ADRESS - X03MA: Advanced Resonant Spectroscopies
The ADvanced RESonant Spectroscopies (ADRESS) beamline installed in the X03MA straight section of SLS is a high-performance soft-X-ray undulator beamline operating in the energy range from 300 eV to 1.6 keV. It hosts two endstations, for Angle-Resolved Photoelectron Emission (ARPES) and Resonant Inelastic X-ray Scattering (RIXS). The scientific activity at the beamline is focused on correlated systems, topological materials, complex oxides, semiconductors and their nanostructures.
|Energy range||300 - 1600 eV|
|Polarization||circular and 0-180o variable linear polarization|
|Resolving power E/Δ E (1 keV)||up to 33'000|
|Flux on sample (1 keV)||>1013 ph/s/0.01%BW/400 mA|
|End stations||Angle-Resolved Photoelectron Spectroscopy (ARPES); Resonant Inelastic X-ray Scattering (RIXS)|
|Spot size on sample||10 x 74 µm2 (ARPES); 4 x 52 µm2 (RIXS)|
Current Highlights and News
Boosted with superconductivity: Semiconductor technology can get a new twist by exploiting quantum effects in superconductors.
Together with international colleagues, PSI researchers have now been able to make correlated metals more readily usable for applications in superconductivity, data processing, and quantum computers.
PSI scientists have investigated a material that could be suitable for future data storage applications. They have manipulated the crystalline structure of their sample while measuring how this affects the material’s magnetic and electronic properties.