Skip to main content
  • DE
  • EN
  • FR
Paul Scherrer Institut (PSI) Paul Scherrer Institut (PSI)
Suche
Paul Scherrer Institut (PSI) Paul Scherrer Institut (PSI)

Hauptnavigation

  • Labs & User ServicesOpen mainmenu item
    • Overview
    • Research at PSI
    • Research Divisions and Labs
    • Facilities and Instruments
    • Research Initiatives
    • PSI User Labs
    • Scientific Highlights
    • Scientific Events
    • Scientific Career
    • Useroffice
  • VisitorsOpen mainmenu item
    • Overview
    • Contact
    • How to find us
    • Public Events
    • Visitor Centre psi forum
    • Schülerlabor iLab
    • Center for Proton Therapy
  • IndustryOpen mainmenu item
    • Overview
    • Technology Transfer
    • Spin-off Companies
    • PARK innovAARE
  • Our ResearchOpen mainmenu item
    • Current topics from our research
    • Matter and Material
    • Human Health
    • Energy and Environment
    • Large Research Facilities
    • Brochures
    • Films
    • Media Corner
  • Career & Further EducationOpen mainmenu item
    • Job Opportunities
    • Personnel Policy
    • Working at PSI
    • Equal Opportunities, Diversity & Inclusion
    • Training and Further Education
    • Vocational Training
    • PSI Education Centre
    • Support Program "PSI Career Return Program"
    • PSI-FELLOW/COFUND
  • About PSIOpen mainmenu item
    • PSI in brief
    • Strategy
    • Guiding principles
    • Facts and figures
    • Organisational structure
    • Suppliers and customers
    • Customers E-Billing
    • IT and Computing
    • Safety at PSI (in German)

You are here:

  1. PSI Home
  2. Labs & User Services
  3. PSD
  4. LSC
  5. Scientific Highlights and News
  6. X‐Ray Writing of Metallic Conductivity and Oxygen Vacancies at Silicon/SrTiO3 Interfaces

Secondary navigation

Laboratory for Condensed Matter (LSC)

  • About LSC
    • Organisational Structure
  • People
  • Research/Groups
  • Industrial Services
  • Scientific Highlights and News
  • Publications
8 April 2019

X‐Ray Writing of Metallic Conductivity and Oxygen Vacancies at Silicon/SrTiO3 Interfaces

Formation of the 2DEG at the Si/SrTiO3 interface
Fig. 1: DEG formed by X-ray irradiation of the Si/SrTiO3 interface.

Tunable electronic properties of transition-metal oxides and their interfaces offer remarkable functionalities for future devices. The interest in these materials has been boosted with the discovery of a highly mobile 2D electron gas (2DEG) at SrTiO3‐based interfaces. Oxygen vacancies in these systems play a crucial role in the emergence of interface conductivity and ferromagnetism. In this work, A. Chikina et al report a lithography‐like writing of a metallic state at the interface between SrTiO3 and amorphous Si using X‐ray irradiation. Combining transport techniques and operando photoemission spectroscopy at the ADRESS beamline of SLS, they discover that the X‐ray radiation induces transfer of oxygen from SrTiO3 to Si across the interface. This process leads to formation of oxygen vacancies in SrTiO3, which inject electrons into the interfacial 2DEG (see Fig. 1). As the interface oxygen vacancies are stabilized by the Si capping, the 2DEG formed in this way stays stable in ambient conditions. The study provides a fundamental understanding of X‐ray‐induced redox reactions at the SrTiO3‐based interfaces. In the device perspective, the X‐ray induced formation of oxygen vacancies may provide means for the spatially controlled superconductivity, magnetism, and memristive functionalities in oxide heterostructures.

Contact

Dr. Vladimir Strokov
Spectroscopy of Novel Materials Group
Paul Scherrer Institute, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland
Telephone: +41 56 310 53 11
E-mail: vladimir.strocov@psi.ch

Original Publication

X‐Ray Writing of Metallic Conductivity and Oxygen Vacancies at Silicon/SrTiO3 Interfaces
A. Chikina, M. Caputo, M. Naamneh, D.V. Christensen, T. Schmitt, M. Radovic & V.N. Strocov
Advanced Functional Materials, Volume 29, Issue 25, 21 June 2019
DOI: https://doi.org/10.1002/adfm.201900645

Sidebar

NUM Scientific Highlights

Archive


PSI Scientific Reports

Archive 2006-2012. The Scientific Reports – containing accounts of research topics from all the different areas – provide an impression of the variety of subjects researched at PSI.

top

Footer

Paul Scherrer Institut

Forschungsstrasse 111
5232 Villigen PSI
Switzerland
How to find us

Imprint
Terms and Conditions

Login

Telephone: +41 56 310 21 11
Telefax: +41 56 310 21 99
Contact form

Visitor Centre psi forum
School Lab iLab (in German)
Center for Proton Therapy

Follow us: Twitter (in English) LinkedIn Youtube Issuu RSS

Quicklinks

  • Phone Book/People Search
  • Digital User Office
  • Technology transfer
  • PSI Publications
  • Computing
  • Safety (in German)
  • Job Opportunities
  • Vocational Training (in German)
  • Suppliers
  • Customers E-Billing
  • PSI Guest House
  • PSI Gastronomie (in German)

For the media

  • Media Contact
  • Media Releases
  • Social Media Newsroom
  • Facts and Figures
  • PSI in brief
  • Films
  • DE
  • EN
  • FR