327-2210-00L Thin Films Technology - From Fundamentals to Oxide Electronics

SemesterFall Semester 2025
LecturersC. W. Schneider and M. Trassin
Periodicityyearly course
ECTS Points5 ECTS Points can be obtained
Time

Tue 15:45-17:30; 

Thu 09:45-11:30 

Location

Tue: HIL E8; 

Thu: HPT C 130

Lecture Notesare available on Moodle
Date 2025TopicLecturer
Sept. 16General IntroductionTrassin/Schneider
Sept. 18Fundamentals IC. W. Schneider
Sept. 23Fundamentals II (Nucleation)C. W. Schneider
Sept. 25Fundamentals III (Epitaxy)C. W. Schneider
Sept. 30Growth mode & PVD - sputtering M. Trassin
Oct. 02RF sputtering; evap/MBEM. Trassin
Oct. 07PVD - PLD Schneider/Yan
Oct. 09CVDC. W. Schneider
Oct. 14Lab visitTrassin/Yan
Oct. 16Lab visitTrassin/Yan
Oct. 21Lab visit & Lecture 1h about VacuumTrassin/Yan/Schneider
Oct. 23CVD II; Presentation assignmentsSchneider/Yan/Trassin
Oct. 28Non-Vac. technique (Spray Pyrolysis - Sol Gel) C.W. Schneider
Oct. 30Struct. charact XRD, RHEED, Ferroic IM. Trassin
Nov. 04Ferroic IIM. Trassin
Nov. 06MF type IM. Trassin
Nov. 11MF II & probing FE IM. Trassin
Nov. 13Probing FE IIM. Trassin
Nov. 18TF characterization I (Scanning Probe, TEM)C. W. Schneider
Nov. 20TF characterization IIC. W. Schneider
Nov. 25TF characterization III; Presentation assignmentsSchneider/Yan/Trassin
Nov. 27TF characterization IVC. W. Schneider
Dec. 02TF characterization VC. W. Schneider
Dec. 04MF III & probing FE IM. Trassin
Dec. 09Device concepts IM. Trassin
Dec. 11Device concepts IIM. Trassin
Dec. 16Q&ATrassin/Schneider
Dec. 18written exam, Loc: HPT C 130; Time: 9:45-11:30Trassin/Schneider/Yan

 

Exam:
The written exam will be in English lasting 90 min. No accessories are allowed. 

Planned are:

 

  • Possible visit to PSI with a lab tour, including the large facilities (synchrotron-SLS)-on request