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Thin Films and Interfaces Group

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Scientific Highlights

Scientific Highlights

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Datum
4 December 2018
Scheme of the laser based methods applied for coating the SAW devices: MAPLE is used to fabricate in one step a polymer multi-ribbon, which is afterwards used as a donor for printing by LIFT of polymer pixels onto the SAW resonator. From Fig. 1

Highly selective surface acoustic wave e-nose implemented by laser direct writing

In this paper, we present an e-nose for the detection of volatile compounds based on an array of six surface acoustic wave (SAW) resonators coated with five different polymers (i.e. polyepichlorohydrin, polyisobutylene, polyethylenimine, (hydroxypropyl)methyl cellulose, and poly(styrene-co-maleic acid) partial isobutyl/methyl mixed ester, plus an uncoated SAW device used as reference.

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26 October 2018

Relationship between crystal structure and multiferroic orders in orthorhombic perovskite manganites

We use resonant and nonresonant x-ray diffraction measurements in combination with first-principles electronic structure calculations and Monte Carlo simulations to study the relationship between crystal structure and multiferroic orders in the orthorhombic perovskite manganites, o−RMnO3 (R is a rare-earth cation or Y).

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25 October 2018

Rolling dopant and strain in Y-doped BiFeO3 epitaxial thin films for photoelectrochemical water splitting

We report significant photoelectrochemical activity of Y-doped BiFeO3 (Y-BFO) epitaxial thin films deposited on Nb:SrTiO3 substrates. The Y-BFO photoanodes exhibit a strong dependence of the photocurrent values on the thickness of the films, and implicitly on the induced epitaxial strain.

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18 September 2018
Maximum compositional deviations at PLD relevant angular areas (±10°) versus mass‐ratios, mainly for 1 × 10−2 mbar Ar. Except for O/Mn and Li/Mn in which the maximum deviations already appear at 1 × 10−3 mbar Ar. Symbols ◼ are for RBS measurements, ▴ for ERDA measurements, and ● for data from ref. 30. Note: O/Mn deviation has a high uncertainty due to the suspicion of ambient water trapping by the amorphous film. Error bars are smaller than the symbols except for EuAlO3. (from Figure 5)

Influence of Plume Properties on Thin Film Composition in Pulsed Laser Deposition

Despite the apparent simplicity of pulsed laser deposition, consistent deposition of thin films with the desired thickness, composition, crystallinity, and quality still remains challenging. This article explores the influence of process parameters with respect to film thickness and composition, two key aspects for thin films which have a very strong effect on film properties, possible applications, and characterization.

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Thin Films and Interfaces Group
Paul Scherrer Institut
5232 Villigen PSI
Switzerland
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Professor Dr. Dr. h.c. Thomas Lippert
Head of Group
OFLB/U110
tel: +41 56 310 4076
fax: +41 56 310 2688
thomas.lippert@psi.ch

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