SLS Beamlines

Each of the 21 beamlines at SLS is optimised for a specific technique. Depending on the type of radiation source, there are two types of beamline (insertion-device and bending-magnet/superbend). In the layout ID beamline sources are indicated as boxes; the bending magnets sources are either normal, warm superbend, or cryogenically cooled superbend, shown by red, green, and blue circles, respectively.

Find the appropriate instrument/technique to tackle your research field by searching in the beamline finder table below and read more about the specification of the instrument(s) on the corresponding beamline website(s).

Long Short Full name Trier par ordre décroissant Insertion Device
X04SA ADDAMS
Advanced Diffraction for Material Science

ADDAMS (Advanced DiffrAction for Materials Science) is a beamline dedicated to powder diffraction and resonant X-ray diffraction within the hard X-ray range of 5 to 40 keV.

The PD station operates a high-resolution powder diffractometer equipped with the novel Mythen III detector and a versatile table, using a frontal Pilatus 6M area detector. With its various attachments and in situ devices it allows investigations of samples in capillaries or bulk under a variety of conditions, including high throughput setups, ball-milling, gas pressure etc.. Time dependent phenomena can also be probed with powder diffraction using a local 22 kHz Eiger 1M.

Surface diffraction is a unique tool for determining the detailed atomic structure of crystalline surfaces or the electronic and magnetic properties of materials.

U14
X03MA ADRESS
Advanced Resonant Spectroscopies

The beamline is constructed to deliver soft-X-ray radiation and has a Resonant Inelastic X-ray Scattering (RIXS) endstation and an Angle-Resolved Photoelectron Emission (ARPES) endstation. The scientific activity at the beamline is focussed on correlated systems (transition metals and rare earths) and nanostructures.

UE44
X03MA ADRESS-SX-ARPES
Soft-X-ray Angle-Resolved Photoelectron Spectroscopy

The SX-ARPES facility is installed at the high-resolution undulator beamline ADRESS. The large probing depth and resonant photoexcitation achieved with soft X-rays allow investigations of k-resolved electronic structure of quantum materials including topological materials, buried interfaces, heterostructures and diluted impurity systems. The facility conducts extensive industrial research on materials for quantum computing.

UE44
X12SA cSAXS
Coherent Small-Angle X-Ray Scattering

cSAXS is a beamline dedicated to high-resolution microscopy (using primarily ptychography, a coherent diffraction technique) and small-angle X-ray scattering (SAXS) within the hard X-ray range of 6 to ~30 keV.
For ptychography, there are three dedicated endstations
- flOMNI for room-temperature tomography under environmental control
- OMNY for tomography under cryogenic conditions in vacuum
- LaMNI for laminography at room temperature
SAXS can be performed with spatial resolution as microscopy technique in 2D and 3D. Sample environments allow for in situ control, microfluidics, etc.
Measurements can be complemented by wide-angle X-ray scattering and fluorescence mapping.
cSAXS also serves as a platform for method development in coherent X-ray imaging, multimodal tomography, and X-ray optics.

U17
X01DA Debye
X-ray absorption and X-ray diffraction (XAS and XRD)

Debye is a beamline dedicated to sub-second high-throughput quasi-simultaneous X-ray absorption spectroscopy (quick XAS), X-ray diffraction (XRD) and total scattering (through the pair distribution function, PDF (available from 2027)). The beamline offers a tunable energy range from 4.5 to 60 keV, with a variable beamsize from 40 x 60 μm to 5 x 30 mm. 

Debye’s infrastructure includes: detectors for XAS (fast response ionization chambers, PIPS and a 7-element silicon drift detector SDD) and powder XRD (a Pilatus 6 M), a gas delivery system for reactive gases (up to 60 bars), several in situ and operando cells and a moveable sample environment table containing gas analytics (GC and MS), potentiostats and mass flow controllers for operando experiments. 

variable 3-5 Tesla bending magnet
X02SA I-TOMCAT
I-TOMCAT: TOmographic Microscopy and Coherent rAdiology experimenTs

The I-TOMCAT beamline at the Swiss Light Source is a cutting-edge facility operated by the  X-ray Tomography Group at PSI. It is designed to exploit the unique properties of synchrotron radiation for fast, non-destructive, and high-resolution 3D imaging across a wide range of scientific disciplines. I-TOMCAT is powered by a a U15 undulator (to be upgrade to a HTSU10 in 2027) and supports both absorption-based and phase-contrast imaging, with isotropic voxel sizes ranging from 50nm up to 0.65 microns and energy range of 8 to 50 keV (monochromatic). I-TOMCAT features three state-of-the-art endstations,  dedicated to high-resolution, high-throughput, and dynamic tomographic imaging.

U15 —> HTSU-10
X07DB ISS
In-situ spectroscopy

At the In Situ Spectroscopy beamline, ambient-pressure X-ray photoelectron spectroscopy (APXPS) and X-ray absorption spectroscopy (XAS) experiments can be performed. Two experimental chambers are available and can be connected to a shared electron analyzer, allowing the investigation of solid-gas and solid-liquid interfaces.

Bending Magnet
X05LA Micro-XAS
Micro X-ray Absorption Spectroscopy

The microXAS Chemical Imaging Beamline provides unique capabilities for Imaging Chemistry in Space and Time in a wide range of reactive systems at relevant spatial and temporal length scales.
Based on the simultaneous application of spatially resolved X-ray fluorescence spectroscopy (micro-XRF), X-ray Diffraction (micro-XRD), X-ray absorption spectroscopy (micro-XANES, micro-EXAFS, micro-XES) complementary chemical information can be obtained with (sub-)micro resolution.  The fast temporal resolution (us) allows to investigate the dynamics of chemical transformations under `real-world' (native reactive) conditions.
As special feature the microXAS beamline permits the investigation of radioactive samples exceeding exemption limits.
The offered in-situ chemical imaging capabilities allow diverse scientific communities to gain unrivaled insights into the chemical complexity of hierarchical, heterogeneous materials, including corresponding chemical reaction pathways and kinetics (`reactivity').

U19
X03DA PEARL
PhotoEmission and Atomic Resolution Laboratory

The PEARL (PhotoEmission and Atomic Resolution Laboratory) beamline is dedicated to the structural, chemical and electronic characterisation of surfaces and adsorbates with atomic resolution. The beamline supports angle-resolved photoelectron spectroscopy (ARPES, XPS) and diffraction (XPD) and provides in-situ surface preparation and scanning tunnelling microscopy.

Bending Magnet
X07MB Phoenix
Photons for the Exploration of Nature by Imaging and XAFS

The PHOENIX (PHOtons for the Exploration of Nature by Imaging and XAFS) beamline is dedicated to X-ray Absorption (micro-) Spectroscopy (XAS) and imaging in both the soft and the rarely served tender X-ray’s covering the energyrange from 0.25 to 8 keV. both X-ray scanning microscopy (elemental mapping and chemical imaging) and micro-XAS can be performed with a spatial resolution of about 3 mm. The beamline covers important absorption edges of low-Z elements, in particular the K-edges of N-Fe and the L –edges of Ca-Er, providing unique research opportunities for material science, biology, energy research, environmental science, chemistry, catalysis, or cultural heritage. The beamline offers ample opportunity for in situ experiments (liquid cells, microjet, heating and cooling), which can be adapted to the user’s needs. Furthermore, a von Hamos spectrometer for emission spectroscopy in the energy range 2030-3100 eV and 3330-5060 eV is available.

The beamline has two branchlines. The PHOENIX I branch uses a double crystal monochromator and covers energies from 1-8 keV, the soft x-ray branchline PHOENIX II invokes a planar grating monochromator and covers the range from 0.3-2 keV.

UE38
X07DA PolLux
Highly Versatile Scanning Transmission X-Ray Microspectroscope

PolLux allows measuring nanoscale images with contrast based on spectroscopic effects that include material parameters like elemental composition, oxidation state, magnetisation, molecular structure and molecular orientation. Special sample environments allow in situ measurements with exposure to liquids and gasses, high and low temperatures, electric and magnetic fields, and different kinds of light. Stroboscopic time-resolved imaging and 3D imaging modes are also available. Such analyses serve a wide variety of research communities.

Bending Magnet
X06SA PXI
Macromolecular Crystallography

X06SA (PXI) is the first macromolecular crystallography beamline at the Swiss Light Source. It is fully tunable from 5.7 to 17.5 keV with variable beam size from 5 um to 100 um, and is equipped with a flexible two-stage focusing X-ray optics system and a single–photon counting hybrid pixel area EIGER 16M (Dectris) detector. The PXI covers a wide range of MX applications from high-throughput crystallography to micro-crystallography and serial synchrotron crystallography. Room-temperaure and time-resolved MX are the latest features. The beamline team support both academic and proprietary users in on-site, remote, and fully-automated modes.

U19
X10SA PXII
Macromolecular Crystallography

The PXII beamline at the Swiss Light Source is a high-performance macromolecular crystallography facility primarily dedicated to proprietary users. It has recently undergone a significant upgrade, incorporating new optical components and enhanced automation. These developments will provide increased beam stability, higher flux, and variable beam sizes, while significantly streamlining experimental workflows. As a result, PXII is now even better suited for high-throughput data collection and the structure determination of challenging macromolecular samples.

U19
X06DA PXIII
Macromolecular Crystallography

X06DA (PXIII) is a macromolecular crystallography beamline at the Swiss Light Source (SLS 2.0), available to both academic and proprietary users. PXIII receives synchrotron radiation from a 2.1 T superbend magnet. While it retains capabilities for low-energy applications, PXIII is primarily optimized for high-throughput data collection and unattended operation, under both cryogenic and room-temperature conditions.

The current optical setup delivers a focused X-ray beam of approximately 30 × 20 µm² (h × v) at the sample position, with a photon flux of ~4 × 10¹¹ ph/s at 12.4 keV energy. The beam size can be adjusted between 10 × 10 µm² and 50 × 50 µm². The beamline is equipped with the new PILATUS4 2M Si detector, supporting data collection rates of up to 1.9 kHz.

A state-of-the-art crystallization facility is in the immediate vicinity of the beamline, offering automated systems for both soluble and membrane protein crystallization, as well as support for fragment-based screening campaigns.

Superbend
X02DA S-TOMCAT
S-TOMCAT: TOmographic Microscopy and Coherent rAdiology experimenTs

The S-TOMCAT beamline at the Swiss Light Source is a cutting-edge facility operated by the X-ray Tomography Group at PSI. It is designed to exploit the unique properties of synchrotron radiation for fast, non-destructive, and high-resolution 3D imaging across a wide range of scientific disciplines. S-TOMCAT supports both absorption-based and phase-contrast imaging, with isotropic voxel sizes ranging from 0.16 to 11 micrometers and an energy range of 8 to 80 keV (monochromatic) as well as white beam from a powerful 5T superconducting magnet. Beam-size at sample can be as large as 50 mm horizontally. Phase contrast is achieved through propagation-based techniques, as well as grating interferometry, allowing researchers to visualise fine structural details even in weakly absorbing materials.

5T superbend
X11MA SIM
Surfaces / Interfaces Microscopy
The permanent endstation of the SIM beamline is a Photoemission Electron microscope (PEEM) (Model: LEEM III, Elmitec GmbH). It allows to image samples using the photoelectric effect with very high spatial resolution.
UE56 (twins)
X09LA SIS-COPHEE
Surface and Interface Spectroscopy - Complete Photoemission Experiment (COPHEE)

The Surface and Interface Spectroscopy beamline (SIS) provides a state-of-the-art experimental setup to study the electronic and atomic structure of surfaces. The beamline has been designed for high photon energy resolution with low harmonic contamination and flexible light polarization. The COPHEE endstation is dedicated to spin- and angle-resolved photoemission spectroscopy (SARPES), which can measure all properties of photoelectrons excited from a sample surface, namely energy, momentum and spin-polarization. The station reaches temperatures down to 17 K and offers an additional free contact for biasing or gating the sample.

UE212 (twins)
X09LA SIS-ULTRA
Surface and Interface Spectroscopy - Low-Temperature High-Resolution Angle-Resolved Photoemission (ULTRA)

The Surface and Interface Spectroscopy beamline (SIS) provides a state-of-the-art experimental setup to study the electronic and atomic structure of surfaces. The beamline has been designed for high photon energy resolution with low harmonic contamination and flexible light polarization. ULTRA endstation is utilized for high-resolution angle-resolved photoemission spectroscopy (ARPES) at temperatures down to 4 K.

UE212 (twins)
X10DA Super-XAS
X-ray absorption and emission spectroscopy (XAS and XES)

SuperXAS is a beamline dedicated to sub-second X-ray absorption spectroscopy (quick XAS), X-ray emission spectroscopy (XES) as well as laser pump- X-ray probe (XAS and XES) spectroscopy (100 ps to ms time resolution). The beamline offers a tunable energy range from 4.5 to 35 keV, with a variable beamsize (best focus 30 x 30 micro-meter).   

The infrastructure includes: detectors for XAS (fast response ionization chambers, PIPS and a 5-element silicon drift detector SDD), high resolution emission spectrometers (a 5-crystal conical crystal von Hamos spectrometer, a Johann spectrometer, a DuMond spectrometer (in commissioning)), a gas delivery system for reactive gases (up to 40 bars), several in situ and operando cells and a moveable sample environment table containing gas analytics (GC and MS), potentiostats and mass flow controllers for operando experiments. 

2.1 Tesla bending magnet
X04DB VUV
Vacuum Ultraviolet Radiation

The VUV beamline, operated by the Reaction Dynamics Group, supplies bright, tunable vacuum ultraviolet bending-magnet synchrotron radiation from 5 to 30 eV (extendable to 100 eV, high harmonic-free between 5.5 and 21 eV). A grazing-incidence monochromator provides a resolving power of up to 10 000 with a photon flux of up to 1012 s−1 at 10 eV. The double-imaging photoelectron-photoion coincidence endstation (CRF-PEPICO) combines velocity-map imaging of electrons and ions with time-of-flight mass spectrometry of the latter. Isomer-specific photoion mass-selected photoelectron spectra identify stable reactants and products together with elusive intermediates, such as radicals, carbenes, and ketenes, in settings from low-pressure flames to catalytic or pyrolytic (micro)reactors and molecular beams. These reaction-level insights advance sustainable catalysis, combustion modelling, atmospheric chemistry, and astrochemical synthesis, while also refining our knowledge of molecular electronic structure, energetics, and thermochemistry.

Bending magnet
X07MA X-Treme
X-Ray Magnetic Circular Dichroism under extreme Conditions

The X-Treme beamline is dedicated to x-ray magnetic (circular or linear) dichroism technique in the soft x-ray range. The technique is element selective and is used for example for the study of magnetic anisotropy and exchange coupling. The energy range covers the L2,3-edges (2p to 3d transition) of 3d transition metals and M4,5-edges of lanthanides (3d to 4f transition), in addition to the K-edges of light elements like O, N, F. Scientific areas of interest are: single molecule magnets, magnetic nanocrystals, self-assembly of nanomagnets on surfaces and strongly correlated electron systems.

UE54
X09LB XIL-II
X-Ray Interference Lithography and Metrology

The XIL-II beamline has two branches. The lithography branch provides a spatially coherent beam in the Extreme Ultraviolet (EUV) energy range (typically around 92 eV) and is equipped with an interference lithography end station (EUV-IL) used for photoresist characterization and for the manufacturing of periodic nanostructures with half pitch as small as 5 nm. The metrology branch is equipped with an SG monochromator providing a coherent beam with tunable wavelength and a λ/dλ ratio of 1500 at 13.5 nm. Its end station is REGINE, an actinic lensless microscope dedicated to EUV mask, pellicle and wafer metrology with a maximum resolution of 34 nm.

U70

1) Insertion Device
The highest brightness at a beamline can be reached by means of insertion devices (Undulators, marked with U). The number behind the letter for the device is the period length in mm. The letter E in the name of an undulator means elliptical polarization is possible.

2) Bending magnet beamlines
This type of beamline uses the radiation from one of the bending magnets of the 7-bend achromats of SLS 2.0