Dr. Shih-Wen Huang
Shih-Wen Huang is a staff scientist at the Swiss Light Source. She is responsible for the operation of the surface diffraction end-station.
5232 Villigen PSI
Shih-Wen Huang is a staff scientist at the Swiss Light Source. She obtained her Ph. D in Electrophysics from National Chiao-Tung University (Taiwan) in 2010. Afterward, he worked as a postdoctoral research fellow at Swiss Light Source, then she moved to Advanced Light Source at Lawrence Berkeley National Laboratory in Berkeley, California for her second postdoctoral work.
In 2015, she join MAX IV as a staff scientist, where she had heavily involved in the installing, construction, and commission of the high-resolution resonant inelastic x-ray scattering beamline.
Currently, she is one of the staff scientists in the Material Science beamline. She is responsible for the operation of the surface diffraction end-station.
Shih-Wen Huang is interested in using synchrotron-based spectroscopic and scattering techniques, such as soft x-ray absorption (XAS), spin-selective x-ray absorption, resonant and non-resonant inelastic x-ray scattering (RIXS, IXS), resonant soft x-ray magnetic scattering (RXS), as well as time-resolved soft and hard x-ray scattering spectroscopies, to study strongly correlated electron systems that exhibit emergent properties (e.g. complex oxides)