The goal of the CristallinaMX (CrMX) project is to decrease the barriers to new and non-specialist users wishing to practice SFX. To this end, the project is focused on providing dedicated SFX instrumentation such that users should be able to come armed only with sample and leave with data. Ultimately, the project aims to offer separate sample delivery environments for specific methods. To this end, the first sample-environment the CrMX project has commissioned is called SwissMX (Serial WIth Solid-Support MX), a fixed-target station designed for high-throughput SFX and SFX pump-probe. Other sample delivery systems will gradually be introduced and commissioned but shared common infrastructure such as pump-lasers and detectors.
The CrMX project has an 8 Mpixel JUNGFRAU detector for forward diffraction measurements and is suitable for both in-air and in-He measurements. The panel arrangement of the detector gives a near complete scattering radius of 125 mm and minimises areas lost in the outer corners. The detector is mounted on a 180 mm translation stage so that the entire detector face can be utilised for diffraction measurements. For in air measurements, scatter guards before and after the sample position catch the incident beam and shield it to the detector. The table below indicate the resolutions at 12 and 10 keV reachable at different detector distances.
approximate detector distance (mm)
|resolution (Å) at|
|12.0 keV||10 keV|
The CrMX project currently has access to a nanosecond Optical Parametric Oscillator (OPO) from EKSPLA (#model NT230-100-SH/SF-ATTN/FC). The pulse width has been measure to 3.2 ns at 100 Hz and 450 nm with an RMS of 3.8 %. The laser sits in the SwissFEL laser hutch and is fibre coupled to Cristallina via 70 m, 100 µm multimode fibres. Sample position pulse energies have varied with wavelength with 2-5 µJ being the upper limit. The best sample focus so far achieved was 25 x 25 µm2 (1/e2) at 470 nm.