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ADRESS - X03MA: Advanced Resonant Spectroscopies
The ADvanced RESonant Spectroscopies (ADRESS) beamline installed in the X03MA straight section of SLS is a high-performance soft-X-ray undulator beamline operating in the energy range from 300 eV to 1.6 keV. It hosts two endstations, for Angle-Resolved Photoelectron Emission (ARPES) and Resonant Inelastic X-ray Scattering (RIXS). The scientific activity at the beamline is focused on correlated systems, topological materials, complex oxides, semiconductors and their nanostructures.
| Energy range | 300 - 1600 eV |
|---|---|
| Polarization | circular and 0-180o variable linear polarization |
| Resolving power E/Δ E (1 keV) | up to 33'000 |
| Flux on sample (1 keV) | >1013 ph/s/0.01%BW/400 mA |
| End stations | Angle-Resolved Photoelectron Spectroscopy (ARPES); Resonant Inelastic X-ray Scattering (RIXS) |
| Spot size on sample | 10 x 74 µm2 (ARPES); 4 x 52 µm2 (RIXS) |
A detailed description of the ADRESS beamline can be found in J. Synchrotron Rad. 17 (2010) 631 and one of the recent presentations.
Current Highlights and News
Scientific Highlights
Unveiling ultra-thin electron liquids in silicon
Soft X-rays enable scientists to visualise non-invasively the electronic properties of ultra-thin dopant layers buried within semiconductor wafers.
A better understanding of water
Potentiometric map of water molecules created
Semiconductors reach the quantum world
Boosted with superconductivity: Semiconductor technology can get a new twist by exploiting quantum effects in superconductors.