SIS - X09LA: Surface / Interface: Spectroscopy
The Surface and Interface Spectroscopy (SIS) beamline provides a state-of-the-art experimental set-up to study the electronic band structure of novel complex materials by spin- and angle-resolved photoelectron spectroscopies.
The beamline has been designed for the energy range from 10 to 800 eV with high flux, high resolution, variable polarization, and low high-harmonic contamination.
The beamline serves two endstations:
The beamline serves two endstations:
- High-resolution photoemission spectroscopy (HRPES)
for angle-resolved photoelectron spectroscopy (ARPES) - COPHEE
for spin- and angle-resolved photoelectron spectroscopy (SARPES)
| Energy range | 10 - 800 eV |
|---|---|
| Resolving power (E/Δ E) | 104 |
| Polarization | linear horizontal (10 - 800 eV) linear vertical (100 - 800 eV) circular left/right (50-800 eV) |
| Flux on sample (200 eV) | 2*1013 ph/s/0.1%BW/0.4 A |
| Higher order mode contamination | < 0.1 % |
| Spot size on sample (200 eV) | 50 x 100 µm2 (FWHM) |