.
Analysis of 4H-SiC MOS capacitors on macro-stepped surfaces
In: Zekentes K, Vasilevskiy KV, Frangis N, eds. Silicon carbide and related materials 2016. Vol. 897. Materials science forum. Durnten-Zurich, Switzerland: Trans Tech Publications; 2017:107-110. https://doi.org/10.4028/www.scientific.net/MSF.897.107
DORA PSI -
Popescu C, Frommhold A, McClelland A, Roth J, Ekinci Y, Robinson APG
Sensitivity enhancement of the high-resolution xMT multi-trigger resist for EUV lithography
In: Panning EM, Goldberg KA, eds. Extreme Ultraviolet (EUV) Llthography VIII. Vol. 10143. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017:101430V (9 pp.). https://doi.org/10.1117/12.2258098
DORA PSI -
Hotalen J, Murphy M, Earley W, Vockenhuber M, Ekinci Y, Freedman DA, et al.
Advanced development techniques for metal-based EUV resists
In: Goldberg KA, Panning EM, eds. Extreme Ultraviolet (EUV) lithography VIII. Vol. 10143. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017:1014309 (12 pp.). https://doi.org/10.1117/12.2258126
DORA PSI -
Mochi I, Helfenstein P, Mohacsi I, Rajendran R, Yoshitake S, Ekinci Y
RESCAN: an actinic lensless microscope for defect inspection of EUV reticles
In: Panning EM, Goldberg KA, eds. Extreme Ultraviolet (EUV) lithography VIII. Vol. 10143. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017:101431O (8 pp.). https://doi.org/10.1117/12.2258086
DORA PSI -
Kirchner R, Chidambaram N, Altana M, Schift H
How post-processing by selective thermal reflow can reduce the roughness of 3D lithography in micro-optical lenses
In: Gu B, Helvajian H, Piqué A, Dunsky CM, Liu J, eds. Laser 3D manufacturing IV. Vol. 10095. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017:1009507 (9 pp.). https://doi.org/10.1117/12.2258090
DORA PSI -
Helfenstein P, Mochi I, Rajendran R, Yoshitake S, Ekinci Y
A two-step method for fast and reliable EUV mask metrology
In: Panning EM, Goldberg KA, eds. Extreme Ultraviolet (EUV) lithography VIII. Vol. 10143. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017:101431Q (7 pp.). https://doi.org/10.1117/12.2259961
DORA PSI -
Buitrago E, Meeuwissen M, Yildirim O, Custers R, Hoefnagels R, Rispens G, et al.
State-of-the-art EUV materials and processes for the 7 nm node and beyond
In: Panning EM, Goldberg KA, eds. Extreme Ultraviolet (EUV) lithography VIII. Vol. 10143. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017:101430T (8 pp.). https://doi.org/10.1117/12.2260153
DORA PSI -
Fallica R, Watts B, Della Giustina G, Brigo L, Brusatin G, Ekinci Y
Chemical changes in hybrid photoresists before and after exposure by in situ NEXAFS analysis
In: Hohle CK, ed. Advances in patterning materials and processes XXXIV. Vol. 10146. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017:101461F (7 pp.). https://doi.org/10.1117/12.2258215
DORA PSI -
Yildirim O, Buitrago E, Hoefnagels R, Meeuwissen M, Wuister S, Rispens G, et al.
Improvements in resist performance towards EUV HVM
In: Panning EM, Goldberg KA, eds. Extreme Ultraviolet (EUV) lithography VIII. Vol. 10143. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017:101430Q (12 pp.). https://doi.org/10.1117/12.2257415
DORA PSI -
Tasdemir Z, Mochi I, Garrido Olvera K, Meeuwissen M, Yildirim O, Custers R, et al.
Contrast matching of line gratings obtained with NXE3XXX and EUV- interference lithography
In: Gargini PA, Naulleau PP, Ronse KG, Itani T, eds. International conference on Extreme Ultraviolet lithography 2017. Vol. 10450. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017:104501T (10 pp.). https://doi.org/10.1117/12.2280541
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Popescu C, McClelland A, Dawson G, Roth J, Kazazis D, Ekinci Y, et al.
Multi-trigger resist for electron beam lithography
In: Behringer UFW, Finders J, eds. 33rd European mask and lithography conference. Vol. 10446. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017:1044608 (9 pp.). https://doi.org/10.1117/12.2279767
DORA PSI -
Mochi I, Helfenstein P, Rajeev R, Fernandez S, Kazazis D, Yoshitake S, et al.
Actinic inspection of EUV reticles with arbitrary pattern design
In: Gargini PA, Naulleau PP, Ronse KG, Itani T, eds. International conference on Extreme Ultraviolet lithography 2017. Vol. 10450. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017:1045007 (10 pp.). https://doi.org/10.1117/12.2280528
DORA PSI -
Schift H, Chidambaram N, Altana M, Kirchner R
Selective surface smoothening of 3D micro-optical elements
In: Bencher C, ed. Emerging patterning technologies. Vol. 10144. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017:101440B (7 pp.). https://doi.org/10.1117/12.2256358
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Haitjema J, Zhang Y, Vockenhuber M, Kazazis D, Ekinci Y, Brouwer AM
Extreme ultraviolet patterning of tin-oxo cages
In: Panning EM, Goldberg KA, eds. Extreme Ultraviolet (EUV) lithography VIII. Vol. 10143. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017:1014325 (10 pp.). https://doi.org/10.1117/12.2257911
DORA PSI -
Nagahara S, Carcasi M, Shiraishi G, Nakagawa H, Dei S, Shiozawa T, et al.
Photosensitized Chemically Amplified ResistTM (PSCARTM) 2.0 for high throughput and high resolution EUV lithography: dual photosensitization of acid generation and quencher decomposition by flood exposure
In: Hohle CK, ed. Advances in patterning materials and processes XXXIV. Vol. 10146. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017:101460G (14 pp.). https://doi.org/10.1117/12.2258217
DORA PSI -
Fallica R, Haitjema J, Wu L, Castellanos S, Brouwer F, Ekinci Y
Absorption coefficient and exposure kinetics of photoresists at EUV
In: Panning EM, Goldberg KA, eds. Extreme Ultraviolet (EUV) lithography VIII. Vol. 10143. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017:101430A (11 pp.). https://doi.org/10.1117/12.2257240
DORA PSI -
Rösner B, Schmidt U, Fink RH
In-operando studies of Ag-TCNQ nanocrystals using Raman and soft x-ray microspectroscopy
In: Rau C, ed. International X-ray microscopy conference (XRM 2016). Vol. 849. Journal of physics: conference series. sine loco: IOP Publishing; 2017:012016 (4 pp.). https://doi.org/10.1088/1742-6596/849/1/012016
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Greving I, Ogurreck M, Marschall F, Last A, Wilde F, Dose T, et al.
Nanotomography endstation at the P05 beamline: status and perspectives
In: Rau C, ed. X-Ray microscopy conference 2016 (XRM 2016). Vol. 849. Journal of physics: conference series. sine loco: IOP Publishing; 2017:012056 (4 pp.). https://doi.org/10.1088/1742-6596/849/1/012056
DORA PSI -
Rajendran R, Mochi I, Helfenstein P, Mohacsi I, Redford S, Mozzanica A, et al.
Towards a stand-alone high-throughput EUV actinic photomask inspection tool: RESCAN
In: Sanchez MI, Ukraintsev VA, eds. Metrology, inspection, and process control for microlithography XXXI. Vol. 10145. Proceedings of SPIE. Bellingham, Washington: SPIE; 2017:101450N. https://doi.org/10.1117/12.2258379
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Karim W, Spreafico C, Kleibert A, Gobrecht J, VandeVondele J, Ekinci Y, et al.
Catalyst support effects on hydrogen spillover
Nature. 2017; 541(7635): 68-71. https://doi.org/10.1038/nature20782
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Alekhin MS, Patton G, Dujardin C, Douissard P-A, Lebugle M, Novotny L, et al.
Stimulated scintillation emission depletion X-ray imaging
Optics Express. 2017; 25(2): 654-669. https://doi.org/10.1364/OE.25.000654
DORA PSI -
Piquero-Zulaica I, Nowakowska S, Ortega JE, Stöhr M, Gade LH, Jung TA, et al.
Temperature dependence of the partially localized state in a 2D molecular nanoporous network
Applied Surface Science. 2017; 391: 39-43. https://doi.org/10.1016/j.apsusc.2016.02.227
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Privitera SMS, Litrico G, Camarda M, Piluso N, La Via F
Electrical properties of extended defects in 4H-SiC investigated by photoinduced current measurements
Applied Physics Express. 2017; 10(3): 036601 (4 pp.). https://doi.org/10.7567/APEX.10.036601
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Oezelt H, Kirk E, Wohlhüter P, Müller E, Heyderman LJ, Kovacs A, et al.
Vortex motion in amorphous ferrimagnetic thin film elements
AIP Advances. 2017; 7(5): 056001 (5 pp.). https://doi.org/10.1063/1.4973295
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Warnicke P, Wohlhüter P, Suszka AK, Stevenson SE, Heyderman LJ, Raabe J
Tunable magnetic vortex resonance in a potential well
Physical Review B. 2017; 96(17): 174402 (5 pp.). https://doi.org/10.1103/PhysRevB.96.174402
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Wäckerlin A, Fatayer S, Nijs T, Nowakowska S, Mousavi SF, Popova O, et al.
Molecular chessboard assemblies sorted by site-specific interactions of out-of-plane d-orbitals with a semimetal template
Nano Letters. 2017; 17(3): 1956-1962. https://doi.org/10.1021/acs.nanolett.6b05344
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Kaspar C, Butschke J, Irmscher M, Martens S, Sailer H, Kirchner R, et al.
Adjustable sidewall slopes by electron-beam exposure layout
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 2017; 35(6): 06G501 (6 pp.). https://doi.org/10.1116/1.4993724
DORA PSI -
Romano L, Vila-Comamala J, Schift H, Stampanoni M, Jefimovs K
Hot embossing of Au- and Pb-based alloys for x-ray grating fabrication
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 2017; 35(6): 06G302 (9 pp.). https://doi.org/10.1116/1.4991807
DORA PSI -
Fallica R, Kazazis D, Kirchner R, Voigt A, Mochi I, Schift H, et al.
Lithographic performance of ZEP520A and mr-PosEBR resists exposed by electron beam and extreme ultraviolet lithography
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 2017; 35(6): 061603 (7 pp.). https://doi.org/10.1116/1.5003476
DORA PSI -
Rösner B, Döring F, Ribič PR, Gauthier D, Principi E, Masciovecchio C, et al.
High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development
Optics Express. 2017; 25(24): 30686-30695. https://doi.org/10.1364/OE.25.030686
DORA PSI -
Makita M, Karvinen P, Guzenko VA, Kujala N, Vagovic P, David C
Fabrication of diamond diffraction gratings for experiments with intense hard x-rays
Microelectronic Engineering. 2017; 176: 75-78. https://doi.org/10.1016/j.mee.2017.02.002
DORA PSI -
Marschall F, Vila-Comamala J, Guzenko VA, David C
Systematic efficiency study of line-doubled zone plates
Microelectronic Engineering. 2017; 177: 25-29. https://doi.org/10.1016/j.mee.2017.01.017
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Roedig P, Ginn HM, Pakendorf T, Sutton G, Harlos K, Walter TS, et al.
High-speed fixed-target serial virus crystallography
Nature Methods. 2017; 14(8): 805-810. https://doi.org/10.1038/nmeth.4335
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Lebugle M, Seniutinas G, Marschall F, Guzenko VA, Grolimund D, David C
Tunable kinoform x-ray beam splitter
Optics Letters. 2017; 42(21): 4327-4330. https://doi.org/10.1364/OL.42.004327
DORA PSI -
Gliga S, Hrkac G, Donnelly C, Büchi J, Kleibert A, Cui J, et al.
Emergent dynamic chirality in a thermally driven artificial spin ratchet
Nature Materials. 2017; 16(11): 1106-1111. https://doi.org/10.1038/NMAT5007
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Tseng LT, Suter A, Wang YR, Xiang FX, Bian P, Ding X, et al.
Intrinsic and spatially nonuniform ferromagnetism in Co-doped ZnO films
Physical Review B. 2017; 96(10): 104423 (10 pp.). https://doi.org/10.1103/PhysRevB.96.104423
DORA PSI -
Müller V, Shao F, Baljozovic M, Moradi M, Zhang Y, Jung T, et al.
Structural characterization of a covalent monolayer sheet obtained by two-dimensional polymerization at an air/water interface
Angewandte Chemie International Edition. 2017; 56(48): 15262-15266. https://doi.org/10.1002/anie.201707140
DORA PSI -
Moradi M, Tulli LG, Nowakowski J, Baljozovic M, Jung TA, Shahgaldian P
Two-dimensional calix[4]arene-based metal-organic coordination networks of tunable crystallinity
Angewandte Chemie International Edition. 2017; 56(46): 14395-14399. https://doi.org/10.1002/anie.201703825
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Liu B, Piamonteze C, Delgado-Jaime MU, Wang R-P, Heidler J, Dreiser J, et al.
Sum rule distortions in fluorescence-yield x-ray magnetic circular dichroism
Physical Review B. 2017; 96(5): 054446 (8 pp.). https://doi.org/10.1103/PhysRevB.96.054446
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Finizio S, Wintz S, Kirk E, Suszka AK, Gliga S, Wohlhüter P, et al.
Control of the gyration dynamics of magnetic vortices by the magnetoelastic effect
Physical Review B. 2017; 96(5): 054438 (6 pp.). https://doi.org/10.1103/PhysRevB.96.054438
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Lebugle M, Liebi M, Wakonig K, Guzenko VA, Holler M, Menzel A, et al.
High-acceptance versatile microfocus module based on elliptical Fresnel zone plates for small-angle X-ray scattering
Optics Express. 2017; 25(18): 21145-21158. https://doi.org/10.1364/OE.25.021145
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Farhan A, Derlet PM, Anghinolfi L, Kleibert A, Heyderman LJ
Magnetic charge and moment dynamics in artificial kagome spin ice
Physical Review B. 2017; 96(6): 064409 (9 pp.). https://doi.org/10.1103/PhysRevB.96.064409
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Spreafico C, Karim W, Ekinci Y, van Bokhoven JA, VandeVondele J
Hydrogen adsorption on nanosized platinum and dynamics of spillover onto alumina and titania
Journal of Physical Chemistry C. 2017; 121(33): 17862-17872. https://doi.org/10.1021/acs.jpcc.7b03733
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Marschall F, McNally D, Guzenko VA, Rösner B, Dantz M, Lu X, et al.
Zone plates as imaging analyzers for resonant inelastic x-ray scattering
Optics Express. 2017; 25(14): 15624-15634. https://doi.org/10.1364/OE.25.015624
DORA PSI -
Bingham NS, Suszka AK, Vaz CAF, Kim H, Heyderman LJ
Interfacial room temperature magnetism and enhanced magnetocaloric effect in strained La0.66Ca0.34MnO3/BaTiO3 heterostructures
Physical Review B. 2017; 96(2): 024419 (6 pp.). https://doi.org/10.1103/PhysRevB.96.024419
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Wang X-Y, Dienel T, Di Giovannantonio M, Borin Barin G, Kharche N, Deniz O, et al.
Heteroatom-doped perihexacene from a double helicene precursor: on-surface synthesis and properties
Journal of the American Chemical Society. 2017; 139(13): 4671-4674. https://doi.org/10.1021/jacs.7b02258
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Gerber S, Yang S-L, Zhu D, Soifer H, Sobota JA, Rebec S, et al.
Femtosecond electron-phonon lock-in by photoemission and x-ray free-electron laser
Science. 2017; 357(6346): 71-75. https://doi.org/10.1126/science.aak9946
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Windsor YW, Piamonteze C, Ramakrishnan M, Scaramucci A, Rettig L, Huever JA, et al.
Magnetic properties of strained multiferroic CoCr2O4: a soft x-ray study
Physical Review B. 2017; 95(22): 224413 (15 pp.). https://doi.org/10.1103/PhysRevB.95.224413
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Fallica R, Kirchner R, Schift H, Ekinci Y
High-resolution grayscale patterning using extreme ultraviolet interference lithography
Microelectronic Engineering. 2017; 177: 1-5. https://doi.org/10.1016/j.mee.2017.01.007
DORA PSI -
Virganavičius D, Juodėnas M, Tamulevičius T, Schift H, Tamulevičius S
Investigation of transient dynamics of capillary assisted particle assembly yield
Applied Surface Science. 2017; 406: 136-143. https://doi.org/10.1016/j.apsusc.2017.02.100
DORA PSI -
Chidambaram N, Kirchner R, Fallica R, Yu L, Altana M, Schift H
Selective surface smoothening of polymer microlenses by depth confined softening
Advanced Materials Technologies. 2017; 2(5): 1700018 (10 pp.). https://doi.org/10.1002/admt.201700018
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Opara N, Martiel I, Arnold SA, Braun T, Stahlberg H, Makita M, et al.
Direct protein crystallization on ultrathin membranes for diffraction measurements at X-ray free-electron lasers
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