ADRESS - X03MA: Advanced Resonant Spectroscopies
The ADvanced RESonant Spectroscopies (ADRESS) beamline installed in the X03MA straight section of SLS is a high-performance soft-X-ray undulator beamline operating in the energy range from 300 eV to 1.6 keV. It hosts two endstations, for Angle-Resolved Photoelectron Emission (ARPES) and Resonant Inelastic X-ray Scattering (RIXS). The scientific activity at the beamline is focused on correlated systems, topological materials, complex oxides, semiconductors and their nanostructures.
|Energy range||300 - 1600 eV|
|Polarization||circular and 0-180o variable linear polarization|
|Resolving power E/Δ E (1 keV)||up to 33'000|
|Flux on sample (1 keV)||>1013 ph/s/0.01%BW/400 mA|
|End stations||Angle-Resolved Photoelectron Spectroscopy (ARPES); Resonant Inelastic X-ray Scattering (RIXS)|
|Spot size on sample||10 x 74 µm2 (ARPES); 4 x 52 µm2 (RIXS)|
Current Highlights and News
A particular variety of particles, the so-called Weyl fermions, had previously only been detected in certain non-magnetic materials. But now researchers at PSI have experimentally proved their existence for the first time in a specific paramagnetic material.
Researchers at PSI have investigated a novel crystalline material at the Swiss Light Source SLS that exhibits electronic properties never seen before. Among other things, they were able to detect a new type of quasiparticle: so-called Rarita-Schwinger fermions.
Lithography‐like writing of conducting regions at the interface between SrTiO3 and amorphous Si using X‐ray irradiation opens ways for spatially controlled functionalities in oxide heterostructures.