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ADRESS

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Adress Beamline 02.jpg

ADRESS - X03MA: Advanced Resonant Spectroscopies

The ADvanced RESonant Spectroscopies (ADRESS) beamline installed in the X03MA straight section of SLS is a high-performance soft-X-ray undulator beamline operating in the energy range from 300 eV to 1.6 keV. It hosts two endstations, for Angle-Resolved Photoelectron Emission (ARPES) and Resonant Inelastic X-ray Scattering (RIXS). The scientific activity at the beamline is focused on correlated systems, topological materials, complex oxides, semiconductors and their nanostructures.

Energy range 300 - 1600 eV
Polarization circular and 0-180o variable linear polarization
Resolving power E/Δ E (1 keV) up to 33'000
Flux on sample (1 keV) >1013 ph/s/0.01%BW/400 mA
End stations Angle-Resolved Photoelectron Spectroscopy (ARPES); Resonant Inelastic X-ray Scattering (RIXS)
Spot size on sample 10 x 74 µm2 (ARPES); 4 x 52 µm2 (RIXS)

A detailed description of the ADRESS beamline can be found in J. Synchrotron Rad. 17 (2010) 631 and one of the recent presentations.

Current Highlights and News

Scientific Highlights

13 July 2022
Thorsten Schmitt

A better understanding of water

Research Using Synchrotron Light

Potentiometric map of water molecules created

Read more
22 December 2021
Vladimir N. Strocov

Semiconductors reach the quantum world

Media Releases Research Using Synchrotron Light Materials Research Future Technologies Quantum Research

Boosted with superconductivity: Semiconductor technology can get a new twist by exploiting quantum effects in superconductors.

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19 July 2021
Thorsten Schmitt

Understanding the physics in new metals

Media Releases Research Using Synchrotron Light Materials Research Future Technologies

Together with international colleagues, PSI researchers have now been able to make correlated metals more readily usable for applications in superconductivity, data processing, and quantum computers.

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