Dr. Aldo Mozzanica
5232 Villigen PSI
After a degree in Physics at the Insubria University, Como, with a thesis on the characterization of high granularity silicon detectors, Aldo Mozzanica did his Ph.D at the University of Milan, with a work focused on the design, assembly, test and data taking of the scintillating fiber vertex detector for cross section measurements at the Antiproton Decelerator facility at CERN. From 2008 to 2011 he worked at PSI as a Post Doc in the SLS Detector Development group, with his main task being the development of a Silicon strip detector with integrating readout for XFEL and synchrotron applications (GOTTHARD). Since 2011 he works as scientist in the PSD detector group, developing charge integrating pixels and strip detectors.
Aldo Mozzanica is the main responsible for the JUNGFRAU charge integrating detector. He designed, tested and characterized the JUNGFRAU Application Specific Integrated Circuit, and coordinated the design of the readout board, firmware, and mechanics. He is in charge of the JUNGFRAU module production at PSI and of the relative supply chain. He participates in the commissioning of the JUNGFRAU cameras at the SwissFEL end-stations, and in FEL and Synchrotron beam-times to explore the detector capabilities in different fields of application.
His work is focused in the development of new detectors addressing the limitations of current state-of-the-art X-Ray detector technology. This is achieved with a mix of incremental improvements on the current designs, with e.g. a faster frame rate/lower noise JUNGFRAU version, and novel ideas. The latter are to be explored on different scales: both microscopically, at the level of individual electronic schematics and globally, with the test of novel detector concepts.
For an extensive overview we kindly refer you to our publication repository:
Redford S, Andrä M, Barten R, Bergamaschi A, Brückner M, Chiriotti S, et al.
First full dynamic range scan of the JUNGFRAU detector performed at an XFEL with an accurate intensity reference
Journal of Instrumentation. 2020; 15(2): C02025 (8 pp.). https://doi.org/10.1088/1748-0221/15/02/C02025