List of Publications of the LMN

Papers Published 2020

Bokai KA, Tarasov AV, Shevelev VO, Vilkov OY, Makarova AA, Marchenko D, et al.
Hybrid h-BN-graphene monolayer with B-C boundaries on a lattice-matched surface
Chemistry of Materials. 2020; 32(3): 1172-1181. https://doi.org/10.1021/acs.chemmater.9b04207
DORA PSI
Choi J, Ivashko O, Blackburn E, Liang R, Bonn DA, Hardy WN, et al.
Spatially inhomogeneous competition between superconductivity and the charge density wave in YBa₂Cu₃O_6.67
Nature Communications. 2020; 11: 990 (8 pp.). https://doi.org/10.1038/s41467-020-14536-1
DORA PSI
Debarre T, Watts B, Rösner B, Unser M
Hessian splines for scanning transmission X-ray microscopy
In: 2020 IEEE 17th international symposium on biomedical imaging (ISBI) proceedings. IEEE international symposium on biomedical imaging. Danvers: IEEE; 2020. https://doi.org/10.1109/ISBI45749.2020.9098539
DORA PSI
Dieleman CD, Ding W, Wu L, Thakur N, Bespalov I, Daiber B, et al.
Universal direct patterning of colloidal quantum dots by (extreme) ultraviolet and electron beam lithography
Nanoscale. 2020; 12(20): 11306-11316. https://doi.org/10.1039/d0nr01077d
DORA PSI
Driencourt L, Federspiel F, Kazazis D, Tseng L-T, Frantz R, Ekinci Y, et al.
Electrically tunable filter based on plasmonic phase retarder and liquid crystals
In: Chang-Hasnain CJ, Faraon A, Zhou W, eds. High contrast metastructures IX. Vol. 11290. Proceedings of SPIE. Bellingham, USA: SPIE; 2020. https://doi.org/10.1117/12.2543569
DORA PSI
Driencourt L, Federspiel F, Kazazis D, Tseng L-T, Frantz R, Ekinci Y, et al.
Electrically tunable multicolored filter using birefringent plasmonic resonators and liquid crystals
ACS Photonics. 2020; 7(2): 444-453. https://doi.org/10.1021/acsphotonics.9b01404
DORA PSI
Falkenberg G, Seiboth F, Koch F, Falch KV, Schropp A, Brückner D, et al.
CRL optics and silicon drift detector for P06 Microprobe experiments at 35 keV
Powder Diffraction. 2020. https://doi.org/10.1017/S0885715620000536
DORA PSI
Finizio S, Wintz S, Mayr S, Huxtable AJ, Langer M, Bailey J, et al.
Current-induced dynamical tilting of chiral domain walls in curved microwires
Applied Physics Letters. 2020; 116: 182404 (5 pp.). https://doi.org/10.1063/5.0005186
DORA PSI
Frey M, Adelmann A, Locans U
On architecture and performance of adaptive mesh refinement in an electrostatics Particle-In-Cell code
Computer Physics Communications. 2020; 247: 106912 (18 pp.). https://doi.org/10.1016/j.cpc.2019.106912
DORA PSI
Grimm O, Bednarzik M, Birrer G, Commichau V
Changes in detection characteristics of CdTe X-ray sensors by proton irradiation
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2020; 972: 164116 (9 pp.). https://doi.org/10.1016/j.nima.2020.164116
DORA PSI
Hengsberger M, Leuenberger D, Schuler A, Roth S, Muntwiler M
Dynamics of excited interlayer states in hexagonal boron nitride monolayers
Journal of Physics D: Applied Physics. 2020; 53(20): 203001 (28 pp.). https://doi.org/10.1088/1361-6463/ab70c6
DORA PSI
Holler M, Odstrčil M, Guizar-Sicairos M, Lebugle M, Frommherz U, Lachat T, et al.
LamNI - an instrument for X-ray scanning microscopy in laminography geometry
Journal of Synchrotron Radiation. 2020; 27: 730-736. https://doi.org/10.1107/S1600577520003586
DORA PSI
Jarząbek DM, Milczarek M, Nosewicz S, Bazarnik P, Schift H
Size effects of hardness and strain rate sensitivity in amorphous silicon measured by nanoindentation
Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science. 2020; 51: 1625-1633. https://doi.org/10.1007/s11661-020-05648-w
DORA PSI
Karpik A, Martiel I, Kristiansen PM, Padeste C
Fabrication of ultrathin suspended polymer membranes as supports for serial protein crystallography
Micro and Nano Engineering. 2020; 7: 100053 (6 pp.). https://doi.org/10.1016/j.mne.2020.100053
DORA PSI
Kazazis D, Tseng L-T, Ekinci Y
Achromatic Talbot lithography with nano-ring masks for high-throughput periodic patterning
Microelectronic Engineering. 2020; 225: 111273 (7 pp.). https://doi.org/10.1016/j.mee.2020.111273
DORA PSI
Kim YY, Gelisio L, Mercurio G, Dziarzhytski S, Beye M, Bocklage L, et al.
Ghost imaging at an XUV free-electron laser
Physical Review A. 2020; 101(1): 013820 (7 pp.). https://doi.org/10.1103/PhysRevA.101.013820
DORA PSI
Kirk E, Bull C, Finizio S, Sepehri-Amin H, Wintz S, Suszka AK, et al.
Anisotropy-induced spin reorientation in chemically modulated amorphous ferrimagnetic films
Physical Review Materials. 2020; 4(7): 074403 (7 pp.). https://doi.org/10.1103/PhysRevMaterials.4.074403
DORA PSI
Makita M, Seniutinas G, Seaberg MH, Lee HJ, Galtier EC, Liang M, et al.
Double grating shearing interferometry for X-ray free-electron laser beams
Optica. 2020; 7(5): 404-409. https://doi.org/10.1364/OPTICA.390601
DORA PSI
Martiel I, Mozzanica A, Opara NL, Panepucci E, Leonarski F, Redford S, et al.
X-ray fluorescence detection for serial macromolecular crystallography using a JUNGFRAU pixel detector
Journal of Synchrotron Radiation. 2020; 27: 329-339. https://doi.org/10.1107/S1600577519016758
DORA PSI
Mochi I, Kim H-S, Locans U, Dejkameh A, Nebling R, Kazazis D, et al.
Illumination control in lensless imaging for EUV mask inspection and review
In: Felix NM, Lio A, eds. Extreme ultraviolet (EUV) lithography XI. Vol. 11323. Proceedings of SPIE. Bellingham, USA: SPIE; 2020. https://doi.org/10.1117/12.2552014
DORA PSI
Mochi I, Fernandez S, Nebling R, Locans U, Rajeev R, Dejkameh A, et al.
Quantitative characterization of absorber and phase defects on EUV reticles using coherent diffraction imaging
Journal of Micro/Nanolithography, MEMS, and MOEMS. 2020; 19(1): 014002 (11 pp.). https://doi.org/10.1117/1.JMM.19.1.014002
DORA PSI
Mortelmans T, Kazazis D, Guzenko VA, Padeste C, Braun T, Li X, et al.
Grayscale e-beam lithography: effects of a delayed development for well-controlled 3D patterning
Microelectronic Engineering. 2020; 225: 111272 (5 pp.). https://doi.org/10.1016/j.mee.2020.111272
DORA PSI
Orlandi GL, David C, Ferrari E, Guzenko VA, Ischebeck R, Prat E, et al.
Nanofabricated free-standing wire scanners for beam diagnostics with submicrometer resolution
Physical Review Accelerators and Beams. 2020; 23(4): 042802 (10 pp.). https://doi.org/10.1103/PhysRevAccelBeams.23.042802
DORA PSI
Osmani B, Schift H, Vogelsang K, Guzman R, Kristiansen PM, Crockett R, et al.
Hierarchically structured polydimethylsiloxane films for ultra-soft neural interfaces
Micro and Nano Engineering. 2020; 7: 100051 (5 pp.). https://doi.org/10.1016/j.mne.2020.100051
DORA PSI
Resnick D, Schift H
Imprint lithography
In: Smith BW, Suzuki K, eds. Microlithograph. Science and Technology. Boca Raton: CRC Press; 2020. https://doi.org/10.1201/9781315117171-11
DORA PSI
Romano L, Kagias M, Vila-Comamala J, Jefimovs K, Tseng L-T, Guzenko VA, et al.
Metal assisted chemical etching of silicon in the gas phase: a nanofabrication platform for X-ray optics
Nanoscale Horizons. 2020; 5(5): 869-879. https://doi.org/10.1039/C9NH00709A
DORA PSI
Rumo M, Nicholson CW, Pulkkinen A, Hildebrand B, Kremer G, Salzmann B, et al.
Examining the surface phase diagram of IrTe₂ with photoemission
Physical Review B. 2020; 101(23): 235120 (8 pp.). https://doi.org/10.1103/PhysRevB.101.235120
DORA PSI
Sassa Y, Johansson FOL, Lindblad A, Yazdi MG, Simonov K, Weissenrieder J, et al.
Kagome-like silicene: a novel exotic form of two-dimensional epitaxial silicon
Applied Surface Science. 2020; 530: 147195 (7 pp.). https://doi.org/10.1016/j.apsusc.2020.147195
DORA PSI
Seo J, Kim DY, An ES, Kim K, Kim G-Y, Hwang S-Y, et al.
Nearly room temperature ferromagnetism in a magnetic metal-rich van der Waals metal
Science Advances. 2020; 6(3): eaay8912 (9 pp.). https://doi.org/10.1126/sciadv.aay8912
DORA PSI
Stachnik K, Warmer M, Mohacsi I, Hennicke V, Fischer P, Meyer J, et al.
Multimodal X-ray imaging of nanocontainer-treated macrophages and calcium distribution in the perilacunar bone matrix
Scientific Reports. 2020; 10(1): 1784 (9 pp.). https://doi.org/10.1038/s41598-020-58318-7
DORA PSI
Storm M, Döring F, Marathe S, David C, Rau C
The Diamond I13 full-field transmission X-ray microscope: a Zernike phase-contrast setup for material sciences
Powder Diffraction. 2020. https://doi.org/10.1017/S0885715620000238
DORA PSI
Xie S, Horváth B, Werder J, Schift H
Sub-micron silver wires on non-planar polymer substrates fabricated by thermal nanoimprint and back injection molding
Micro and Nano Engineering. 2020; 8: 100062 (8 pp.). https://doi.org/10.1016/j.mne.2020.100062
DORA PSI
Yurgens V, Koch F, Scheel M, Weitkamp T, David C
Measurement and compensation of misalignment in double-sided hard X-ray Fresnel zone plates
Journal of Synchrotron Radiation. 2020; 27. https://doi.org/10.1107/S1600577520001757
DORA PSI
de Lima LH, Greber T, Muntwiler M
The true corrugation of a h-BN nanomesh layer
2D Materials. 2020; 7(3): 035006 (7 pp.). https://doi.org/10.1088/2053-1583/ab81ae
DORA PSI

Papers Published 2019

Orlandi GL, Borrelli S, David C, Ferrari E, Guzenko V, Hermann B, et al.
Wire-scanners with sub-micrometer resolution: Developments and measurements
In: Decking W, Sinn H, Geloni G, Schreiber S, Marx M, Schaa VRW, eds. 39th international free-electron laser conference. FEL2019. Proceedings. Vol. 39. Free electron laser conference. Geneva: JACoW Publishing; 2019. https://doi.org/10.18429/JACoW-FEL2019-WEB02
DORA PSI
Woerle J, Šimonka V, Müller E, Hössinger A, Sigg H, Selberherr S, et al.
Surface morphology of 4H-SiC after thermal oxidation
In: Gammon PM, Shah VA, McMahon RA, Jennings MR, Vavasour O, Padfield F, et al., eds. Vol. 963. Materials science forum. sine loco: Trans Tech Publications Ltd.; 2019. https://doi.org/10.4028/www.scientific.net/MSF.963.180
DORA PSI
Chretien J, Pauc N, Pilon FA, Bertrand M, Thai Q-M, Casiez L, et al.
GeSn lasers with uniaxial tensile strain in the gain medium
In: 2019 IEEE 16th international conference on group IV photonics (GFP). Danvers: IEEE; 2019. https://doi.org/10.1109/GROUP4.2019.8926113
DORA PSI
Chick S, Matmon G, Murdin B, Naftaly M
Metrology of complex refractive index for solids in the terahertz regime using frequency domain spectroscopy
In: 2019 44th international conference on infrared, millimeter, and terahertz waves (IRMMW-THz). Danvers: IEEE; 2019. https://doi.org/10.1109/IRMMW-THz.2019.8873778
DORA PSI
Ng SH, Seniutinas G, Ryu M, Katkus T, Le NHA, Stoddart P, et al.
UV illumination for electron and ion beam microscopy and nanofabrication
In: Lérondel G, Cho Y-H, Taguchi A, Kawata S, eds. UV and higher energy photonics: from materials to applications 2019. Vol. 11086. Proceedings of SPIE. Bellingham, USA: SPIE; 2019. https://doi.org/10.1117/12.2528681
DORA PSI
Schropp A, Brückner D, Bulda J, Falkenberg G, Garrevoet J, Hagemann J, et al.
Full-field hard X-ray microscopy based on aberration-corrected Be CRLs
In: Lai B, Somogyi A, eds. X-Ray nanoimaging: instruments and methods IV. Vol. 11112. Proceedings of SPIE. Bellingham, USA: SPIE; 2019. https://doi.org/10.1117/12.2528422
DORA PSI
Wang X, Tseng L-T, Mochi I, Vockenhuber M, van Lent-Protasova L, Custers R, et al.
Progress overview of EUV resists status towards high-NA EUV lithography
In: Itani T, Gargini PA, Naulleau PP, Ronse KG, eds. International conference on extreme ultraviolet lithography 2019. Vol. 11147. Proceedings of SPIE. Bellingham, USA: SPIE; 2019. https://doi.org/10.1117/12.2536923
DORA PSI
Marathe S, Storm M, Kuppilli VSC, Harrison R, Das G, Schroeder SLM, et al.
Development of synchrotron pink beam X-ray grating interferometer at the Diamond Light Source I13-2 beamline
In: Müller B, Wang G, eds. Developments in X-ray tomography XII. Vol. 11113. Proceedings of SPIE. Bellingham, USA: SPIE; 2019. https://doi.org/10.1117/12.2530698
DORA PSI
Messaoud JB, Michaud J-F, Certon D, Camarda M, Piluso N, Colin L, et al.
Investigation of the Young's modulus and the residual stress of 4H-SiC circular membranes on 4H-SiC substrates
Micromachines. 2019; 10(12): 801 (12 pp.). https://doi.org/10.3390/mi10120801
DORA PSI
Kirchner R, Schleunitz A, Zhang R, Schift H
Smart origination and functional replication: thermal reflow and innovative 3D structures
Journal of Photopolymer Science and Technology. 2019; 32(6): 799-804. https://doi.org/10.2494/photopolymer.32.799
DORA PSI
Thakur N, Tseng L-T, Vockenhuber M, Ekinci Y, Castellanos S
Stability studies on a sensitive EUV photoresist based on zinc metal oxoclusters
Journal of Microlithography, Microfabrication, and Microsystems. 2019; 18(4): 043504 (10 pp.). https://doi.org/10.1117/1.JMM.18.4.043504
DORA PSI
Horváth B, Al Jassin-Al-Hashemi E, Schift H
Interdigitated electrode arrays made by capillary filling and spin coating for UV-sensor fabrication
Flexible and Printed Electronics. 2019; 4(3): 035002 (10 pp.). https://doi.org/10.1088/2058-8585/ab3777
DORA PSI
Hales JE, Matmon G, Dalby PA, Ward JM, Aeppli G
Virus lasers for biological detection
Nature Communications. 2019; 10(1): 3594 (11 pp.). https://doi.org/10.1038/s41467-019-11604-z
DORA PSI
Ahsan A, Fatemeh Mousavi S, Nijs T, Nowakowska S, Popova O, Wäckerlin A, et al.
Watching nanostructure growth: kinetically controlled diffusion and condensation of Xe in a surface metal organic network
Nanoscale. 2019; 11(11): 4895-4903. https://doi.org/10.1039/c8nr09163c
DORA PSI
Xu H, Locans U, Adelmann A, Stingelin L
Calculation of longitudinal collective instabilities with mbtrack-cuda
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2019; 922: 345-351. https://doi.org/10.1016/j.nima.2019.01.041
DORA PSI
von den Driesch N, Stange D, Rainko D, Breuer U, Capellini G, Hartmann J-M, et al.
Epitaxy of Si-Ge-Sn-based heterostructures for CMOS-integratable light emitters
Solid State Electronics. 2019; 155: 139-143. https://doi.org/10.1016/j.sse.2019.03.013
DORA PSI
Horváth B, Křivová B, Schift H
Nanoimprint meets microfluidics: development of metal wires from nanoparticle ink filled capillaries
Micro and Nano Engineering. 2019; 3: 22-30. https://doi.org/10.1016/j.mne.2019.02.004
DORA PSI
Piquero-Zulaica I, Abd El-Fattah ZM, Popova O, Kawai S, Nowakowska S, Matena M, et al.
Effective determination of surface potential landscapes from metal-organic nanoporous network overlayers
New Journal of Physics. 2019; 21(5): 053004 (9 pp.). https://doi.org/10.1088/1367-2630/ab150e
DORA PSI
Tolstikova A, Levantino M, Yefanov O, Hennicke V, Fischer P, Meyer J, et al.
1 kHz fixed-target serial crystallography using a multilayer monochromator and an integrating pixel detector
IUCrJ. 2019; 6(5): 927-937. https://doi.org/10.1107/S205225251900914X
DORA PSI
Bastiaens A, Xie S, Luttge R
Nanogroove-enhanced hydrogel scaffolds for 3D neuronal cell culture: an easy access brain-on-chip model
Micromachines. 2019; 10(10): 638 (17 pp.). https://doi.org/10.3390/mi10100638
DORA PSI
Johnson BC, Woerle J, Haasmann D, Lew CT-K, Parker RA, Knowles H, et al.
Optically active defects at the SiC/SiO₂ interface
Physical Review Applied. 2019; 12(4): 044024 (7 pp.). https://doi.org/10.1103/PhysRevApplied.12.044024
DORA PSI
Chrétien J, Pauc N, Armand Pilon F, Bertrand M, Thai Q-M, Casiez L, et al.
GeSn lasers covering a wide wavelength range thanks to uniaxial tensile strain
ACS Photonics. 2019; 6(10): 2462-2469. https://doi.org/10.1021/acsphotonics.9b00712
DORA PSI
Wu L, Liu J, Vockenhuber M, Ekinci Y, Castellanos S
Hybrid EUV resists with mixed organic shells: a simple preparation method
European Journal of Inorganic Chemistry. 2019; 2019(38): 4136-4141. https://doi.org/10.1002/ejic.201900745
DORA PSI
Casadei CM, Nass K, Barty A, Hunter MS, Padeste C, Tsai C-J, et al.
Structure-factor amplitude reconstruction from serial femtosecond crystallography of two-dimensional membrane-protein crystals
IUCrJ. 2019; 6: 34-45. https://doi.org/10.1107/S2052252518014641
DORA PSI
Kujala N, Makita M, Liu J, Zozulya A, Sprung M, David C, et al.
Characterizing transmissive diamond gratings as beam splitters for the hard X-ray single-shot spectrometer of the European XFEL
Journal of Synchrotron Radiation. 2019; 26(3): 708-713. https://doi.org/10.1107/S1600577519003382
DORA PSI
Lyubomirskiy M, Koch F, Abrashitova KA, Bessonov VO, Kokareva N, Petrov A, et al.
Ptychographic characterisation of polymer compound refractive lenses manufactured by additive technology
Optics Express. 2019; 27(6): 8639 (12 pp.). https://doi.org/10.1364/OE.27.008639
DORA PSI
Nishijima Y, Balčytis A, Naganuma S, Seniutinas G, Juodkazis S
Kirchhoff’s metasurfaces towards efficient photo-thermal energy conversion
Scientific Reports. 2019; 9(1): 8284 (9 pp.). https://doi.org/10.1038/s41598-019-44781-4
DORA PSI
Armand Pilon FT, Lyasota A, Niquet Y-M, Reboud V, Calvo V, Pauc N, et al.
Lasing in strained germanium microbridges
Nature Communications. 2019; 10: 2724 (8 pp.). https://doi.org/10.1038/s41467-019-10655-6
DORA PSI
Fallica R
Beyond grayscale lithography: inherently three-dimensional patterning by Talbot effect
Advanced Optical Technologies. 2019; 8(3-4): 233-240. https://doi.org/10.1515/aot-2019-0005
DORA PSI
Kirchner R, Guzenko VA, Schift H
Single-digit 6-nm multilevel patterns by electron beam grayscale lithography
Advanced Optical Technologies. 2019; 8(3-4): 175-180. https://doi.org/10.1515/aot-2019-0016
DORA PSI
Seaberg M, Cojocaru R, Berujon S, Ziegler E, Jaggi A, Krempasky J, et al.
Wavefront sensing at X-ray free-electron lasers
Journal of Synchrotron Radiation. 2019; 26: 1115-1126. https://doi.org/10.1107/S1600577519005721
DORA PSI
Gliga S, Seniutinas G, Weber A, David C
Architectural structures open new dimensions in magnetism. Magnetic buckyballs
Materials Today. 2019; 26: 100-101. https://doi.org/10.1016/j.mattod.2019.05.001
DORA PSI
Förster J, Gräfe J, Bailey J, Finizio S, Träger N, Groß F, et al.
Direct observation of coherent magnons with suboptical wavelengths in a single-crystalline ferrimagnetic insulator
Physical Review B. 2019; 100(21): 214416 (7 pp.). https://doi.org/10.1103/PhysRevB.100.214416
DORA PSI
Förster J, Wintz S, Bailey J, Finizio S, Josten E, Dubs C, et al.
Nanoscale X-ray imaging of spin dynamics in yttrium iron garnet
Journal of Applied Physics. 2019; 126(17): 173909 (11 pp.). https://doi.org/10.1063/1.5121013
DORA PSI
Förster S, Schenk S, Zollner EM, Krahn O, Chiang C-T, Schumann FO, et al.
Quasicrystals and their approximants in 2D ternary oxides
Physica Status Solidi B: Basic Research. 2019: 1900624 (11 pp.). https://doi.org/10.1002/pssb.201900624
DORA PSI
Horváth B, Schäublin R, Dai Y
Flash electropolishing of TEM lamellas of irradiated tungsten
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 2019; 449: 29-34. https://doi.org/10.1016/j.nimb.2019.04.047
DORA PSI
Saha S, Zelent M, Finizio S, Mruczkiewicz M, Tacchi S, Suszka AK, et al.
Formation of Néel-type skyrmions in an antidot lattice with perpendicular magnetic anisotropy
Physical Review B. 2019; 100(14): 144435 (9 pp.). https://doi.org/10.1103/PhysRevB.100.144435
DORA PSI
Wang X, Tseng L-T, Mochi I, Vockenhuber M, van Lent-Protasova L, Custers R, et al.
Progress in EUV resists for contact holes printing using EUV interference lithography
In: Behringer UFW, Finders J, eds. 35th European mask and lithography conference (EMLC 2019). Vol. 1177. Proceedings of SPIE. Bellingham, USA: SPIE; 2019. https://doi.org/10.1117/12.2535678
DORA PSI
Ye L, Rouxel JR, Asban S, Rösner B, Mukamel S
Probing molecular chirality by orbital-angular-momentum-carrying X-ray pulses
Journal of Chemical Theory and Computation. 2019; 15(7): 4180-4186. https://doi.org/10.1021/acs.jctc.9b00346
DORA PSI
Nebling R, Mochi I, Kazazis D, Locans U, Dejkameh A, Ekinci Y
EUV reticle inspection using phase retrieval algorithms: a performance comparison
In: Itani T, Gargini PA, Naulleau PP, Ronse KG, eds. International conference on extreme ultraviolet lithography 2019. Vol. 11147. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2019. https://doi.org/10.1117/12.2536936
DORA PSI
Holler M, Odstrcil M, Guizar-Sicairos M, Lebugle M, Müller E, Finizio S, et al.
Three-dimensional imaging of integrated circuits with macro- to nanoscale zoom
Nature Electronics. 2019; 2: 464-470. https://doi.org/10.1038/s41928-019-0309-z
DORA PSI
Mochi I, Locans U, Dejkameh A, Nebling R, Kazazis D, Tseng L-T, et al.
Resolution enhancement for lensless mask metrology with RESCAN
In: Itani T, Gargini PA, Naulleau PP, Ronse KG, eds. International conference on extreme ultraviolet lithography 2019. Vol. 11147. Proceedings of SPIE. Bellingham, USA: SPIE; 2019. https://doi.org/10.1117/12.2537068
DORA PSI
Wang X, Tasdemir Z, Mochi I, Vockenhuber M, van Lent-Protasova L, Meeuwissen M, et al.
Progress in EUV resists towards high-NA EUV lithography
In: Goldberg KA, ed. Extreme ultraviolet (EUV) lithography X. Vol. 10957. Proceedings of SPIE. Bellingham, USA: SPIE; 2019. https://doi.org/10.1117/12.2516260
DORA PSI
O’Callaghan G, Popescu C, McClelland A, Kazazis D, Roth J, Theis W, et al.
Multi-trigger resist: novel synthesis improvements for high resolution EUV lithography
In: Gronheid R, Sanders DP, eds. Advances in patterning materials and processes XXXVI. Vol. 10960. Proceedings of SPIE. Bellingham, USA: SPIE; 2019. https://doi.org/10.1117/12.2515084
DORA PSI
Gädda T, Luong ND, Laukkanen M, Karaste K, Kähkönen O, Kauppi E, et al.
Advanced EUV negative tone resist and underlayer approaches exhibiting sub-20nm half-pitch resolution
In: Gronheid R, Sanders DP, eds. Advances in patterning materials and processes XXXVI. Vol. 10960. Proceedings of SPIE. Bellingham, USA: SPIE; 2019. https://doi.org/10.1117/12.2515600
DORA PSI
Thakur N, Vockenhuber M, Ekinci Y, Castellanos S
Zinc-based metal oxoclusters: towards enhanced EUV absorptivity
In: Kenneth A. G, ed. Extreme ultraviolet (EUV) lithography X. Vol. 10957. Proceedings of SPIE. Bellingham, USA: SPIE; 2019. https://doi.org/10.1117/12.2514814
DORA PSI
Wu L, Vockenhuber M, Ekinci Y, Castellanos S
The role of the organic shell in hybrid molecular materials for EUV lithography
In: Goldberg KA, ed. Extreme ultraviolet (EUV) lithography X. Vol. 10957. Proceedings of SPIE. Bellingham, USA: SPIE; 2019. https://doi.org/10.1117/12.2515264
DORA PSI
Woerle J, Prokscha T, Hallén A, Grossner U
Interaction of low-energy muons with defect profiles in proton-irradiated Si and 4H-SiC
Physical Review B. 2019; 100(11): 115202 (7 pp.). https://doi.org/10.1103/PhysRevB.100.115202
DORA PSI
Hemmi A, Cun H, Tocci G, Epprecht A, Stel B, Lingenfelder M, et al.
Catalyst proximity-induced functionalization of h-BN with quat derivatives
Nano Letters. 2019; 19(9): 5998-6004. https://doi.org/10.1021/acs.nanolett.9b01792
DORA PSI
Usachov DY, Tarasov AV, Matsui F, Muntwiler M, Bokai KA, Shevelev VO, et al.
Decoding the structure of interfaces and impurities in 2D materials by photoelectron holography
2D Materials. 2019; 6(4): 045046 (13 pp.). https://doi.org/10.1088/2053-1583/ab3ea8
DORA PSI
Dutta D, De DS, Fan D, Roy S, Alfieri G, Camarda M, et al.
Evidence for carbon clusters present near thermal gate oxides affecting the electronic band structure in SiC-MOSFET
Applied Physics Letters. 2019; 115(10): 101601 (5 pp.). https://doi.org/10.1063/1.5112779
DORA PSI
Woerle J, Johnson BC, Bongiorno C, Yamasue K, Ferro G, Dutta D, et al.
Two-dimensional defect mapping of the SiO₂/4H−SiC interface
Physical Review Materials. 2019; 3(8): 084602 (8 pp.). https://doi.org/10.1103/PhysRevMaterials.3.084602
DORA PSI
Mochi I, Kazazis D, Tseng L-T, Fernandez S, Rajeev R, Locans U, et al.
Lensless metrology for semiconductor lithography at EUV
In: Bodermann B, Frenner K, Silver RM, eds. Modeling aspects in optical metrology VII. Vol. 11057. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2019. https://doi.org/10.1117/12.2534350
DORA PSI
Wang X, Tseng L-T, Kazazis D, Tasdemir Z, Vockenhuber M, Mochi I, et al.
Studying resist performance for contact holes printing using EUV interference lithography
Journal of Micro/Nanolithography, MEMS, and MOEMS. 2019; 18(1): 013501 (11 pp.). https://doi.org/10.1117/1.JMM.18.1.013501
DORA PSI
Kang BJ, Gäumann G, Numan N, Ollmann Z, Waeber Y, Bagiante S, et al.
THz-induced insulator-to-metal transition in stacked VO₂nano-slits
In: 2019 44th international conference on infrared, millimeter, and terahertz waves (IRMMW-THz). Danvers, MA: IEEE; 2019. https://doi.org/10.1109/IRMMW-THz.2019.8873912
DORA PSI
Winter A, Ekinci Y, Gölzhäuser A, Turchanin A
Freestanding carbon nanomembranes and graphene monolayers nanopatterned via EUV interference lithography
2D Materials. 2019; 6(2): 021002 (8 pp.). https://doi.org/10.1088/2053-1583/ab0014
DORA PSI
Fernandez S, Kazazis D, Rajendran R, Mochi I, Helfenstein P, Yoshitake S, et al.
Comparative study of extreme ultraviolet absorber materials using lensless actinic imaging
Journal of Micro/Nanolithography, MEMS, and MOEMS. 2019; 18(1): 013506 (6 pp.). https://doi.org/10.1117/1.JMM.18.1.013506
DORA PSI
Mochi I, Ekinci Y
Lensless EUV lithography and imaging
Synchrotron Radiation News. 2019; 32(4): 22-27. https://doi.org/10.1080/08940886.2019.1634433
DORA PSI
Tseng L-T, Kazazis D, Wang X, Popescu CM, Robinson APG, Ekinci Y
Sub-20 nm Si fins with high aspect ratio via pattern transfer using fullerene-based spin-on-carbon hard masks
Microelectronic Engineering. 2019; 210: 8-13. https://doi.org/10.1016/j.mee.2019.03.002
DORA PSI
Preger C, Bulbucan C, Meuller BO, Ludvigsson L, Kostanyan A, Muntwiler M, et al.
Controlled oxidation and self-passivation of bimetallic magnetic FeCr and FeMn aerosol nanoparticles
Journal of Physical Chemistry C. 2019; 123(26): 16083-16090. https://doi.org/10.1021/acs.jpcc.9b01678
DORA PSI
Strocov VN, Lev LL, Kobayashi M, Cancellieri C, Husanu M-A, Chikina A, et al.
k-resolved electronic structure of buried heterostructure and impurity systems by soft-X-ray ARPES
Journal of Electron Spectroscopy and Related Phenomena. 2019; 236: 1-8. https://doi.org/10.1016/j.elspec.2019.06.009
DORA PSI
Tsujino S, Sato Y, Takeda Y, Tomizaki T
Oscillation resonances and anisotropic damping of the motion of acoustically levitated droplets in single-axis acoustic levitators
Applied Physics Letters. 2019; 115: 053702 (5 pp.). https://doi.org/10.1063/1.5112109
DORA PSI
Haydous F, Si W, Guzenko VA, Waag F, Pomjakushina E, El Kazzi M, et al.
Improved photoelectrochemical water splitting of CaNbO₂N photoanodes by CoPi photodeposition and durface passivation
Journal of Physical Chemistry C. 2019; 123(2): 1059-1068. https://doi.org/10.1021/acs.jpcc.8b09629
DORA PSI
Mochi I, Fernandez S, Nebling R, Locans U, Helfenstein P, Rajeev R, et al.
Absorber and phase defect inspection on EUV reticles using RESCAN
In: Goldberg KA, ed. Extreme Ultraviolet (EUV) lithography X. Vol. 10957. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2019. https://doi.org/10.1117/12.2515160
DORA PSI
Wu L, Baljozovic M, Portale G, Kazazis D, Vockenhuber M, Jung T, et al.
Mechanistic insights in Zr- and Hf-based molecular hybrid EUV photoresists
Journal of Micro/Nanolithography, MEMS, and MOEMS. 2019; 18(1): 013504 (10 pp.). https://doi.org/10.1117/1.JMM.18.1.013504
DORA PSI
Marks K, Yazdi MG, Piskorz W, Simonov K, Stefanuik R, Sostina D, et al.
Investigation of the surface species during temperature dependent dehydrogenation of naphthalene on Ni(111)
Journal of Chemical Physics. 2019; 150: 244704 (8 pp.). https://doi.org/10.1063/1.5098533
DORA PSI
Sendetskyi O, Scagnoli V, Leo N, Anghinolfi L, Alberca A, Lüning J, et al.
Continuous magnetic phase transition in artificial square ice
Physical Review B. 2019; 99(21): 214430 (11 pp.). https://doi.org/10.1103/PhysRevB.99.214430
DORA PSI
Grillo F, Megginson R, Batchelor D, Muntwiler M, Baddeley CJ
Structural and electronic characterization of Cu/Au(111) near-surface alloys
Japanese Journal of Applied Physics. 2019; 58(SI): SIIB09 (5 pp.). https://doi.org/10.7567/1347-4065/ab1b5b
DORA PSI
Odstrčil M, Lebugle M, Guizar-Sicairos M, David C, Holler M
Towards optimized illumination for high-resolution ptychography
Optics Express. 2019; 27(10): 14981 (17 pp.). https://doi.org/10.1364/OE.27.014981
DORA PSI
Döring F, Risch M, Rösner B, Beye M, Busse P, Kubiček K, et al.
A zone-plate-based two-color spectrometer for indirect X-ray absorption spectroscopy
Journal of Synchrotron Radiation. 2019; 26: 1266-1271. https://doi.org/10.1107/S1600577519003898
DORA PSI
Mochi I, Timmermans MY, Gallagher EE, Mariano M, Pollentier I, Rajendran R, et al.
Experimental evaluation of the impact of carbon nanotube EUV pellicles on reticle imaging
Journal of Micro/Nanolithography, MEMS, and MOEMS. 2019; 18(1): 014002 (7 pp.). https://doi.org/10.1117/1.JMM.18.1.014002
DORA PSI
Tsujino S, Shinoda A, Tomizaki T
On-demand droplet loading of ultrasonic acoustic levitator and its application for protein crystallography experiments
Applied Physics Letters. 2019; 114(21): 213702 (5 pp.). https://doi.org/10.1063/1.5095574
DORA PSI
Tomizaki T, Shinoda A, Tsujino S
Single crystal time-lapse measurement using ultrasonic acoustic levitation
In: Gwo S, Huang D-J, Wei D-H, eds. Proceedings of the 13th international conference on synchrotron radiation instrumentation – SRI2018. Vol. 2054. AIP conference proceedings. Melville, New York: AIP Publishing; 2019. https://doi.org/10.1063/1.5084703
DORA PSI
Brenner G, Dziarzhytski S, Miedema PS, Rösner B, David C, Beye M
Normalized single-shot X-ray absorption spectroscopy at a free-electron laser
Optics Letters. 2019; 44(9): 2157-2160. https://doi.org/10.1364/OL.44.002157
DORA PSI
Jal E, Makita M, Rösner B, David C, Nolting F, Raabe J, et al.
Single-shot time-resolved magnetic x-ray absorption at a free-electron laser
Physical Review B. 2019; 99(14): 144305 (9 pp.). https://doi.org/10.1103/PhysRevB.99.144305
DORA PSI
Górzny MŁ, Opara NL, Guzenko VA, Cadarso VJ, Schift H, Li XD, et al.
Microfabricated silicon chip as lipid membrane sample holder for serial protein crystallography
Micro and Nano Engineering. 2019; 3: 31-36. https://doi.org/10.1016/j.mne.2019.03.002
DORA PSI
Odstrcil M, Lebugle M, Lachat T, Raabe J, Holler M
Fast positioning for X-ray scanning microscopy by a combined motion of sample and beam-defining optics
Journal of Synchrotron Radiation. 2019; 26(2): 504-509. https://doi.org/10.1107/S160057751801785X
DORA PSI
Ahsan A, Mousavi SF, Nijs T, Nowakowska S, Popova O, Wäckerlin A, et al.
Phase transitions in confinements: controlling solid to fluid transitions of xenon atoms in an on-surface network
Small. 2019; 15(3): 1803169 (7 pp.). https://doi.org/10.1002/smll.201803169
DORA PSI
Kirchner R, Schift H
Thermal reflow of polymers for innovative and smart 3D structures: a review
Materials Science in Semiconductor Processing. 2019; 92: 58-72. https://doi.org/10.1016/j.mssp.2018.07.032
DORA PSI
Horváth B, Křivová B, Bolat S, Schift H
Fabrication of large area sub-200 nm conducting electrode arrays by self-confinement of spincoated metal nanoparticle inks
Advanced Materials Technologies. 2019; 4(3): 1800652 (11 pp.). https://doi.org/10.1002/admt.201800652
DORA PSI
Greber T, Seitsonen AP, Hemmi A, Dreiser J, Stania R, Matsui F, et al.
Circular dichroism and angular deviation in x-ray absorption spectra of Dy₂ScN@C₈₀ single-molecule magnets on h-BN/Rh(111)
Physical Review Materials. 2019; 3(1): 014409 (5 pp.). https://doi.org/10.1103/PhysRevMaterials.3.014409
DORA PSI
Svetina C, Mankowsky R, Knopp G, Koch F, Seniutinas G, Rösner B, et al.
Towards X-ray transient grating spectroscopy
Optics Letters. 2019; 44(3): 574-577. https://doi.org/10.1364/OL.44.000574
DORA PSI
Moradi M, Opara NL, Tulli LG, Wäckerlin C, Dalgarno SJ, Teat SJ, et al.
Supramolecular architectures of molecularly thin yet robust free-standing layers
Science Advances. 2019; 5(2): eaav4489 (7 pp.). https://doi.org/10.1126/sciadv.aav4489
DORA PSI
Rösner B, Dudin P, Bosgra J, Hoesch M, David C
Zone plates for angle-resolved photoelectron spectroscopy providing sub-micrometre resolution in the extreme ultraviolet regime
Journal of Synchrotron Radiation. 2019; 26(2): 467-472. https://doi.org/10.1107/S1600577519000869
DORA PSI
Nida S, Tsibizov A, Ziemann T, Woerle J, Moesch A, Schulze-Briese C, et al.
Silicon carbide X-ray beam position monitors for synchrotron applications
Journal of Synchrotron Radiation. 2019; 26(1): 28-35. https://doi.org/10.1107/S1600577518014248
DORA PSI
Crha J, Vila-Comamala J, Lehmann E, David C, Trtik P
Light yield enhancement of 157-gadolinium oxysulfide scintillator screens for the high-resolution neutron imaging
MethodsX. 2019; 6: 107-114. https://doi.org/10.1016/j.mex.2018.12.005
DORA PSI
Makita M, Vartiainen I, Mohacsi I, Caleman C, Diaz A, Jönsson HO, et al.
Femtosecond phase-transition in hard x-ray excited bismuth
Scientific Reports. 2019; 9(1): 602 (7 pp.). https://doi.org/10.1038/s41598-018-36216-3
DORA PSI
Heldt G, Thompson P, Chopdekar RV, Kohlbrecher J, Lee S, Heyderman LJ, et al.
Characterisation of size distribution and positional misalignment of nanoscale islands by small-angle X-ray scattering
Journal of Applied Physics. 2019; 125(1): 014301 (8 pp.). https://doi.org/10.1063/1.5050882
DORA PSI
Gottlieb S, Rösner B, Evangelio L, Fernández-Regúlez M, Nogales A, García-Gutiérrez MC, et al.
Self-assembly morphology of block copolymers in sub-10 nm topographical guiding patterns
Molecular Systems Design & Engineering. 2019; 4(1): 175-185. https://doi.org/10.1039/c8me00046h
DORA PSI
Krempaský J, Fanciulli M, Pilet N, Minár J, Khan W, Muntwiler M, et al.
Spin-resolved electronic structure of ferroelectric α-GeTe and multiferroic Ge_1–xMn_xTe
Journal of Physics and Chemistry of Solids. 2019; 128: 237-244. https://doi.org/10.1016/j.jpcs.2017.11.010
DORA PSI
Kagias M, Wang Z, Guzenko VA, David C, Stampanoni M, Jefimovs K
Fabrication of Au gratings by seedless electroplating for X-ray grating interferometry
Materials Science in Semiconductor Processing. 2019; 92: 73-79. https://doi.org/10.1016/j.mssp.2018.04.015
DORA PSI

Papers Published 2018

Szmyt W, Marot L, Calame M, Padeste C, Dransfeld C
Carbon fibre-carbon nanotube multiscale composites - nanoengineering of the fibre surface for protection in extreme processing conditions
In: 18th European conference on composite materials (ECCM-18). Patras: Applied Mechanics Laboratory; 2018:(9 pp.).
DORA PSI
von den Driesch N, Stange D, Rainko D, Povstugar I, Breuer U, Ikonic Z, et al.
Epitaxy of direct bandgap group IV Si-Ge-Sn alloys towards heterostructure light emitters
In: Liu Q, Hartmann JM, Thean A, Miyazaki S, Ogura A, Gong X, et al., eds. SiGe, Ge, and related materials: materials, processing, and devices 8. Vol. 86. ECS transactions. sine loco: IOP Publishing; 2018. https://doi.org/10.1149/08607.0189ecst
DORA PSI
Armand Pilon F, Pauc N, Widiez J, Reboud V, Calvo V, Hartmann JM, et al.
Emerging optical gain in highly strained Germanium
In: Advanced photonics 2018 (BGPP, IPR, NP, NOMA, sensors, networks, SPPCom, SOF). Vol. ITu4I. Integrated photonics research, silicon and nanophotonics. Washington D.C.: OSA - The Optical Society; 2018. https://doi.org/10.1364/IPRSN.2018.ITu4I.3
DORA PSI
Stange D, von den Driesch N, Rainko D, Zabel T, Marzban B, Ikonic Z, et al.
Quantum confinement effects in GeSn/SiGeSn heterostructure lasers
In: 2017 IEEE international electron devices meeting (IEDM). International electron devices meeting (IEDM). sine loco: IEEE; 2018. https://doi.org/10.1109/IEDM.2017.8268451
DORA PSI
Zdora M-C, Zanette I, Zhou T, Koch FJ, Romell J, Sala S, et al.
At-wavelength optics characterisation via X-ray speckle- and grating-based unified modulated pattern analysis
Optics Express. 2018; 26(4): 4989-5004. https://doi.org/10.1364/OE.26.004989
DORA PSI
Schluck J, Hund M, Heckenthaler T, Heinzel T, Siboni NH, Horbach J, et al.
Linear negative magnetoresistance in two-dimensional Lorentz gases
Physical Review B. 2018; 97(11): 115301 (7 pp.). https://doi.org/10.1103/PhysRevB.97.115301
DORA PSI
Siboni NH, Schluck J, Pierz K, Schumacher HW, Kazazis D, Horbach J, et al.
Nonmonotonic classical magnetoconductivity of a two-dimensional electron gas in a disordered array of obstacles
Physical Review Letters. 2018; 120(5): 056601 (5 pp.). https://doi.org/10.1103/PhysRevLett.120.056601
DORA PSI
Stange D, von den Driesch N, Zabel T, Armand-Pilon F, Rainko D, Marzban B, et al.
GeSn/SiGeSn heterostructure and multi quantum well lasers
ACS Photonics. 2018; 5(11): 4628-4636. https://doi.org/10.1021/acsphotonics.8b01116
DORA PSI
von den Driesch N, Stange D, Rainko D, Povstugar I, Zaumseil P, Capellini G, et al.
Advanced GeSn/SiGeSn group IV heterostructure lasers
Advanced Science. 2018; 5(6): 1700955 (7 pp.). https://doi.org/10.1002/advs.201700955
DORA PSI
Nachawaty A, Yang M, Nanot S, Kazazis D, Yakimova R, Escoffier W, et al.
Large nonlocality in macroscopic Hall bars made of epitaxial graphene
Physical Review B. 2018; 98(4): 045403 (8 pp.). https://doi.org/10.1103/PhysRevB.98.045403
DORA PSI
Schluck J, Feilhauer J, Pierz K, Schumacher HW, Kazazis D, Gennser U, et al.
Quantum signatures of competing electron trajectories in antidot superlattices
Physical Review B. 2018; 98(16): 165415 (6 pp.). https://doi.org/10.1103/PhysRevB.98.165415
DORA PSI
Ekinci Y, Garvey T, Rivkin L, Streun A, Wrulich A
A compact high-brightness accelerator-based EUV source for actinic mask inspection
In: Optics InfoBase Conference Papers. Vol. Part F85-EUVXRAY 2018. OSA - The Optical Society; 2018. https://doi.org/10.1364/EUVXRAY.2018.ET3B.5
DORA PSI
Fernandez S, Kazazis D, Rajeev R, Mochi I, Helfenstein P, Yoshitake S, et al.
A comparative study of EUV absorber materials using lensless actinic imaging of EUV photomasks
In: Goldberg KA, ed. Extreme ultraviolet (EUV) lithography IX. Vol. 10583. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018. https://doi.org/10.1117/12.2297381
DORA PSI
Mochi I, Rajeev R, Helfenstein P, Fernandez S, Kazazis D, Ekinci Y
Through-pellicle inspection of EUV masks
In: Goldberg KA, ed. Extreme ultraviolet (EUV) lithography IX. Vol. 10583. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018. https://doi.org/10.1117/12.2297436
DORA PSI
Castellanos S, Wu L, Baljozovic M, Portale G, Kazazis D, Vockenhuber M, et al.
Ti, Zr, and Hf-based molecular hybrid materials as EUV photoresists
In: Goldberg KA, ed. Extreme ultraviolet (EUV) lithography IX. Vol. 10583. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018. https://doi.org/10.1117/12.2297167
DORA PSI
Manouras T, Kazazis D, Koufakis E, Ekinci Y, Vamvakaki M, Argitis P
Ultra-sensitive EUV resists based on acid-catalyzed polymer backbone breaking
In: Goldberg KA, ed. SPIE advanced lithography. Vol. 10583. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018. https://doi.org/10.1117/12.2299853
DORA PSI
Wang X, Tseng L-T, Kazazis D, Tasdemir Z, Vockenhuber M, Mochi I, et al.
Studying resist performance for contact holes printing using EUV interference lithography
In: Ronse KG, Hendrickx E, Naulleau PP, Gargini PA, Itani T, eds. International conference on extreme ultraviolet lithography 2018. Vol. 10809. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018. https://doi.org/10.1117/12.2501949
DORA PSI
Rajeev R, Mochi I, Kazazis D, Fernandez S, Li-Teng T, Helfenstein P, et al.
Phase defect inspection on EUV masks using RESCAN
In: Ronse KG, Hendrickx E, Naulleau PP, Gargini PA, Itani T, eds. International conference on extreme ultraviolet lithography 2018. Vol. 10809. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018. https://doi.org/10.1117/12.2502726
DORA PSI
Tasdemir Z, Vockenhuber M, Mochi I, Garrido Olvera K, Meeuwissen M, Yildirim O, et al.
Chemically-amplified EUV resists approaching 11nm half-pitch
In: Goldberg KA, ed. Extreme ultraviolet (EUV) lithography IX. Vol. 10583. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018. https://doi.org/10.1117/12.2299643
DORA PSI
Krempaský J, Koch F, Vagovič P, Mikeš L, Jaggi A, Svetina C, et al.
Inspecting adaptive optics with at-wavelength wavefront metrology
In: Spiga D, Mimura H, eds. Adaptive X-ray optics V. Vol. 10761. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018. https://doi.org/10.1117/12.2320532
DORA PSI
Rantala J, Gädda T, Laukkanen M, Nguyen Dang L, Karaste K, Kazazis D, et al.
New resist and underlayer approaches toward EUV lithography
In: Ronse KG, Hendrickx E, Naulleau PP, Gargini PA, Itani T, eds. International conference on extreme ultraviolet lithography 2018. Vol. 10809. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018. https://doi.org/10.1117/12.2503107
DORA PSI
Dejkameh A, Erdmann A, Evanschitzky P, Ekinci Y
Fourier ptychography for lithography high NA systems
In: Smith DG, Wyrowski F, Erdmann A, eds. Computational optics II. Vol. 10694. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018. https://doi.org/10.1117/12.2311332
DORA PSI
Tasdemir Z, Wang X, Mochi I, van Lent-Protasova L, Meeuwissen M, Custers R, et al.
Evaluation of EUV resists for 5 nm technology node and beyond
In: Ronse KG, Hendrickx E, Naulleau PP, Gargini PA, Itani T, eds. International conference on extreme ultraviolet lithography 2018. Vol. 10809. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018. https://doi.org/10.1117/12.2502688
DORA PSI
Popescu C, Kazazis D, McClelland A, Dawson G, Roth J, Theis W, et al.
High-resolution EUV lithography using a multi-trigger resist
In: Goldberg KA, ed. Extreme ultraviolet (EUV) lithography IX. Vol. 10583. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018. https://doi.org/10.1117/12.2297406
DORA PSI
Popescu C, McClelland A, Kazazis D, Dawson G, Roth J, Ekinci Y, et al.
Multi-trigger resist for electron beam and extreme ultraviolet lithography
In: Behringer UFW, Finders J, eds. 34th European mask and lithography conference. Vol. 10775. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018. https://doi.org/10.1117/12.2316628
DORA PSI
Ekinci Y, Garvey T, Streun A, Wrulich A, Rivkin L
A high-brightness accelerator-based EUV source for metrology applications
In: Gallagher EE, Rankin JH, eds. Photomask technology 2018. Vol. 10810. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018. https://doi.org/10.1117/12.2501930
DORA PSI
Mochi I, Timmermans M, Gallagher E, Mariano M, Pollentier I, Rajeev R, et al.
Experimental evaluation of the impact of EUV pellicles on reticle imaging
In: Gallagher EE, Rankin JH, eds. Photomask technology 2018. Vol. 10810. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2018. https://doi.org/10.1117/12.2502480
DORA PSI
Matmon G, Ginossar E, Villis BJ, Kölker A, Lim T, Solanki H, et al.
Two- to three-dimensional crossover in a dense electron liquid in silicon
Physical Review B. 2018; 97: 155306 (8 pp.). https://doi.org/10.1103/PhysRevB.97.155306
DORA PSI
Chikina A, Lechermann F, Husanu M-A, Caputo M, Cancellieri C, Wang X, et al.
Orbital ordering of the mobile and localized electrons at oxygen-deficient LaAlO₃/SrTiO₃ interfaces
ACS Nano. 2018; 12(8): 7927-7935. https://doi.org/10.1021/acsnano.8b02335
DORA PSI
Fallica R, Haitjema J, Wu L, Castellanos S, Brouwer AM, Ekinci Y
Absorption coefficient of metal-containing photoresists in the extreme ultraviolet
Journal of Micro/Nanolithography, MEMS, and MOEMS. 2018; 17(2): 023505 (7 pp.). https://doi.org/10.1117/1.JMM.17.2.023505
DORA PSI
Rau C, Storm M, Marathe S, Bodey AJ, Cipiccia S, Batey D, et al.
Multi-scale imaging at the coherence and imaging beamline I13 at diamond
In: Proceedings of the 14th international conference on X-ray microscopy (XRM2018). Vol. 24. Microscopy and Microanalysi. sine loco: Cambridge University Press; 2018. https://doi.org/10.1017/S1431927618013624
DORA PSI
Choi J, Ivashko O, Dennler N, Aoki D, von Arx K, Gerber S, et al.
Pressure-induced rotational symmetry breaking in URu₂Si₂
Physical Review B. 2018; 98(24): 241113 (5 pp.). https://doi.org/10.1103/PhysRevB.98.241113
DORA PSI
Villanueva-Perez P, Pedrini B, Mokso R, Vagovic P, Guzenko VA, Leake SJ, et al.
Hard x-ray multi-projection imaging for single-shot approaches
Optica. 2018; 5(12): 1521-1524. https://doi.org/10.1364/OPTICA.5.001521
DORA PSI
Bray K, Regan B, Trycz A, Previdi R, Seniutinas G, Ganesan K, et al.
Single crystal diamond membranes and photonic resonators containing germanium vacancy color centers
ACS Photonics. 2018; 5(12): 4817-4822. https://doi.org/10.1021/acsphotonics.8b00930
DORA PSI
Fallica R, Ekinci Y
Photoacid generator-polymer interaction on the quantum yield of chemically amplified resists for extreme ultraviolet lithography
Journal of Materials Chemistry C. 2018; 6(27): 7267-7273. https://doi.org/10.1039/c8tc01446a
DORA PSI
Gottlieb S, Kazazis D, Mochi I, Evangelio L, Fernández-Regúlez M, Ekinci Y, et al.
Nano-confinement of block copolymers in high accuracy topographical guiding patterns: modelling the emergence of defectivity due to incommensurability
Soft Matter. 2018; 14(33): 6799-6808. https://doi.org/10.1039/c8sm01045e
DORA PSI
Kazazis D, Tseng L-T, Ekinci Y
Improving the resolution and throughput of achromatic Talbot lithography
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 2018; 36(6): 06J501 (11 pp.). https://doi.org/10.1116/1.5048506
DORA PSI
Chen X, Tao Z, Chen C, Wang C, Wang L, Jiang H, et al.
All-dielectric metasurface-based roll-angle sensor
Sensors and Actuators A: Physical. 2018; 279: 509-517. https://doi.org/10.1016/j.sna.2018.06.058
DORA PSI
Gerspach MA, Mojarad N, Sharma D, Ekinci Y, Pfohl T
Pneumatically controlled nanofluidic devices for contact-free trapping and manipulation of nanoparticles
Particle and Particle Systems Characterization. 2018; 35(12): 1800161 (7 pp.). https://doi.org/10.1002/ppsc.201800161
DORA PSI
Bergamaschi A, Andrä M, Barten R, Borca C, Brückner M, Chiriotti S, et al.
The MÖNCH detector for soft X-ray, high-resolution, and energy resolved applications
Synchrotron Radiation News. 2018; 31(6): 11-15. https://doi.org/10.1080/08940886.2018.1528428
DORA PSI
Usachov DY, Tarasov AV, Bokai KA, Shevelev VO, Vilkov OY, Petukhov AE, et al.
Site- and spin-dependent coupling at the highly ordered h-BN/Co(0001) interface
Physical Review B. 2018; 98(19): 195438. https://doi.org/10.1103/PhysRevB.98.195438
DORA PSI
Lebugle M, Dworkowski F, Pauluhn A, Guzenko VA, Romano L, Meier N, et al.
High-intensity x-ray microbeam for macromolecular crystallography using silicon kinoform diffractive lenses
Applied Optics. 2018; 57(30): 9032-9039. https://doi.org/10.1364/AO.57.009032
DORA PSI
Do A, Briat M, Chaleil A, Rubbelynck C, Lebugle M, David C, et al.
Characterization of a two-channel, high resolution hard x-ray microscope using Fresnel zone plates for laser-plasma interaction experiments
Review of Scientific Instruments. 2018; 89(10): 10G122 (4 pp.). https://doi.org/10.1063/1.5039326
DORA PSI
Ferrari E, Ischebeck R, Bednarzik M, Bettoni S, Borrelli S, Braun H-H, et al.
The ACHIP experimental chambers at the Paul Scherrer Institut
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2018; 907: 244-247. https://doi.org/10.1016/j.nima.2018.02.112
DORA PSI
Bergamaschi A, Andrä M, Barten R, Brückner M, Chiriotti S, David C, et al.
Hybrid detectors for high resolution imaging
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 316-318. https://doi.org/10.1017/S1431927618013910
DORA PSI
Scheel M, Perrin J, Koch F, Yurgens V, Le Roux V, Giorgetta J-L, et al.
Toward hard X-ray transmission microscopy at the ANATOMIX beamline of synchrotron SOLEIL
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 246-247. https://doi.org/10.1017/S1431927618013582
DORA PSI
Greving I, Flenner S, Larsson E, Storm M, Wilde F, Lilleodden E, et al.
Full-field hard X-ray microscope designed for materials science applications
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 226-227. https://doi.org/10.1017/S143192761801348X
DORA PSI
Storm M, Cipiccia S, Marathe S, Kuppili VSC, Döring F, David C, et al.
The diamond I13-2 transmission X-ray microscope: current status and future developments
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 216-217. https://doi.org/10.1017/S1431927618013430
DORA PSI
Schropp A, Brückner D, Bulda J, Falkenberg G, Garrevoet J, Seiboth F, et al.
Scanning hard X-ray microscopy based on Be CRLs
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 186-187. https://doi.org/10.1017/S1431927618013284
DORA PSI
Villanueva-Perez P, Pedrini B, Mokso R, Vagovic P, Guzenko V, Leake S, et al.
Coherent hard X-ray multiprojection imaging
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 50-51. https://doi.org/10.1017/S1431927618012680
DORA PSI
Stania R, Seitsonen AP, Kunhardt D, Büchner B, Popov AA, Muntwiler M, et al.
Electrostatic interaction across a single-layer carbon shell
Journal of Physical Chemistry Letters. 2018; 9(13): 3586-3590. https://doi.org/10.1021/acs.jpclett.8b01326
DORA PSI
Matsui F, Nishikawa H, Daimon H, Muntwiler M, Takizawa M, Namba H, et al.
The 4π k_z periodicity in photoemission from graphite
Physical Review B. 2018; 97(4): 045430 (6 pp.). https://doi.org/10.1103/PhysRevB.97.045430
DORA PSI
Suszka AK, Gliga S, Warnicke P, Wintz S, Saha S, Charipar KM, et al.
Observation of the out-of-plane magnetization in a mesoscopic ferromagnetic structure superjacent to a superconductor
Applied Physics Letters. 2018; 113(16): 162601 (4 pp.). https://doi.org/10.1063/1.5051653
DORA PSI
Nijs T, Klein YM, Mousavi SF, Ahsan A, Nowakowska S, Constable EC, et al.
The Different Faces of 4′-Pyrimidinyl-Functionalized 4,2′:6′,4′′-Terpyridines: Metal-Organic Assemblies from Solution and on Au(111) and Cu(111) Surface Platforms
Journal of the American Chemical Society. 2018; 140(8): 2933-2939. https://doi.org/10.1021/jacs.7b12624
DORA PSI
Nowakowska S, Mazzola F, Alberti MN, Song F, Voigt T, Nowakowski J, et al.
Adsorbate-induced modification of the confining barriers in a quantum box array
ACS Nano. 2018; 12(1): 768-778. https://doi.org/10.1021/acsnano.7b07989
DORA PSI
Müller V, Hinaut A, Moradi M, Baljozovic M, Jung TA, Shahgaldian P, et al.
A two-dimensional polymer synthesized at the air/water interface
Angewandte Chemie International Edition. 2018; 57(33): 10584-10588. https://doi.org/10.1002/anie.201804937
DORA PSI
Lazarević-Pašti T, Anićijević V, Baljozović M, Vasić Anićijević D, Gutić S, Vasić V, et al.
The impact of the structure of graphene-based materials on the removal of organophosphorus pesticides from water
Environmental Science: Nano. 2018; 5(6): 1482-1494. https://doi.org/10.1039/c8en00171e
DORA PSI
Zhang Y, Haitjema J, Baljozovic M, Vockenhuber M, Kazazis D, Jung TA, et al.
Dual-tone application of a tin-oxo cage photoresist under e-beam and EUV exposure
Journal of Photopolymer Science and Technology. 2018; 31(2): 249-255. https://doi.org/10.2494/photopolymer.31.249
DORA PSI
Flenner S, Larsson E, Furlan K, Laipple D, Storm M, Wilde F, et al.
Nanotomography of inverse photonic crystals using zernike phase contrast
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 146-147. https://doi.org/10.1017/S1431927618013120
DORA PSI
Fallica R, Watts B, Rösner B, Della Giustina G, Brigo L, Brusatin G, et al.
Changes in the near edge x-ray absorption fine structure of hybrid organic-inorganic resists upon exposure
Nanotechnology. 2018; 29(36): 36LT03 (6 pp.). https://doi.org/10.1088/1361-6528/aaccd4
DORA PSI
Fink RH, Rösner B, Du X, Späth A, Johnson M, Hawly T, et al.
In-operando soft X-ray microspectroscopy of organic electronics devices
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 424-425. https://doi.org/10.1017/S143192761801437X
DORA PSI
Ribič PR, Rösner B, Gauthier D, Döring F, Masciovecchio C, Principi E, et al.
Extreme-ultraviolet vortices at a free-electron laser
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 292-293. https://doi.org/10.1017/S1431927618013806
DORA PSI
Rösner B, Koch F, Döring F, Guzenko VA, Meyer M, Ornelas JL, et al.
7 nm spatial resolution in soft X-ray microscopy
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 270-271. https://doi.org/10.1017/S1431927618013697
DORA PSI
Ornelas JL, Rösner B, Späth A, Fink RH
STXM_deconv – a MATLAB script for the deconvolution of STXM images
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 120-121. https://doi.org/10.1017/S1431927618012990
DORA PSI
Döring F, Marschall F, Yin Z, Rösner B, Beye M, Miedema P, et al.
1D-full field microscopy of elastic and inelastic scattering with transmission off-axis fresnel zone plates
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 182-183. https://doi.org/10.1017/S1431927618013260
DORA PSI
David C, Rösner B, Döring F, Guzenko V, Koch F, Lebugle M, et al.
Diffractive X-ray optics for synchrotrons and free-electron lasers
Microscopy and Microanalysis. 2018; 24(Suppl. 2): 264-267. https://doi.org/10.1017/S1431927618013673
DORA PSI
Helfenstein P, Rajeev R, Mochi I, Kleibert A, Vaz CAF, Ekinci Y
Beam drift and partial probe coherence effects in EUV reflective-mode coherent diffractive imaging
Optics Express. 2018; 26(9): 12242-12256. https://doi.org/10.1364/OE.26.012242
DORA PSI
Tsujino S
Transverse structure of the wave function of field emission electron beam determined by intrinsic transverse energy
Journal of Applied Physics. 2018; 124(4): 044304 (12 pp.). https://doi.org/10.1063/1.5035284
DORA PSI
Lee C, Tsujino S, Miller RJD
Transmission low-energy electron diffraction using double-gated single nanotip field emitter
Applied Physics Letters. 2018; 113(1): 013505 (4 pp.). https://doi.org/10.1063/1.5030889
DORA PSI
Finizio S, Wintz S, Gliga S, Kirk E, Suszka AK, Wohlhüter P, et al.
Unexpected field-induced dynamics in magnetostrictive microstructured elements under isotropic strain
Journal of Physics: Condensed Matter. 2018; 30(31): 314001 (6 pp.). https://doi.org/10.1088/1361-648X/aacddd
DORA PSI
Olbinado MP, Grenzer J, Pradel P, De Resseguier T, Vagovic P, Zdora M-C, et al.
Advances in indirect detector systems for ultra high-speed hard X-ray imaging with synchrotron light
Journal of Instrumentation. 2018; 13(4): C04004 (8 pp.). https://doi.org/10.1088/1748-0221/13/04/C04004
DORA PSI
Seniutinas G, Weber A, Padeste C, Sakellari I, Farsari M, David C
Beyond 100 nm resolution in 3D laser lithography — post processing solutions
Microelectronic Engineering. 2018; 191: 25-31. https://doi.org/10.1016/j.mee.2018.01.018
DORA PSI
Graczyk M, Cattoni A, Rösner B, Seniutinas G, Löfstrand A, Kvennefors A, et al.
Nanoimprint stamps with ultra-high resolution: optimal fabrication techniques
Microelectronic Engineering. 2018; 190: 73-78. https://doi.org/10.1016/j.mee.2018.01.008
DORA PSI
Cattoni A, Mailly D, Dalstein O, Faustini M, Seniutinas G, Rösner B, et al.
Sub-10 nm electron and helium ion beam lithography using a recently developed alumina resist
Microelectronic Engineering. 2018; 193: 18-22. https://doi.org/10.1016/j.mee.2018.02.015
DORA PSI
Matsui F, Ota H, Sugita K, Muntwiler M, Stania R, Greber T
Parallel and antiparallel angular momentum transfer of circularly polarized light to photoelectrons and Auger electrons at the Ni L₃ absorption threshold
Physical Review B. 2018; 97(3): 035424. https://doi.org/10.1103/PhysRevB.97.035424
DORA PSI
Horvath B, Dai Y, Lee Y
Annealing effect on the microstructure of tungsten irradiated in SINQ target
Journal of Nuclear Materials. 2018; 506: 19-25. https://doi.org/10.1016/j.jnucmat.2017.12.020
DORA PSI
De Bardi M, Müller R, Grünzweig C, Mannes D, Boillat P, Rigollet M, et al.
On the needle clogging of staked-in-needle pre-filled syringes: mechanism of liquid entering the needle and solidification process
European Journal of Pharmaceutics and Biopharmaceutics. 2018; 128: 272-281. https://doi.org/10.1016/j.ejpb.2018.05.006
DORA PSI
De Bardi M, Müller R, Grünzweig C, Mannes D, Rigollet M, Bamberg F, et al.
Clogging in staked-in needle pre-filled syringes (SIN-PFS): influence of water vapor transmission through the needle shield
European Journal of Pharmaceutics and Biopharmaceutics. 2018; 127: 104-111. https://doi.org/10.1016/j.ejpb.2018.02.016
DORA PSI
Arava H, Derlet PM, Vijayakumar J, Cui J, Bingham NS, Kleibert A, et al.
Computational logic with square rings of nanomagnets
Nanotechnology. 2018; 29(26): 265205 (7 pp.). https://doi.org/10.1088/1361-6528/aabbc3
DORA PSI
Chaix L, Huang EW, Gerber S, Lu X, Jia C, Huang Y, et al.
Resonant inelastic x-ray scattering studies of magnons and bimagnons in the lightly doped cuprate La_2-xSr_xCuO₄
Physical Review B. 2018; 97(15): 155144 (8 pp.). https://doi.org/10.1103/PhysRevB.97.155144
DORA PSI
Monney C, Schuler A, Jaouen T, Mottas M-L, Wolf T, Merz M, et al.
Robustness of the charge-ordered phases in IrTe₂ against photoexcitation
Physical Review B. 2018; 97(7): 075110 (8 pp.). https://doi.org/10.1103/PhysRevB.97.075110
DORA PSI
Wilklow-Marnell M, Moglia D, Steimle B, Cardineau B, Al-Mashat H, Nastasi P, et al.
First-row transitional-metal oxalate resists for EUV
Journal of Micro/Nanolithography, MEMS, and MOEMS. 2018; 17(4): 043507 (9 pp.). https://doi.org/10.1117/1.JMM.17.4.043507
DORA PSI
Tudisco S, La Via F, Agodi C, Altana C, Borghi G, Boscardin M, et al.
SiCILIA—silicon carbide detectors for intense luminosity investigations and applications
Sensors. 2018; 18(7): 2289 (16 pp.). https://doi.org/10.3390/s18072289
DORA PSI
Borrelli S, Orlandi GL, Bednarzik M, David C, Ferrari E, Guzenko VA, et al.
Generation and measurement of sub-micrometer relativistic electron beams
Communications Physics. 2018; 1: 52 (8 pp.). https://doi.org/10.1038/s42005-018-0048-x
DORA PSI
Seniutinas G, Brasselet E, Balčytis A, David C, Juodkazis S
Diamond: a gem for micro-optics
Materials Today. 2018; 21(7): 798-799. https://doi.org/10.1016/j.mattod.2018.08.001
DORA PSI
Juranić P, Rehanek J, Arrell CA, Pradervand C, Cassar A, Calvi M, et al.
SwissFEL Aramis beamline photon diagnostics
Journal of Synchrotron Radiation. 2018; 25(4): 1238-1248. https://doi.org/10.1107/S1600577518005775
DORA PSI
Opara NL, Mohacsi I, Makita M, Castano-Diez D, Diaz A, Juranić P, et al.
Demonstration of femtosecond X-ray pump X-ray probe diffraction on protein crystals
Structural Dynamics. 2018; 5(5): 054303 (15 pp.). https://doi.org/10.1063/1.5050618
DORA PSI
Lutz-Bueno V, Arboleda C, Leu L, Blunt MJ, Busch A, Georgiadis A, et al.
Model-free classification of X-ray scattering signals applied to image segmentation
Journal of Applied Crystallography. 2018; 51(5): 1378-1386. https://doi.org/10.1107/S1600576718011032
DORA PSI
Lev LL, Maiboroda IO, Husanu M-A, Grichuk ES, Chumakov NK, Ezubchenko IS, et al.
k-space imaging of anisotropic 2D electron gas in GaN/GaAlN high-electron-mobility transistor heterostructures
Nature Communications. 2018; 9(1): 2653 (9 pp.). https://doi.org/10.1038/s41467-018-04354-x
DORA PSI
Leo N, Holenstein S, Schildknecht D, Sendetskyi O, Luetkens H, Derlet PM, et al.
Collective magnetism in an artificial 2D XY spin system
Nature Communications. 2018; 9(1): 2850 (8 pp.). https://doi.org/10.1038/s41467-018-05216-2
DORA PSI
Sloetjes SD, Digernes E, Olsen FK, Chopdekar RV, Retterer ST, Folven E, et al.
Interplay between bulk and edge-bound topological defects in a square micromagnet
Applied Physics Letters. 2018; 112(4): 042401. https://doi.org/10.1063/1.5010166
DORA PSI
Ranamukhaarachchi SA, Padeste C, Häfeli UO, Stoeber B, Cadarso VJ
Design considerations of a hollow microneedle-optofluidic biosensing platform incorporating enzyme-linked assays
Journal of Micromechanics and Microengineering. 2018; 28(2): 024002 (9 pp.). https://doi.org/10.1088/1361-6439/aa9c9c
DORA PSI
Di Giovannantonio M, Deniz O, Urgel JI, Widmer R, Dienel T, Stolz S, et al.
On-surface growth dynamics of graphene nanoribbons: the role of halogen functionalization
ACS Nano. 2018; 12(1): 74-81. https://doi.org/10.1021/acsnano.7b07077
DORA PSI
Casadei CM, Tsai C-J, Barty A, Hunter MS, Zatsepin NA, Padeste C, et al.
Resolution extension by image summing in serial femtosecond crystallography of two-dimensional membrane-protein crystals
IUCrJ. 2018; 5(1): 103-117. https://doi.org/10.1107/S2052252517017043
DORA PSI
Rösner B, Koch F, Döring F, Bosgra J, Guzenko VA, Kirk E, et al.
Exploiting atomic layer deposition for fabricating sub-10 nm X-ray lenses
Microelectronic Engineering. 2018; 191: 91-96. https://doi.org/10.1016/j.mee.2018.01.033
DORA PSI
Kirchner R, Chidambaram N, Schift H
Benchmarking surface selective vacuum ultraviolet and thermal postprocessing of thermoplastics for ultrasmooth 3-D-printed micro-optics
Optical Engineering. 2018; 57(4): 041403 (11 pp.). https://doi.org/10.1117/1.OE.57.4.041403
DORA PSI

Papers Published 2017

Schift H, Kirchner R, Chidambaram N, Altana M
Surface smoothening of the inherent roughness of micro-lenses fabricated with 2-photon lithography
In: Chon JWM, Jia B, eds. Nanophotonics Australasia 2017. Vol. 10456. Proceedings of SPIE. Bellingham, USA: SPIE; 2017. https://doi.org/10.1117/12.2283236
DORA PSI
Schift H, Kristensen A
Nanoimprint lithography
In: Bhushan B, ed. Springer handbook of nanotechnology. Berlin: Springer; 2017. https://doi.org/10.1007/978-3-662-54357-3_5
DORA PSI
Urwyler P, Schift H
Nanostructured polymers for medical applications
In: Müller B, Van de Voorde M, eds. Nanoscience and nanotechnology for human health. Weinheim: Wiley; 2017. https://doi.org/10.1002/9783527692057.ch14
DORA PSI
Garvey T, Rivkin L, Streun A, Wrulich A, Ekinci Y
A compact storage ring for the production of EUV radiation
In: 13th international topical meeting on nuclear applications of accelerators (AccApp '17). La Grange Park, USA: American Nuclear Society; 2017.
DORA PSI
Camarda M, Woerle J, Souliere V, Ferro G, Sigg H, Grossner U, et al.
Analysis of 4H-SiC MOS capacitors on macro-stepped surfaces
In: Zekentes K, Vasilevskiy KV, Frangis N, eds. Silicon carbide and related materials 2016. Vol. 897. Materials science forum. Durnten-Zurich, Switzerland: Trans Tech Publications; 2017. https://doi.org/10.4028/www.scientific.net/MSF.897.107
DORA PSI
Popescu C, Frommhold A, McClelland A, Roth J, Ekinci Y, Robinson APG
Sensitivity enhancement of the high-resolution xMT multi-trigger resist for EUV lithography
In: Panning EM, Goldberg KA, eds. Extreme Ultraviolet (EUV) Llthography VIII. Vol. 10143. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017. https://doi.org/10.1117/12.2258098
DORA PSI
Hotalen J, Murphy M, Earley W, Vockenhuber M, Ekinci Y, Freedman DA, et al.
Advanced development techniques for metal-based EUV resists
In: Goldberg KA, Panning EM, eds. Extreme Ultraviolet (EUV) lithography VIII. Vol. 10143. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017. https://doi.org/10.1117/12.2258126
DORA PSI
Mochi I, Helfenstein P, Mohacsi I, Rajendran R, Yoshitake S, Ekinci Y
RESCAN: an actinic lensless microscope for defect inspection of EUV reticles
In: Panning EM, Goldberg KA, eds. Extreme Ultraviolet (EUV) lithography VIII. Vol. 10143. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017. https://doi.org/10.1117/12.2258086
DORA PSI
Ekinci Y
Non-destructive dimensional metrology of EUV resist gratings
In: Metrology, inspection, and process control for microlithography XXXI. Vol. 10145. SPIE ADVANCED LITHOGRAPHY. ; 2017. https://doi.org/10.1117/12.2257690
DORA PSI
Kirchner R, Chidambaram N, Altana M, Schift H
How post-processing by selective thermal reflow can reduce the roughness of 3D lithography in micro-optical lenses
In: Gu B, Helvajian H, Piqué A, Dunsky CM, Liu J, eds. Laser 3D manufacturing IV. Vol. 10095. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017. https://doi.org/10.1117/12.2258090
DORA PSI
Helfenstein P, Mochi I, Rajendran R, Yoshitake S, Ekinci Y
A two-step method for fast and reliable EUV mask metrology
In: Panning EM, Goldberg KA, eds. Extreme Ultraviolet (EUV) lithography VIII. Vol. 10143. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017. https://doi.org/10.1117/12.2259961
DORA PSI
Buitrago E, Meeuwissen M, Yildirim O, Custers R, Hoefnagels R, Rispens G, et al.
State-of-the-art EUV materials and processes for the 7 nm node and beyond
In: Panning EM, Goldberg KA, eds. Extreme Ultraviolet (EUV) lithography VIII. Vol. 10143. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017. https://doi.org/10.1117/12.2260153
DORA PSI
Fallica R, Watts B, Della Giustina G, Brigo L, Brusatin G, Ekinci Y
Chemical changes in hybrid photoresists before and after exposure by in situ NEXAFS analysis
In: Hohle CK, ed. Advances in patterning materials and processes XXXIV. Vol. 10146. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017. https://doi.org/10.1117/12.2258215
DORA PSI
Yildirim O, Buitrago E, Hoefnagels R, Meeuwissen M, Wuister S, Rispens G, et al.
Improvements in resist performance towards EUV HVM
In: Panning EM, Goldberg KA, eds. Extreme Ultraviolet (EUV) lithography VIII. Vol. 10143. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017. https://doi.org/10.1117/12.2257415
DORA PSI
Tasdemir Z, Mochi I, Garrido Olvera K, Meeuwissen M, Yildirim O, Custers R, et al.
Contrast matching of line gratings obtained with NXE3XXX and EUV- interference lithography
In: Gargini PA, Naulleau PP, Ronse KG, Itani T, eds. International conference on Extreme Ultraviolet lithography 2017. Vol. 10450. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017. https://doi.org/10.1117/12.2280541
DORA PSI
Popescu C, McClelland A, Dawson G, Roth J, Kazazis D, Ekinci Y, et al.
Multi-trigger resist for electron beam lithography
In: Behringer UFW, Finders J, eds. 33rd European mask and lithography conference. Vol. 10446. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017. https://doi.org/10.1117/12.2279767
DORA PSI
Mochi I, Helfenstein P, Rajeev R, Fernandez S, Kazazis D, Yoshitake S, et al.
Actinic inspection of EUV reticles with arbitrary pattern design
In: Gargini PA, Naulleau PP, Ronse KG, Itani T, eds. International conference on Extreme Ultraviolet lithography 2017. Vol. 10450. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017. https://doi.org/10.1117/12.2280528
DORA PSI
Schift H, Chidambaram N, Altana M, Kirchner R
Selective surface smoothening of 3D micro-optical elements
In: Bencher C, ed. Emerging patterning technologies. Vol. 10144. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017. https://doi.org/10.1117/12.2256358
DORA PSI
Haitjema J, Zhang Y, Vockenhuber M, Kazazis D, Ekinci Y, Brouwer AM
Extreme ultraviolet patterning of tin-oxo cages
In: Panning EM, Goldberg KA, eds. Extreme Ultraviolet (EUV) lithography VIII. Vol. 10143. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017. https://doi.org/10.1117/12.2257911
DORA PSI
Nagahara S, Carcasi M, Shiraishi G, Nakagawa H, Dei S, Shiozawa T, et al.
Photosensitized Chemically Amplified Resist^TM (PSCAR^TM) 2.0 for high throughput and high resolution EUV lithography: dual photosensitization of acid generation and quencher decomposition by flood exposure
In: Hohle CK, ed. Advances in patterning materials and processes XXXIV. Vol. 10146. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017. https://doi.org/10.1117/12.2258217
DORA PSI
Fallica R, Haitjema J, Wu L, Castellanos S, Brouwer F, Ekinci Y
Absorption coefficient and exposure kinetics of photoresists at EUV
In: Panning EM, Goldberg KA, eds. Extreme Ultraviolet (EUV) lithography VIII. Vol. 10143. Proceedings of SPIE. Bellingham, WA, USA: SPIE; 2017. https://doi.org/10.1117/12.2257240
DORA PSI
Rösner B, Schmidt U, Fink RH
In-operando studies of Ag-TCNQ nanocrystals using Raman and soft x-ray microspectroscopy
In: Rau C, ed. International X-ray microscopy conference (XRM 2016). Vol. 849. Journal of physics: conference series. sine loco: IOP Publishing; 2017. https://doi.org/10.1088/1742-6596/849/1/012016
DORA PSI
Greving I, Ogurreck M, Marschall F, Last A, Wilde F, Dose T, et al.
Nanotomography endstation at the P05 beamline: status and perspectives
In: Rau C, ed. X-Ray microscopy conference 2016 (XRM 2016). Vol. 849. Journal of physics: conference series. sine loco: IOP Publishing; 2017. https://doi.org/10.1088/1742-6596/849/1/012056
DORA PSI
Rajendran R, Mochi I, Helfenstein P, Mohacsi I, Redford S, Mozzanica A, et al.
Towards a stand-alone high-throughput EUV actinic photomask inspection tool: RESCAN
In: Sanchez MI, Ukraintsev VA, eds. Metrology, inspection, and process control for microlithography XXXI. Vol. 10145. Proceedings of SPIE. Bellingham, Washington: SPIE; 2017. https://doi.org/10.1117/12.2258379
DORA PSI
Karim W, Spreafico C, Kleibert A, Gobrecht J, VandeVondele J, Ekinci Y, et al.
Catalyst support effects on hydrogen spillover
Nature. 2017; 541(7635): 68-71. https://doi.org/10.1038/nature20782
DORA PSI
Alekhin MS, Patton G, Dujardin C, Douissard P-A, Lebugle M, Novotny L, et al.
Stimulated scintillation emission depletion X-ray imaging
Optics Express. 2017; 25(2): 654-669. https://doi.org/10.1364/OE.25.000654
DORA PSI
Piquero-Zulaica I, Nowakowska S, Ortega JE, Stöhr M, Gade LH, Jung TA, et al.
Temperature dependence of the partially localized state in a 2D molecular nanoporous network
Applied Surface Science. 2017; 391: 39-43. https://doi.org/10.1016/j.apsusc.2016.02.227
DORA PSI
Privitera SMS, Litrico G, Camarda M, Piluso N, La Via F
Electrical properties of extended defects in 4H-SiC investigated by photoinduced current measurements
Applied Physics Express. 2017; 10(3): 036601 (4 pp.). https://doi.org/10.7567/APEX.10.036601
DORA PSI
Oezelt H, Kirk E, Wohlhüter P, Müller E, Heyderman LJ, Kovacs A, et al.
Vortex motion in amorphous ferrimagnetic thin film elements
AIP Advances. 2017; 7(5): 056001 (5 pp.). https://doi.org/10.1063/1.4973295
DORA PSI
Warnicke P, Wohlhüter P, Suszka AK, Stevenson SE, Heyderman LJ, Raabe J
Tunable magnetic vortex resonance in a potential well
Physical Review B. 2017; 96(17): 174402 (5 pp.). https://doi.org/10.1103/PhysRevB.96.174402
DORA PSI
Wäckerlin A, Fatayer S, Nijs T, Nowakowska S, Mousavi SF, Popova O, et al.
Molecular chessboard assemblies sorted by site-specific interactions of out-of-plane d-orbitals with a semimetal template
Nano Letters. 2017; 17(3): 1956-1962. https://doi.org/10.1021/acs.nanolett.6b05344
DORA PSI
Kaspar C, Butschke J, Irmscher M, Martens S, Sailer H, Kirchner R, et al.
Adjustable sidewall slopes by electron-beam exposure layout
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 2017; 35(6): 06G501 (6 pp.). https://doi.org/10.1116/1.4993724
DORA PSI
Romano L, Vila-Comamala J, Schift H, Stampanoni M, Jefimovs K
Hot embossing of Au- and Pb-based alloys for x-ray grating fabrication
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 2017; 35(6): 06G302 (9 pp.). https://doi.org/10.1116/1.4991807
DORA PSI
Fallica R, Kazazis D, Kirchner R, Voigt A, Mochi I, Schift H, et al.
Lithographic performance of ZEP520A and mr-PosEBR resists exposed by electron beam and extreme ultraviolet lithography
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 2017; 35(6): 061603 (7 pp.). https://doi.org/10.1116/1.5003476
DORA PSI
Rösner B, Döring F, Ribič PR, Gauthier D, Principi E, Masciovecchio C, et al.
High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development
Optics Express. 2017; 25(24): 30686-30695. https://doi.org/10.1364/OE.25.030686
DORA PSI
Makita M, Karvinen P, Guzenko VA, Kujala N, Vagovic P, David C
Fabrication of diamond diffraction gratings for experiments with intense hard x-rays
Microelectronic Engineering. 2017; 176: 75-78. https://doi.org/10.1016/j.mee.2017.02.002
DORA PSI
Marschall F, Vila-Comamala J, Guzenko VA, David C
Systematic efficiency study of line-doubled zone plates
Microelectronic Engineering. 2017; 177: 25-29. https://doi.org/10.1016/j.mee.2017.01.017
DORA PSI
Roedig P, Ginn HM, Pakendorf T, Sutton G, Harlos K, Walter TS, et al.
High-speed fixed-target serial virus crystallography
Nature Methods. 2017; 14(8): 805-810. https://doi.org/10.1038/nmeth.4335
DORA PSI
Lebugle M, Seniutinas G, Marschall F, Guzenko VA, Grolimund D, David C
Tunable kinoform x-ray beam splitter
Optics Letters. 2017; 42(21): 4327-4330. https://doi.org/10.1364/OL.42.004327
DORA PSI
Gliga S, Hrkac G, Donnelly C, Büchi J, Kleibert A, Cui J, et al.
Emergent dynamic chirality in a thermally driven artificial spin ratchet
Nature Materials. 2017; 16(11): 1106-1111. https://doi.org/10.1038/NMAT5007
DORA PSI
Tseng LT, Suter A, Wang YR, Xiang FX, Bian P, Ding X, et al.
Intrinsic and spatially nonuniform ferromagnetism in Co-doped ZnO films
Physical Review B. 2017; 96(10): 104423 (10 pp.). https://doi.org/10.1103/PhysRevB.96.104423
DORA PSI
Müller V, Shao F, Baljozovic M, Moradi M, Zhang Y, Jung T, et al.
Structural characterization of a covalent monolayer sheet obtained by two-dimensional polymerization at an air/water interface
Angewandte Chemie International Edition. 2017; 56(48): 15262-15266. https://doi.org/10.1002/anie.201707140
DORA PSI
Moradi M, Tulli LG, Nowakowski J, Baljozovic M, Jung TA, Shahgaldian P
Two-dimensional calix[4]arene-based metal-organic coordination networks of tunable crystallinity
Angewandte Chemie International Edition. 2017; 56(46): 14395-14399. https://doi.org/10.1002/anie.201703825
DORA PSI
Liu B, Piamonteze C, Delgado-Jaime MU, Wang R-P, Heidler J, Dreiser J, et al.
Sum rule distortions in fluorescence-yield x-ray magnetic circular dichroism
Physical Review B. 2017; 96(5): 054446 (8 pp.). https://doi.org/10.1103/PhysRevB.96.054446
DORA PSI
Finizio S, Wintz S, Kirk E, Suszka AK, Gliga S, Wohlhüter P, et al.
Control of the gyration dynamics of magnetic vortices by the magnetoelastic effect
Physical Review B. 2017; 96(5): 054438 (6 pp.). https://doi.org/10.1103/PhysRevB.96.054438
DORA PSI
Lebugle M, Liebi M, Wakonig K, Guzenko VA, Holler M, Menzel A, et al.
High-acceptance versatile microfocus module based on elliptical Fresnel zone plates for small-angle X-ray scattering
Optics Express. 2017; 25(18): 21145-21158. https://doi.org/10.1364/OE.25.021145
DORA PSI
Farhan A, Derlet PM, Anghinolfi L, Kleibert A, Heyderman LJ
Magnetic charge and moment dynamics in artificial kagome spin ice
Physical Review B. 2017; 96(6): 064409 (9 pp.). https://doi.org/10.1103/PhysRevB.96.064409
DORA PSI
Spreafico C, Karim W, Ekinci Y, van Bokhoven JA, VandeVondele J
Hydrogen adsorption on nanosized platinum and dynamics of spillover onto alumina and titania
Journal of Physical Chemistry C. 2017; 121(33): 17862-17872. https://doi.org/10.1021/acs.jpcc.7b03733
DORA PSI
Marschall F, McNally D, Guzenko VA, Rösner B, Dantz M, Lu X, et al.
Zone plates as imaging analyzers for resonant inelastic x-ray scattering
Optics Express. 2017; 25(14): 15624-15634. https://doi.org/10.1364/OE.25.015624
DORA PSI
Bingham NS, Suszka AK, Vaz CAF, Kim H, Heyderman LJ
Interfacial room temperature magnetism and enhanced magnetocaloric effect in strained La_0.66Ca_0.34MnO₃/BaTiO₃ heterostructures
Physical Review B. 2017; 96(2): 024419 (6 pp.). https://doi.org/10.1103/PhysRevB.96.024419
DORA PSI
Wang X-Y, Dienel T, Di Giovannantonio M, Borin Barin G, Kharche N, Deniz O, et al.
Heteroatom-doped perihexacene from a double helicene precursor: on-surface synthesis and properties
Journal of the American Chemical Society. 2017; 139(13): 4671-4674. https://doi.org/10.1021/jacs.7b02258
DORA PSI
Gerber S, Yang S-L, Zhu D, Soifer H, Sobota JA, Rebec S, et al.
Femtosecond electron-phonon lock-in by photoemission and x-ray free-electron laser
Science. 2017; 357(6346): 71-75. https://doi.org/10.1126/science.aak9946
DORA PSI
Windsor YW, Piamonteze C, Ramakrishnan M, Scaramucci A, Rettig L, Huever JA, et al.
Magnetic properties of strained multiferroic CoCr₂O₄: a soft x-ray study
Physical Review B. 2017; 95(22): 224413 (15 pp.). https://doi.org/10.1103/PhysRevB.95.224413
DORA PSI
Fallica R, Kirchner R, Schift H, Ekinci Y
High-resolution grayscale patterning using extreme ultraviolet interference lithography
Microelectronic Engineering. 2017; 177: 1-5. https://doi.org/10.1016/j.mee.2017.01.007
DORA PSI
Virganavičius D, Juodėnas M, Tamulevičius T, Schift H, Tamulevičius S
Investigation of transient dynamics of capillary assisted particle assembly yield
Applied Surface Science. 2017; 406: 136-143. https://doi.org/10.1016/j.apsusc.2017.02.100
DORA PSI
Chidambaram N, Kirchner R, Fallica R, Yu L, Altana M, Schift H
Selective surface smoothening of polymer microlenses by depth confined softening
Advanced Materials Technologies. 2017; 2(5): 1700018 (10 pp.). https://doi.org/10.1002/admt.201700018
DORA PSI
Opara N, Martiel I, Arnold SA, Braun T, Stahlberg H, Makita M, et al.
Direct protein crystallization on ultrathin membranes for diffraction measurements at X-ray free-electron lasers
Journal of Applied Crystallography. 2017; 50(3): 909-918. https://doi.org/10.1107/S1600576717005799
DORA PSI
Jöhr R, Hinaut A, Pawlak R, Ząjac Ł, Olszowski P, Such B, et al.
Thermally induced anchoring of a zinc-carboxyphenylporphyrin on rutile TiO₂ (110)
Journal of Chemical Physics. 2017; 146(18): 184704 (6 pp.). https://doi.org/10.1063/1.4982936
DORA PSI
Haase J, Bagiante S, Sigg H, van Bokhoven JA
Surface enhanced infrared absorption of chemisorbed carbon monoxide using plasmonic nanoantennas
Optics Letters. 2017; 42(10): 1931-1934. https://doi.org/10.1364/OL.42.001931
DORA PSI
Woerle J, Camarda M, Schneider CW, Sigg H, Grossner U, Gobrecht J
Analysis of thin thermal oxides on (0001) sic epitaxial layers
In: Zekentes K, Vasilevskiy KV, Frangis N, eds. Silicon carbide and related materials 2016. Vol. 897. Materials science forum. Switzerland: Trans Tech Publications; 2017. https://doi.org/10.4028/www.scientific.net/MSF.897.119
DORA PSI
Müller V, Hungerland T, Baljozovic M, Jung T, Spencer ND, Eghlidi H, et al.
Ink-free reversible optical writing in monolayers by polymerization of a trifunctional monomer: toward rewritable “molecular paper”
Advanced Materials. 2017; 29(27): 1701220 (7 pp.). https://doi.org/10.1002/adma.201701220
DORA PSI
Karim W, Tschupp SA, Herranz J, Schmidt TJ, Ekinci Y, van Bokhoven JA
State-of-the-art nanofabrication in catalysis
Chimia. 2017; 71(4): 160-169. https://doi.org/10.2533/chimia.2017.160
DORA PSI
Shimamoto K, Mukherjee S, Bingham NS, Suszka AK, Lippert T, Niedermayer C, et al.
Single-axis-dependent structural and multiferroic properties of orthorhombic RMnO₃(R = Gd-Lu)
Physical Review B. 2017; 95(18): 184105 (9 pp.). https://doi.org/10.1103/PhysRevB.95.184105
DORA PSI
Dübner M, Cadarso VJ, Gevrek TN, Sanyal A, Spencer ND, Padeste C
Reversible light-switching of enzymatic activity on orthogonally functionalized polymer brushes
ACS Applied Materials and Interfaces. 2017; 9(11): 9245-9249. https://doi.org/10.1021/acsami.7b01154
DORA PSI
Woerle J, Bisti F, Husanu M-A, Strocov VN, Schneider CW, Sigg H, et al.
Electronic band structure of the buried SiO₂/SiC interface investigated by soft x-ray ARPES
Applied Physics Letters. 2017; 110(13): 132101 (5 pp.). https://doi.org/10.1063/1.4979102
DORA PSI
Monshipouri M, Abdi Y, Darbari S, Tsujino S
Multiphoton photoemission of gold nanopillars fabricated by carbon nanotube templates
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 2017; 35(2): 02C110 (5 pp.). https://doi.org/10.1116/1.4978655
DORA PSI
Zabel T, Geiger R, Marin E, Müller E, Diaz A, Bonzon C, et al.
Top-down method to introduce ultra-high elastic strain
Journal of Materials Research. 2017; 32(4): 726-736. https://doi.org/10.1557/jmr.2017.31
DORA PSI
Holler M, Guizar-Sicairos M, Tsai EHR, Dinapoli R, Müller E, Bunk O, et al.
High-resolution non-destructive three-dimensional imaging of integrated circuits
Nature. 2017; 543(7645): 402-406. https://doi.org/10.1038/nature21698
DORA PSI
Mohacsi I, Vartiainen I, Rösner B, Guizar-Sicairos M, Guzenko VA, McNulty I, et al.
Interlaced zone plate optics for hard X-ray imaging in the 10 nm range
Scientific Reports. 2017; 7: 43624 (10 pp.). https://doi.org/10.1038/srep43624
DORA PSI
Romano L, Vila-Comamala J, Jefimovs K, Stampanoni M
Effect of isopropanol on gold assisted chemical etching of silicon microstructures
Microelectronic Engineering. 2017; 177: 59-65. https://doi.org/10.1016/j.mee.2017.02.008
DORA PSI
Romano L, Vila-Comamala J, Kagias M, Vogelsang K, Schift H, Stampanoni M, et al.
High aspect ratio metal microcasting by hot embossing for X-ray optics fabrication
Microelectronic Engineering. 2017; 176: 6-10. https://doi.org/10.1016/j.mee.2016.12.032
DORA PSI
Külah E, Marot L, Steiner R, Romanyuk A, Jung TA, Wäckerlin A, et al.
Surface chemistry of rare-earth oxide surfaces at ambient conditions: reactions with water and hydrocarbons
Scientific Reports. 2017; 7: 43369 (10 pp.). https://doi.org/10.1038/srep43369
DORA PSI
Ribič PR, Rösner B, Gauthier D, Allaria E, Döring F, Foglia L, et al.
Extreme-ultraviolet vortices from a free-electron laser
Physical Review X. 2017; 7(3): 031036 (9 pp.). https://doi.org/10.1103/PhysRevX.7.031036
DORA PSI
Pedrini B, Menzel A, Guzenko VA, David C, Abela R, Gutt C
Model-independent particle species disentanglement by X-ray cross-correlation scattering
Scientific Reports. 2017; 7: 45618 (12 pp.). https://doi.org/10.1038/srep45618
DORA PSI
Seniutinas G, Balčytis A, Reklaitis I, Chen F, Davis J, David C, et al.
Tipping solutions: emerging 3D nano-fabrication/-imaging technologies
Nanophotonics. 2017; 6(5): 923-941. https://doi.org/10.1515/nanoph-2017-0008
DORA PSI
Marschall F, Yin Z, Rehanek J, Beye M, Döring F, Kubiček K, et al.
Transmission zone plates as analyzers for efficient parallel 2D RIXS-mapping
Scientific Reports. 2017; 7: 8849 (7 pp.). https://doi.org/10.1038/s41598-017-09052-0
DORA PSI
Zdora M-C, Vila-Comamala J, Schulz G, Khimchenko A, Hipp A, Cook AC, et al.
X-ray phase microtomography with a single grating for high-throughput investigations of biological tissue
Biomedical Optics Express. 2017; 8(2): 1257-1270. https://doi.org/10.1364/BOE.8.001257
DORA PSI
Krieger JA, Chang C-Z, Husanu M-A, Sostina D, Ernst A, Otrokov MM, et al.
Spectroscopic perspective on the interplay between electronic and magnetic properties of magnetically doped topological insulators
Physical Review B. 2017; 96(18): 184402 (11 pp.). https://doi.org/10.1103/PhysRevB.96.184402
DORA PSI
Buzzi M, Makita M, Howald L, Kleibert A, Vodungbo B, Maldonado P, et al.
Single-shot monitoring of ultrafast processes via x-ray streaking at a free electron laser
Scientific Reports. 2017; 7: 7253 (8 pp.). https://doi.org/10.1038/s41598-017-07069-z
DORA PSI
Cadarso VJ, Chidambaram N, Jacot-Descombes L, Schift H
High-aspect-ratio nanoimprint process chains
Microsystems and Nanoengineering. 2017; 3: 17017 (12 pp.). https://doi.org/10.1038/micronano.2017.17
DORA PSI
Kayser Y, David C, Flechsig U, Krempasky J, Schlott V, Abela R
X-ray grating interferometer for in situ and at-wavelength wavefront metrology
Journal of Synchrotron Radiation. 2017; 24(1): 150-162. https://doi.org/10.1107/S1600577516017562
DORA PSI
van Schoot J, Schift H
Next-generation lithography - an outlook on EUV projection and nanoimprint
Advanced Optical Technologies. 2017; 6(3-4): 159-162. https://doi.org/10.1515/aot-2017-0040
DORA PSI
Rehanek J, Makita M, Wiegand P, Heimgartner P, Pradervand C, Seniutinas G, et al.
The hard X-ray Photon Single-Shot Spectrometer of SwissFEL - Initial characterization
Journal of Instrumentation. 2017; 12(5): P05024 (13 pp.). https://doi.org/10.1088/1748-0221/12/05/P05024
DORA PSI
Girovsky J, Nowakowski J, Ali ME, Baljozovic M, Rossmann HR, Nijs T, et al.
Long-range ferrimagnetic order in a two-dimensional supramolecular Kondo lattice
Nature Communications. 2017; 8: 15388 (8 pp.). https://doi.org/10.1038/ncomms15388
DORA PSI
Dübner M, Naoum M-E, Spencer ND, Padeste C
From pH- to light-response: postpolymerization modification of polymer brushes grafted onto microporous polymeric membranes
ACS Omega. 2017; 2(2): 455-461. https://doi.org/10.1021/acsomega.6b00394
DORA PSI
Szmyt W, Vogel S, Diaz A, Holler M, Gobrecht J, Calame M, et al.
Protective effect of ultrathin alumina film against diffusion of iron into carbon fiber during growth of carbon nanotubes for hierarchical composites investigated by ptychographic X-ray computed tomography
Carbon. 2017; 115: 347-362. https://doi.org/10.1016/j.carbon.2016.12.085
DORA PSI
Muntwiler M, Zhang J, Stania R, Matsui F, Oberta P, Flechsig U, et al.
Surface science at the PEARL beamline of the Swiss Light Source
Journal of Synchrotron Radiation. 2017; 24(1): 354-366. https://doi.org/10.1107/S1600577516018646
DORA PSI
Mojarad N, Pfohl T, Ekinci Y
Soft electrostatic trapping in nanofluidics
Microsystems and Nanoengineering. 2017; 3. https://doi.org/10.1038/micronano.2017.51
DORA PSI
Haitjema J, Zhang Y, Vockenhuber M, Kazazis D, Ekinci Y, Brouwer AM
Extreme ultraviolet patterning of tin-oxo cages
Journal of Micro/Nanolithography, MEMS, and MOEMS. 2017; 16(3): 033510 (7 pp.). https://doi.org/10.1117/1.JMM.16.3.033510
DORA PSI
Helfenstein P, Mochi I, Rajeev R, Fernandez S, Ekinci Y
Coherent diffractive imaging methods for semiconductor manufacturing
Advanced Optical Technologies. 2017; 6(6): 439-448. https://doi.org/10.1515/aot-2017-0052
DORA PSI
Fan D, Sigg H, Spolenak R, Ekinci Y
Strain and thermal conductivity in ultrathin suspended silicon nanowires
Physical Review B. 2017; 96(11): 115307. https://doi.org/10.1103/PhysRevB.96.115307
DORA PSI
Mochi I, Helfenstein P, Mohacsi I, Rajeev R, Kazazis D, Yoshitake S, et al.
RESCAN: An actinic lensless microscope for defect inspection of EUV reticles
2017. https://doi.org/10.1117/1.JMM.16.4.041003
DORA PSI
Gerspach MA, Mojarad N, Sharma D, Pfohl T, Ekinci Y
Nanofluidic lab-on-a-chip trapping devices for screening electrostatics in concentration gradients
Microelectronic Engineering. 2017; 175: 17-22. https://doi.org/10.1016/j.mee.2016.12.017
DORA PSI
Sharma D, Gerspach MA, Pfohl T, Lim RYH, Ekinci Y
Single positively charged particle trapping in nanofluidic systems
Microelectronic Engineering. 2017; 175: 43-49. https://doi.org/10.1016/j.mee.2017.01.001
DORA PSI

Earlier Publications

Papers published from 2011 to 2016
List of Publications 2007 - 2011 (PDF)

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Laboratory for Micro-
and Nanotechnology
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Dr. Yasin Ekinci

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