ADRESS - X03MA: Advanced Resonant Spectroscopies
The ADvanced RESonant Spectroscopies (ADRESS) beamline installed in the X03MA straight section of SLS is a high-performance soft-X-ray undulator beamline operating in the energy range from 300 eV to 1.6 keV. It hosts two endstations, for Angle-Resolved Photoelectron Emission (ARPES) and Resonant Inelastic X-ray Scattering (RIXS). The scientific activity at the beamline is focused on correlated systems, topological materials, complex oxides, semiconductors and their nanostructures.
| Energy range | 300 - 1600 eV |
|---|---|
| Polarization | circular and 0-180o variable linear polarization |
| Resolving power E/Δ E (1 keV) | up to 33'000 |
| Flux on sample (1 keV) | >1013 ph/s/0.01%BW/400 mA |
| End stations | Angle-Resolved Photoelectron Spectroscopy (ARPES); Resonant Inelastic X-ray Scattering (RIXS) |
| Spot size on sample | 10 x 74 µm2 (ARPES); 4 x 52 µm2 (RIXS) |
A detailed description of the ADRESS beamline can be found in J. Synchrotron Rad. 17 (2010) 631 and one of the recent presentations.
Current Highlights and News
Scientific Highlights
Understanding the physics in new metals
Together with international colleagues, PSI researchers have now been able to make correlated metals more readily usable for applications in superconductivity, data processing, and quantum computers.
Customising an electronic material
PSI scientists have investigated a material that could be suitable for future data storage applications. They have manipulated the crystalline structure of their sample while measuring how this affects the material’s magnetic and electronic properties.
Weyl fermions discovered in another class of materials
A particular variety of particles, the so-called Weyl fermions, had previously only been detected in certain non-magnetic materials. But now researchers at PSI have experimentally proved their existence for the first time in a specific paramagnetic material.