Semester | Fall Semester 2024 |
---|---|
Lecturers | C. W. Schneider and M. Trassin |
Periodicity | yearly course |
ECTS Points | 5 ECTS Points can be obtained |
Time | Tue 15:45-17:30; Thu 09:45-11:30 |
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Location | Tue: HCI D8; Thu: HCI D2 |
Lecture Notes | are available |
Date 2024 | Topic | Lecturer |
---|---|---|
Sept. 17 | General Introduction | Trassin/Schneider |
Sept. 19 | Fundamentals I | C. W. Schneider |
Sept. 24 | Fundamentals II (Nucleation) | C. W. Schneider |
Sept. 26 | Fundamentals III (Epitaxy) | C. W. Schneider |
Oct. 01 | Growth mode & PVD - sputtering | M. Trassin |
Oct. 03 | RF sputtering; evap/MBE | M. Trassin |
Oct. 08 | PVD - PLD | Schneider/Yan |
Oct. 10 | CVD | C. W. Schneider |
Oct. 15 | Lab visit | Trassin/Yan |
Oct. 17 | Lab visit | Trassin/Yan |
Oct. 22 | Lab visit | Trassin/Yan |
Oct. 24 | Non-Vacuum technique | C. W. Schneider |
Oct. 29 | Struct. charact XRD | M. Trassin |
Oct. 31 | RHEED, AFM, Ferroic I | M. Trassin |
Nov. 05 | Ferroic II | M. Trassin |
Nov. 07 | MF type I | M. Trassin |
Nov. 12 | MF II and probing FE I | M. Trassin |
Nov. 14 | Probing FE II | M. Trassin |
Nov. 19 | TF characterization I | C. W. Schneider |
Nov. 21 | TF characterization II | C. W. Schneider |
Nov. 26 | TF characterization III | C. W. Schneider |
Nov. 28 | TF characterization IV | C. W. Schneider |
Dec. 03 | TF characterization V | C. W. Schneider |
Dec. 05 | Microfabrication | C. W. Schneider |
Dec. 10 | Device concepts I | M. Trassin |
Dec. 12 | Device concepts II | M. Trassin |
Dec. 17 | Q&A | Trassin/Schneider |
Dec. 19 | written exam | Trassin/Schneider |
Exam:
The written exam will be in English lasting 90 min. No accessories are allowed. Due to the Corona pandemic, oral exams are the currently requested exam format. Possible dates for oral or written exams will be discussed in the first lecture, but most probably the exam will take place on May 30 or June 07/14.
Planned are:
- Possible visit to PSI with a lab tour, including the large facilities (synchrotron-SLS)-on request