ADRESS - X03MA: Advanced Resonant Spectroscopies
The ADvanced RESonant Spectroscopies (ADRESS) beamline installed in the X03MA straight section of SLS is a high-performance soft-X-ray undulator beamline operating in the energy range from 300 eV to 1.6 keV. It hosts two endstations, for Angle-Resolved Photoelectron Emission (ARPES) and Resonant Inelastic X-ray Scattering (RIXS). The scientific activity at the beamline is focused on correlated systems, topological materials, complex oxides, semiconductors and their nanostructures.
| Energy range | 300 - 1600 eV |
|---|---|
| Polarization | circular and 0-180o variable linear polarization |
| Resolving power E/Δ E (1 keV) | up to 33'000 |
| Flux on sample (1 keV) | >1013 ph/s/0.01%BW/400 mA |
| End stations | Angle-Resolved Photoelectron Spectroscopy (ARPES); Resonant Inelastic X-ray Scattering (RIXS) |
| Spot size on sample | 10 x 74 µm2 (ARPES); 4 x 52 µm2 (RIXS) |
A detailed description of the ADRESS beamline can be found in J. Synchrotron Rad. 17 (2010) 631 and one of the recent presentations.
Current Highlights and News
Scientific Highlights
Weyl fermions discovered in another class of materials
A particular variety of particles, the so-called Weyl fermions, had previously only been detected in certain non-magnetic materials. But now researchers at PSI have experimentally proved their existence for the first time in a specific paramagnetic material.
New material also reveals new quasiparticles
Researchers at PSI have investigated a novel crystalline material at the Swiss Light Source SLS that exhibits electronic properties never seen before. Among other things, they were able to detect a new type of quasiparticle: so-called Rarita-Schwinger fermions.
X‐Ray Writing of Metallic Conductivity and Oxygen Vacancies at Silicon/SrTiO3 Interfaces
Lithography‐like writing of conducting regions at the interface between SrTiO3 and amorphous Si using X‐ray irradiation opens ways for spatially controlled functionalities in oxide heterostructures.