327-2210-00L Thin Films Technology - From Fundamentals to Oxide Electronics

SemesterFall Semester 2026
LecturersC. W. Schneider and M. Trassin
Periodicityyearly course
ECTS Points5 ECTS Points can be obtained
Time

Tue 15:45-17:30; 

Thu 09:45-11:30 

Location

Tue: HIL E8; 

Thu: HPT C 103

Lecture Notesare available on Moodle
Date 2026TopicLecturer
Sept. 15General IntroductionTrassin/Schneider
Sept. 17Fundamentals I (Diffusion and Nucleation)C. W. Schneider
Sept. 22Fundamentals II (Coalescence and Film formation)C. W. Schneider
Sept. 24Growth mode & PVD - SputteringM. Trassin
Sept. 29Fundamentals III (Epitaxy) C. W. Schneider
Oct. 01RF sputtering; thermal evaporation - MBEM. Trassin
Oct. 06PVD - PLD; Student presentationsSchneider/Yan
Oct. 08PLD IIC. W. Schneider
Oct. 13Lab visit & Lecture about vacuum and vac. technology (1h) Trassin/Gillioz/Schneider
Oct. 15Lab visit & Lecture about vacuum and vac. technology (1h) Trassin/Gillioz/Schneider
Oct. 20CVDC.W. Schneider
Oct. 22CVD II; Presentation assignmentsSchneider/Yan/Trassin
Oct. 27Non-Vac. techniques (Spray Pyrolysis - Sol Gel) C.W. Schneider
Oct. 29TF characterization I (Scanning Probe, TEM) , Student presentationsSchneider/Yan/Gillioz/Trassin
Nov. 03TF characterization II C.W. Schneider
Nov. 05TF characterization IIIC.W. Schneider
Nov. 10Struct. charact XRD, RHEED, Ferroic IM. Trassin
Nov. 12Ferroic IIM. Trassin
Nov. 17MF type IM. Trassin
Nov. 19MF II & probing FE IM. Trassin
Nov. 24TF characterization IVC. W. Schneider
Nov. 26TF characterization VC. W. Schneider
Dec. 01Probing FE IIM. Trassin
Dec. 03MF III & probing FE IM. Trassin
Dec. 08Device concepts IM. Trassin
Dec. 10Device concepts IIM. Trassin
Dec. 15Q&ATrassin/Schneider
Dec. 17written exam, Loc: tbt; Time: 9:45-11:30Trassin/Schneider/Yan

 

Exam:
The written exam will be in English lasting 90 min. No accessories are allowed. 

Planned are:

 

  • Possible visit to PSI with a lab tour, including the large facilities (synchrotron-SLS)-on request