Analytics

The implementation of Focused Ion Beam instruments in material research laboratories during the last decade has not only strongly improved the preparation of very thin specimens for the Transmission Electron Microscope (TEM), in particular at interfaces, but also led to the development of new analysis methods inside the instrument itself. It became a powerful instrument for the analyses of highly radioactive materials, because it allows for the production and analysis of very small specimens that can be then analyzed with very sensitive detectors without strong interference from the radiation field of the specimen itself.