327-2210-00L Thin Films Technology - From Fundamentals to Oxide Electronics

SemesterFall Semester 2026
LecturersC. W. Schneider and M. Trassin
Periodicityyearly course
ECTS Points5 ECTS Points can be obtained
Time

Tue 15:45-17:30; 

Thu 09:45-11:30 

Location

Tue: HIL E8; 

Thu: HPT C 103

Lecture Notesare available on Moodle
Date 2025TopicLecturer
Sept. 15General IntroductionTrassin/Schneider
Sept. 17Fundamentals IC. W. Schneider
Sept. 22Fundamentals II (Nucleation)C. W. Schneider
Sept. 24Growth mode & PVD - SputteringM. Trassin
Sept. 29Fundamentals III (Epitaxy) C. W. Schneider
Oct. 01RF sputtering; evap/MBEM. Trassin
Oct. 06PVD - PLD Schneider/Yan
Oct. 08CVDC. W. Schneider
Oct. 13Lab visitTrassin/Yan
Oct. 15Lab visitTrassin/Yan
Oct. 20Lab visit & Lecture 1h about VacuumTrassin/Yan/Schneider
Oct. 22CVD II; Presentation assignmentsSchneider/Yan/Trassin
Oct. 27Non-Vac. technique (Spray Pyrolysis - Sol Gel) C.W. Schneider
Oct. 29Struct. charact XRD, RHEED, Ferroic IM. Trassin
Nov. 03Ferroic IIM. Trassin
Nov. 05MF type IM. Trassin
Nov. 10MF II & probing FE IM. Trassin
Nov. 12Probing FE IIM. Trassin
Nov. 17TF characterization I (Scanning Probe, TEM)C. W. Schneider
Nov. 19TF characterization IIC. W. Schneider
Nov. 24TF characterization III; Presentation assignmentsSchneider/Yan/Trassin
Nov. 26TF characterization IVC. W. Schneider
Dec. 01TF characterization VC. W. Schneider
Dec. 03MF III & probing FE IM. Trassin
Dec. 08Device concepts IM. Trassin
Dec. 10Device concepts IIM. Trassin
Dec. 15Q&ATrassin/Schneider
Dec. 17written exam, Loc: tbt; Time: 9:45-11:30Trassin/Schneider/Yan

 

Exam:
The written exam will be in English lasting 90 min. No accessories are allowed. 

Planned are:

 

  • Possible visit to PSI with a lab tour, including the large facilities (synchrotron-SLS)-on request