ADRESS - X03MA: Advanced Resonant Spectroscopies
The ADvanced RESonant Spectroscopies (ADRESS) beamline installed in the X03MA straight section of SLS is a high-performance soft-X-ray undulator beamline operating in the energy range from 300 eV to 1.6 keV. It hosts two endstations, for Angle-Resolved Photoelectron Emission (ARPES) and Resonant Inelastic X-ray Scattering (RIXS). The scientific activity at the beamline is focused on correlated systems, topological materials, complex oxides, semiconductors and their nanostructures.
|Energy range||300 - 1600 eV|
|Polarization||circular and 0-180o variable linear polarization|
|Resolving power E/Δ E (1 keV)||up to 33'000|
|Flux on sample (1 keV)||>1013 ph/s/0.01%BW/400 mA|
|End stations||Angle-Resolved Photoelectron Spectroscopy (ARPES); Resonant Inelastic X-ray Scattering (RIXS)|
|Spot size on sample||10 x 74 µm2 (ARPES); 4 x 52 µm2 (RIXS)|
Current Highlights and News
Soft X-rays enable scientists to visualise non-invasively the electronic properties of ultra-thin dopant layers buried within semiconductor wafers.