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Laboratory for X-ray Nanoscience and Technologies (LXN)

  • About LXN
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    • X-ray Nano-Optics
      • X-ray Optics for Imaging and Spectroscopy
        • Fresnel Zone Plate for X-ray Microscopy
        • Blazed X-ray Optics
        • Zernike X-ray Phase Contrast Microscopy
        • Fresnel Zone Plates for RIXS
        • Refractive Lenses by 2 Photon 3D Lithography
      • Wavefront Metrology and Manipulation
        • Vortex Fresnel Zone Plates
        • Grating-based Wavefront Metrology
      • X-ray Optics for XFELs
        • Diamond Fresnel Zone Plates
        • Beam Splitter Gratings for Spectral Monitoring
        • A Delay Line for Ultrafast Pump-Probe Experiments
        • X-ray Streaking for Ultrafast Processes
    • Molecular Nanoscience
      • On-surface Chemistry
      • Scanning Probe Transport
      • Spins in Molecular Monolayers
      • SiC: Surfaces and Interfaces
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        • Imaging quantum many-body states
        • Nonlinear magnonics
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        • Strained Ge laser (former research activity of H. Sigg & collaborators)
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List of Publications of the LXN

2023

  • Alyabyeva N, Ding J, Sauty M, Woerle J, Jousseaume Y, Ferro G, et al.
    Nanoscale mapping of sub-gap electroluminescence from step-bunched, oxidized 4H-SiC surfaces
    Physica Status Solidi B: Basic Research. 2023; 260(5): 2200356 (6 pp.). https://doi.org/10.1002/pssb.202200356
    DORA PSI
  • Beck A, Kazazis D, Ekinci Y, Li X, Müller Gubler EA, Kleibert A, et al.
    The extent of platinum-induced hydrogen spillover on cerium dioxide
    ACS Nano. 2023; 17(2): 1091-1099. https://doi.org/10.1021/acsnano.2c08152
    DORA PSI
  • Bellucci V, Zdora M-C, Mikeš L, Birnšteinová Š, Oberta P, Romagnoni M, et al.
    Hard X-ray stereographic microscopy for single-shot differential phase imaging
    Optics Express. 2023; 31(11): 18399-18406. https://doi.org/10.1364/OE.492137
    DORA PSI
  • Carulla M, Centis Vignali M, Barten R, Baruffaldi F, Bergamaschi A, Borghi G, et al.
    Study of the internal quantum efficiency of FBK sensors with optimized entrance windows
    Journal of Instrumentation. 2023; 18: C01073 (11 pp.). https://doi.org/10.1088/1748-0221/18/01/C01073
    DORA PSI
  • Celestre R, Roth T, Detlefs C, Qi P, Cammarata M, Sanchez del Rio M, et al.
    Tilting refractive x-ray lenses for fine-tuning of their focal length
    Optics Express. 2023; 31(5): 7617-7631. https://doi.org/10.1364/OE.481678
    DORA PSI
  • Constantinou P, Stock TJZ, Crane E, Kölker A, van Loon M, Li J, et al.
    Momentum-space imaging of ultra-thin electron liquids in δ-doped silicon
    Advanced Science. 2023. https://doi.org/10.1002/advs.202302101
    DORA PSI
  • Cuxart MG, Perilli D, Tömekce S, Deyerling J, Haag F, Muntwiler M, et al.
    Spatial segregation of substitutional B atoms in graphene patterned by the moiré superlattice on Ir(111)
    Carbon. 2023; 201: 881-890. https://doi.org/10.1016/j.carbon.2022.09.087
    DORA PSI
  • D'Anna N, Ferreira Sanchez D, Matmon G, Bragg J, Constantinou PC, Stock TJZ, et al.
    Non-destructive X-Ray imaging of patterned Delta-Layer devices in silicon
    Advanced Electronic Materials. 2023; 2023: 202201212 (8 pp.). https://doi.org/10.1002/aelm.202201212
    DORA PSI
  • Develioglu A, Allenet TP, Vockenhuber M, van Lent-Protasova L, Mochi I, Ekinci Y, et al.
    The EUV lithography resist screening activities in H2-2022
    In: Guerrero D, Amblard GR, eds. Advances in patterning materials and processes XL. Vol. 12498. Proceedings of SPIE. Bellingham: SPIE; 2023:1249805 (9 pp.). https://doi.org/10.1117/12.2660859
    DORA PSI
  • Ekahana SA, Winata GI, Soh Y, Tamai A, Milan R, Aeppli G, et al.
    Transfer learning application of self-supervised learning in ARPES
    Machine Learning: Science and Technology. 2023; 4(3): 035021 (9 pp.). https://doi.org/10.1088/2632-2153/aced7d
    DORA PSI
  • Evrard Q, Sadegh N, Hsu CC, Mahne N, Giglia A, Nannarone S, et al.
    Influence of the anion in tin-based EUV photoresists properties
    In: Guerrero D, Amblard GR, eds. Advances in patterning materials and processes XL. Vol. 12498. Proceedings of SPIE. Bellingham: SPIE; 2023:124980Z (6 pp.). https://doi.org/10.1117/12.2658498
    DORA PSI
  • Flenner S, Hagemann J, Wittwer F, Longo E, Kubec A, Rothkirch A, et al.
    Hard X-ray full-field nanoimaging using a direct photon-counting detector
    Journal of Synchrotron Radiation. 2023; 30: 390-399. https://doi.org/10.1107/S1600577522012103
    DORA PSI
  • Gleißner R, Chung S, Semione GDL, Jacobse L, Wagstaffe M, Tober S, et al.
    Role of oxidation-reduction dynamics in the application of Cu/ZnO-based catalysts
    ACS Applied Nano Materials. 2023; 6(9): 8004-8016. https://doi.org/10.1021/acsanm.3c01306
    DORA PSI
  • Jaiswal S, Vishwakarma J, Bhatt S, Karak S, Bharti P, Dhand C, et al.
    Layered titanium carbide-mediated fast shape switching and excellent thermal and electrical transport in shape-memory-polymer composites for smart technologies: MAX versus MXene
    Advanced Engineering Materials. 2023. https://doi.org/10.1002/adem.202300233
    DORA PSI
  • Jung TA
    molQueST conference, August 21st to 25th 2022, Congressi Stefano Franscini (CSF) Conference Center, Monte Verità, Ascona, Switzerland
    Chimia. 2023; 77(6): 448-449. https://doi.org/10.2533/chimia.2023.448
    DORA PSI
  • Karadan P, Kumar A
    One-dimensional Si nanostructure-based hybrid systems: surface-enhanced Raman spectroscopy and photodetector applications
    In: Kumar A, Aswal DK, Joshi N, eds. 1D semiconducting hybrid nanostructures. Synthesis and applications in gas sensing and optoelectronics. Weinheim: Wiley‐VCH GmbH; 2023:185-203. https://doi.org/10.1002/9783527837649
    DORA PSI
  • Krempaský J, Vonka J, Pedrini B, Steppke A, Flechsig U, Follath R, et al.
    SwissFEL KB-optics at-wavelength wavefront characterisation
    In: Tschentscher T, Patthey L, Tiedtke K, Zangrando M, eds. Proceedings of X-Ray free-electron lasers: advances in source development and instrumentation VI. Vol. 12581. Proceedings of SPIE. Bellingham: SPIE; 2023:125810A (8 pp.). https://doi.org/10.1117/12.2665587
    DORA PSI
  • Le Guyader L, Eschenlohr A, Beye M, Schlotter W, Döring F, Carinan C, et al.
    Photon-shot-noise-limited transient absorption soft X-ray spectroscopy at the European XFEL
    Journal of Synchrotron Radiation. 2023; 30(2): 284-300. https://doi.org/10.1107/S1600577523000619
    DORA PSI
  • Leonarski F, Brückner M, Lopez-Cuenca C, Mozzanica A, Stadler H-C, Matěj Z, et al.
    Jungfraujoch: hardware-accelerated data-acquisition system for kilohertz pixel-array X-ray detectors
    Journal of Synchrotron Radiation. 2023; 30: 227-234. https://doi.org/10.1107/S1600577522010268
    DORA PSI
  • Lewis SM, Alty HR, Vockenhuber M, DeRose GA, Kazazis D, Timco GA, et al.
    Enhancing the sensitivity of a high resolution negative-tone metal organic photoresist for extreme ultra violet lithography
    In: Guerrero D, Amblard GR, eds. Advances in patterning materials and processes XL. Vol. 12498. Proceedings of SPIE. Bellingham: SPIE; 2023:124980X (8 pp.). https://doi.org/10.1117/12.2658324
    DORA PSI
  • Lojewski T, Elhanoty MF, Le Guyader L, Grånäs O, Agarwal N, Boeglin C, et al.
    The interplay of local electron correlations and ultrafast spin dynamics in fcc Ni
    Materials Research Letters. 2023; 11(8): 655-661. https://doi.org/10.1080/21663831.2023.2210606
    DORA PSI
  • Manzanillas L, Aplin S, Balerna A, Bell P, Casas J, Cascella M, et al.
    Development of multi-element monolithic germanium detectors for X-ray detection at synchrotron facilities
    Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2023; 1047: 167904 (5 pp.). https://doi.org/10.1016/j.nima.2022.167904
    DORA PSI
  • Minissale M, Salomon E, Pappalardo F, Martin C, Muntwiler M, Angot T, et al.
    The renaissance and golden age of epitaxial dry germanene
    Crystals. 2023; 13(2): 221 (14 pp.). https://doi.org/10.3390/cryst13020221
    DORA PSI
  • Moustakas K, Gogolou V, Noulis T, Tassis D, Siskos S
    A CMOS threshold voltage monitoring sensor
    In: 2023 12th international conference on modern circuits and systems technologies (MOCAST 2023). International conference on modern circuits and systems technologies (MOCAST). Piscataway, NJ: IEEE; 2023:23454047 (4 pp.). https://doi.org/10.1109/MOCAST57943.2023.10176818
    DORA PSI
  • Orsini F, Aplin S, Balerna A, Bell P, Casas J, Cascella M, et al.
    XAFS-DET: a new high throughout X-ray spectroscopy detector system developed for synchrotron applications
    Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2023; 1045: 167600 (5 pp.). https://doi.org/10.1016/j.nima.2022.167600
    DORA PSI
  • Polikarpov M, Vila-Comamala J, Wang Z, Pereira A, van Gogh S, Gasser C, et al.
    Towards virtual histology with X-ray grating interferometry
    Scientific Reports. 2023; 13(1): 9049 (11 pp.). https://doi.org/10.1038/s41598-023-35854-6
    DORA PSI
  • Reiche S, Bacellar C, Bougiatioti P, Cirelli C, Dijkstal P, Ferrari E, et al.
    Frequency and spatially chirped free-electron laser pulses
    Physical Review Research. 2023; 5(2): L022009 (7 pp.). https://doi.org/10.1103/PhysRevResearch.5.L022009
    DORA PSI
  • Reuss T, Nair Lalithambika SS, David C, Döring F, Jooss C, Risch M, et al.
    Advancements in liquid jet technology and X-ray spectroscopy for understanding energy conversion materials during operation
    Accounts of Chemical Research. 2023; 56(3): 203-214. https://doi.org/10.1021/acs.accounts.2c00525
    DORA PSI
  • Sagehashi R, Lee WC, Liu F, Popov AA, Muntwiler M, Delley B, et al.
    Inferring the Dy-N axis orientation in adsorbed DySc2N@C80 endofullerenes by linearly polarized x-ray absorption spectroscopy
    Physical Review Materials. 2023; 7(8): 086001 (6 pp.). https://doi.org/10.1103/PhysRevMaterials.7.086001
    DORA PSI
  • Sahlin J, Wu C, Buscemi A, Schärer C, Nazemi SA, Rejaul SK, et al.
    Nanobiocatalysts with inbuilt cofactor recycling for oxidoreductase catalysis in organic solvents
    Nanoscale Advances. 2023; 5(18): 5036-5044. https://doi.org/10.1039/d3na00413a
    DORA PSI
  • Samadi N, Vila-Comamala J, Shi X, Sanli UT, David C, Stampanoni M, et al.
    Refractive axicon for X-ray microscopy applications: design, optimization, and experiment
    Optics Express. 2023; 31(2): 2977-2988. https://doi.org/10.1364/OE.478114
    DORA PSI
  • Sanli UT, Rodgers G, Zdora M-C, Qi P, Garrevoet J, Falch KV, et al.
    Apochromatic X-ray focusing
    Light: Science & Applications. 2023; 12(1): 107 (8 pp.). https://doi.org/10.1038/s41377-023-01157-8
    DORA PSI
  • Schreiner S, Rauch C, Akstaller B, Bleuel P, Fröjdh E, Martynenko AS, et al.
    Electromagnetic pulse protective shielding for digital x-ray detectors
    Review of Scientific Instruments. 2023; 94(7): 075106 (8 pp.). https://doi.org/10.1063/5.0160120
    DORA PSI
  • Shen T, Ansuinelli P, Mochi I, Ekinci Y
    EUV grazing-incidence lensless imaging wafer metrology
    In: Robinson JC, Sendelbach MJ, eds. Metrology, inspection, and process control XXXVII. Vol. 12496. Proceedings of SPIE. Bellingham: SPIE; 2023:124960Z (8 pp.). https://doi.org/10.1117/12.2658436
    DORA PSI
  • Strocov VN, Lev LL, Alarab F, Constantinou P, Wang X, Schmitt T, et al.
    High-energy photoemission final states beyond the free-electron approximation
    Nature Communications. 2023; 14: 4827 (11 pp.). https://doi.org/10.1038/s41467-023-40432-5
    DORA PSI
  • Tseng LT, Karadan P, Kazazis D, Constantinou PC, Stock TJZ, Curson NJ, et al.
    Resistless EUV lithography: photon-induced oxide patterning on silicon
    Science Advances. 2023; 9(16): eadf5997 (10 pp.). https://doi.org/10.1126/sciadv.adf5997
    DORA PSI
  • Ukleev V, Burian M, Gliga S, Vaz CAF, Rösner B, Fainozzi D, et al.
    Effect of intense x-ray free-electron laser transient gratings on the magnetic domain structure of Tm:YIG
    Journal of Applied Physics. 2023; 133(12): 123902 (6 pp.). https://doi.org/10.1063/5.0119241
    DORA PSI
  • Vladimirova NV, Frolov AS, Sánchez-Barriga J, Clark OJ, Matsui F, Usachov DY, et al.
    Occupancy of lattice positions probed by X-ray photoelectron diffraction: a case study of tetradymite topological insulators
    Surfaces and Interfaces. 2023; 36: 102516 (10 pp.). https://doi.org/10.1016/j.surfin.2022.102516
    DORA PSI
  • Wang Z, Chen J, Yu T, Zeng Y, Guo X, Wang S, et al.
    Sulfonium-functionalized polystyrene-based nonchemically amplified resists enabling sub-13 nm nanolithography
    ACS Applied Materials and Interfaces. 2023; 15(1): 2289-2300. https://doi.org/10.1021/acsami.2c19940
    DORA PSI
  • Wang Q, Zhou Y, Wang X, Gao H, Shu Z, Hu Z, et al.
    Suppressing of secondary electron diffusion for high-precision nanofabrication
    Materials Today. 2023. https://doi.org/10.1016/j.mattod.2023.06.005
    DORA PSI
  • Wang Q, Vockenhuber M, Cui H, Wang X, Tao P, Hu Z, et al.
    Theoretical insights into the solubility polarity switch of metal–organic nanoclusters for nanoscale patterning
    Small Methods. 2023. https://doi.org/10.1002/smtd.202300309
    DORA PSI
  • Wen Y, Giorgianni F, Ilyakov I, Quan B, Kovalev S, Wang C, et al.
    A universal route to efficient non-linear response via Thomson scattering in linear solids
    National Science Review. 2023; 10(7): nwad136 (10 pp.). https://doi.org/10.1093/nsr/nwad136
    DORA PSI
  • Wu X, Pan Z, Steglich M, Ascher P, Bodi A, Bjelić S, et al.
    A direct liquid sampling interface for photoelectron photoion coincidence spectroscopy
    Review of Scientific Instruments. 2023; 94(3): 034103 (9 pp.). https://doi.org/10.1063/5.0136665
    DORA PSI
  • Zare Pakzad S, Nasr Esfahani M, Tasdemir Z, Wollschläger N, Li T, Li XF, et al.
    Nanomechanical modeling of the bending response of silicon nanowires
    ACS Applied Nano Materials. 2023; 6(17): 15465-15478. https://doi.org/10.1021/acsanm.3c02077
    DORA PSI

2022

  • Ahsan A, Buimaga-Iarinca L, Nijs T, Nowakowska S, Sk R, Mousavi SF, et al.
    Induced fit and mobility of cycloalkanes within nanometer-sized confinements at 5 K
    Journal of Physical Chemistry Letters. 2022; 13(32): 7504-7513. https://doi.org/10.1021/acs.jpclett.2c01592
    DORA PSI
  • Allenet T, Vockenhuber M, Yeh C-K, Santaclara JG, van Lent-Protasova L, Ekinci Y, et al.
    EUV resist screening update: progress towards High-NA lithography
    In: Sanders DP, Guerrero D, eds. Advances in patterning materials and processes XXXIX. Vol. 12055. Proceedings of SPIE. Bellingham: SPIE; 2022:120550F (10 pp.). https://doi.org/10.1117/12.2614171
    DORA PSI
  • Armand Pilon FT, Niquet Y-M, Chretien J, Pauc N, Reboud V, Calvo V, et al.
    Investigation of lasing in highly strained germanium at the crossover to direct band gap
    Physical Review Research. 2022; 4(3): 033050 (17 pp.). https://doi.org/10.1103/PhysRevResearch.4.033050
    DORA PSI
  • Beckert A, Grimm M, Hermans RI, Freeman JR, Linfield EH, Davies AG, et al.
    Precise determination of the low-energy electronuclear Hamiltonian of LiY1-xHoxF4
    Physical Review B. 2022; 106(11): 115119 (11 pp.). https://doi.org/10.1103/PhysRevB.106.115119
    DORA PSI
  • Bergamaschi A, Andrä M, Barten R, Baruffaldi F, Brückner M, Carulla M, et al.
    First demonstration of on-chip interpolation using a single photon counting microstrip detector
    Journal of Instrumentation. 2022; 17(11): C11012 (9 pp.). https://doi.org/10.1088/1748-0221/17/11/C11012
    DORA PSI
  • Bespin C, Caicedo I, Dingfelder J, Hemperek T, Hirono T, Hügging F, et al.
    Charge collection and efficiency measurements of the TJ-Monopix2 DMAPS in 180 nm CMOS technology
    In: Carini G, Denes P, Dierickx B, Furenlid L, Horisberger R, Kagan H, et al., eds. 10th international workshop on semiconductor pixel detectors for particles and imaging. Vol. 420. Proceedings of science. Trieste: Sissa Medialab srl; 2022:080 (8 pp.). https://doi.org/10.22323/1.420.0080
    DORA PSI
  • Bespin C, Berdalovic I, Caicedo I, Cardella R, Dingfelder J, Flores L, et al.
    Development and characterization of a DMAPS chip in TowerJazz 180nm technology for high radiation environments
    Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2022; 1040: 167189 (6 pp.). https://doi.org/10.1016/j.nima.2022.167189
    DORA PSI
  • Chiriotti S, Barten R, Bergamaschi A, Brückner M, Carulla M, Chsherbakov I, et al.
    High-spatial resolution measurements with a GaAs:Cr sensor using the charge integrating MÖNCH detector with a pixel pitch of 25 μm
    Journal of Instrumentation. 2022; 17: P04007 (17 pp.). https://doi.org/10.1088/1748-0221/17/04/P04007
    DORA PSI
  • Collé D, Erjawetz J, Ekindorf G, Heyl P, Ritter D, Reddy A, et al.
    Bend the curve – shape optimization in laser grayscale direct write lithography using a single figure of merit
    Micro and Nano Engineering. 2022; 15: 100137 (9 pp.). https://doi.org/10.1016/j.mne.2022.100137
    DORA PSI
  • Dwivedi N, Balasubramanian K, Sahu R, Manna S, Banik S, Dhand C, et al.
    Unusual high hardness and load-dependent mechanical characteristics of hydrogenated carbon-nitrogen hybrid films
    ACS Applied Materials and Interfaces. 2022; 14(17): 20220-20229. https://doi.org/10.1021/acsami.2c01508
    DORA PSI
  • Evrard Q, Sadegh N, Ekinci Y, Vockenhuber M, Mahne N, Giglia A, et al.
    Influence of counteranions on the performance of tin-based EUV photoresists
    Journal of Photopolymer Science and Technology. 2022; 35(1): 95-100. https://doi.org/10.2494/photopolymer.35.95
    DORA PSI
  • Fanciulli M, Pancaldi M, Pedersoli E, Vimal M, Bresteau D, Luttmann M, et al.
    Magnetic helicoidal dichroism with XUV light carrying orbital angular momentum
    In: Proceedings the international conference on ultrafast phenomena (UP) 2022. International conference on ultrafast phenomena. Washington, DC: Optica Publishing Group; 2022:Tu2A.4 (2 pp.). https://doi.org/10.1364/UP.2022.Tu2A.4
    DORA PSI
  • Fanciulli M, Pancaldi M, Pedersoli E, Vimal M, Bresteau D, Luttmann M, et al.
    Magnetic helicoidal dichroism with XUV light carrying orbital angular momentum
    In: Laasch W, Tschentscher T, eds. 14th international conference on synchrotron radiation instrumentation (SRI 2021). Vol. 2380. Journal of physics: conference series. Bristol; Philadelphia: IOP Publishing; 2022:012129 (6 pp.). https://doi.org/10.1088/1742-6596/2380/1/012129
    DORA PSI
  • Fanciulli M, Pancaldi M, Pedersoli E, Vimal M, Bresteau D, Luttmann M, et al.
    Observation of magnetic helicoidal dichroism with extreme ultraviolet light vortices
    Physical Review Letters. 2022; 128(7): 077401 (7 pp.). https://doi.org/10.1103/PhysRevLett.128.077401
    DORA PSI
  • Finizio S, Bailey JB, Olsthoorn B, Raabe J
    Periodogram-based detection of unknown frequencies in time-resolved scanning transmission X-ray microscopy
    ACS Nano. 2022; 16(12): 21071-21078. https://doi.org/10.1021/acsnano.2c08874
    DORA PSI
  • Flenner S, Hagemann J, Storm M, Kubec A, Qi P, David C, et al.
    Hard X-ray nanotomography at the P05 imaging beamline at PETRA III
    In: Müller B, Wang G, eds. Developments in X-Ray tomography XIV. Vol. 12242. Proceedings of SPIE. Bellingham: SPIE; 2022:122420L (8 pp.). https://doi.org/10.1117/12.2632706
    DORA PSI
  • Frolov AS, Usachov DY, Fedorov AV, Vilkov OY, Golyashov V, Tereshchenko OE, et al.
    Ferromagnetic layers in a topological insulator (Bi,Sb)2Te3 crystal doped with Mn
    ACS Nano. 2022; 16(12): 20831-20841. https://doi.org/10.1021/acsnano.2c08217
    DORA PSI
  • Fröjdh E, Baruffaldi F, Bergamaschi A, Carulla M, Dinapoli R, Greiffenberg D, et al.
    Detection of MeV electrons using a charge integrating hybrid pixel detector
    Journal of Instrumentation. 2022; 17(12): C12004 (8 pp.). https://doi.org/10.1088/1748-0221/17/12/C12004
    DORA PSI
  • Fröjdh E, Abrahams JP, Andrä M, Barten R, Bergamaschi A, Brückner M, et al.
    Electron detection with CdTe and GaAs sensors using the charge integrating hybrid pixel detector JUNGFRAU
    Journal of Instrumentation. 2022; 17: C01020 (12 pp.). https://doi.org/10.1088/1748-0221/17/01/C01020
    DORA PSI
  • Glazyrin K, Khandarkhaeva S, Fedotenko T, Dong W, Laniel D, Seiboth F, et al.
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