List of Publications of the LMN


Papers Published 2018

  • 1D-Full Field Microscopy of Elastic and Inelastic Scattering with Transmission off-axis Fresnel Zone Plates Döring F, Marschall F, Yin Z, Rösner B, Beye M, Miedema P, Kubicek K, Glaser L, Raiser D, Soltau J, Guzenko VA, Viefhaus J, Buck J, Risch M, Techert S, David C
    MICROSCOPY AND MICROANALYSIS 24, 184 (2018).
    DOI: 10.1017/S1431927618013260
  • 7 nm Spatial Resolution in Soft X-ray Microscopy Rösner B, Koch F, Döring F, Guzenko Vitaliy A, Meyer M, Ornelas Joshua L, Späth A, Fink Rainer H, Stanescu S, Swaraj S, Belkhou R, Watts B, Raabe J, David C
    MICROSCOPY AND MICROANALYSIS 24, 272 (2018).
    DOI: 10.1017/S1431927618013697
  • A Compact High-Brightness Accelerator-based EUV Source for Actinic Mask Inspection Garvey T, Ekinci Y, Rivkin L, Streun A, Wrulich A
    OSA Technical Digest , (2018).
    DOI: 10.1364/EUVXRAY.2018.ET3B.5
  • A Two-Dimensional Polymer Synthesized at the Air/Water Interface Muller Vivian, Hinaut Antoine, Moradi Mina, Baljozovic Milos, Jung Thomas A, Shahgaldian Patrick, Moehwald Helmuth, Hofer Gregor, Kroger Martin, King Benjamin T, Meyer Ernst, Glatzel Thilo, Schluter A Dieter
    ANGEWANDTE CHEMIE-INTERNATIONAL EDITION 57, 10584-10588 (2018).
    DOI: 10.1002/anie.201804937
  • A comparative study of EUV absorber materials using lensless actinic imaging of EUV photomasks Ekinci Y, Kazazis D, Rajendran R, Helfenstein P, Mochi I, Fernandez S, Yoshitake S
    Extreme Ultraviolet (EUV) Lithography IX , (2018).
    DOI: 10.1117/12.2297381
  • A high-brightness accelerator-based EUV source for metrology applications Rivkin L, Wrulich A, Streun A, Garvey T, Ekinci Y
    Photomask Technology 2018 , (2018).
    DOI: 10.1117/12.2501930
  • Adsorbate-Induced Modification of the Confining Barriers in a Quantum Box Array Nowakowska Sylwia, Mazzola Federico, Alberti Mariza N, Song Fei, Voigt Tobias, Nowakowski Jan, Wackerlin Aneliia, Wackerlin Christian, Wiss Jerome, Schweizer W Bernd, Broszio Max, Polley Craig, Leandersson Mats, Fatayer Shadi, Ivas Toni, Baljozovic Milos, Mousavi S Fatemeh, Ahsan Aisha, Nijs Thomas, Popova Olha, Zhang Jun, Muntwiler Matthias, Thilgen Carlo, Stohr Meike, Pasti Igor A, Skorodumova Natalia V, Diederich Francois, Wells Justin, Jung Thomas A
    ACS Nano 12, 768-778 (2018).
    DOI: 10.1021/acsnano.7b07989
  • Advances in indirect detector systems for ultra high-speed hard X-ray imaging with synchrotron light Olbinado M P, Grenzer J, Pradel P, De Resseguier T, Vagovic P, Zdora M C, Guzenko V A, David C, Rack A
    JOURNAL OF INSTRUMENTATION 13, C04004 (2018).
    DOI: 10.1088/1748-0221/13/04/C04004
  • All-dielectric metasurface-based roll-angle sensor Chen X, Tao Z, Chen C, Wang C, Wang L, Jiang H, Fan D, Ekinci Y, Liu S
    Sensors and Actuators A: Physical 279, 509 (2018).
    DOI: 10.1016/j.sna.2018.06.058
  • Beam drift and partial probe coherence effects in EUV reflective-mode coherent diffractive imaging Helfenstein Patrick, Rajeev Rajendran, Mochi Iacopo, Kleibert Armin, Vaz C A F, Ekinci Yasin
    OPTICS EXPRESS 26, 12242-12256 (2018).
    DOI: 10.1364/OE.26.012242
  • Benchmarking surface selective vacuum ultraviolet and thermal postprocessing of thermoplastics for ultrasmooth 3-D-printed micro-optics Kirchner R, Schift H, Chidambaram N
    OPTICAL ENGINEERING 57, 1 (2018).
    DOI: 10.1117/1.OE.57.4.041403
  • Beyond 100 nm resolution in 3D laser lithography - Post processing solutions Seniutinas G, Weber A, Padeste C, Sakellari I, Farsari M, David C
    MICROELECTRONIC ENGINEERING 191, 25-31 (2018).
    DOI: 10.1016/j.mee.2018.01.018
  • Changes in the near edge x-ray absorption fine structure of hybrid organic?inorganic resists upon exposure Fallica R, Watts B, Rösner B, Della Giustina G, Brigo L, Brusatin G, Ekinci Y
    NANOTECHNOLOGY 29, 36LT03 (2018).
    DOI: 10.1088/1361-6528/aaccd4
  • Characterization of a two-channel, high resolution hard x-ray microscope using Fresnel zone plates for laser-plasma interaction experiments Do A, Briat M, Chaleil A, Rubbelynck C, Lebugle M, David C, Troussel P
    REVIEW OF SCIENTIFIC INSTRUMENTS 89, 10G122 (2018).
    DOI: 10.1063/1.5039326
  • Chemically-amplified EUV resists approaching 11 nm half-pitch Tasdemir Z, Vockenhuber M, Mochi I, Garrido Olvera K, Meeuwissen M, Yildirim O, Hoefnagels R, Rispens G, Custers R, Ekinci Y
    Extreme Ultraviolet (EUV) Lithography IX 10583, 105831W (2018).
    DOI: 10.1117/12.2299643
  • Clogging in staked-in needle pre-filled syringes (SIN-PFS): Influence of water vapor transmission through the needle shield De Bardi M, Müller R, Grünzweig C, Mannes D, Rigollet M, Bamberg F, Jung TA, Yang K
    EUROPEAN JOURNAL OF PHARMACEUTICS AND BIOPHARMACEUTICS 127, 104 (2018).
    DOI: 10.1016/j.ejpb.2018.02.016
  • Coherent Hard X-ray Multiprojection Imaging Villanueva-Perez P, Pedrini B, Mokso R, Vagovic P, Guzenko V, Leake S, Willmott PR, David C, Chapman HN, Stampanoni M
    MICROSCOPY AND MICROANALYSIS 24, 52 (2018).
    DOI: 10.1017/S1431927618012680
  • Demonstration of femtosecond X-ray pump X-ray probe diffraction on protein crystals Opara Nadia L, Mohacsi I, Makita M, Castano-Diez D, Diaz A, Juranic P, Marsh M, Meents A, Milne Christopher J, Mozzanica A, Padeste C, Panneels V, Sikorski M, Song S, Stahlberg H, Vartiainen I, Vera L, Wang M, Willmott Philip R, David C
    STRUCTURAL DYNAMICS 5, 054303 (2018).
    DOI: 10.1063/1.5050618
  • Design considerations of a hollow microneedle-optofluidic biosensing platform incorporating enzyme-linked assays Ranamukhaarachchi S, Padeste C, Häfeli U, Stoeber B, Cadarso V
    JOURNAL OF MICROMECHANICS AND MICROENGINEERING 28, 024002 (2018).
    DOI: 10.1088/1361-6439/aa9c9c
  • Diamond: a gem for micro-optics Seniutinas G, Brasselet E, Balcytis A, David C, Juodkazis S
    MATERIALS TODAY 21, 798 (2018).
    DOI: 10.1016/j.mattod.2018.08.001
  • Diffractive X-ray Optics for Synchrotrons and Free-Electron Lasers David C, Rösner B, Döring F, Guzenko V, Koch F, Lebugle M, Marschall F, Seniutinas G, Raabe J, Watts B, Grolimund D, Yin Z, Beye M, Techert S, Viefhaus J, Falkenberg G, Schroer C
    MICROSCOPY AND MICROANALYSIS 24, 268 (2018).
    DOI: 10.1017/S1431927618013673
  • Dual-tone Application of a Tin-Oxo Cage Photoresist Under E-beam and EUV Exposure Zhang Yu, Haitjema Jarich, Baljozovic Milos, Vockenhuber Michaela, Kazazis Dimitrios, Jung Thomas A, Ekinci Yasin, Brouwer Albert M
    JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY 31, 249-255 (2018).
  • Dynamic imaging of the delay- and tilt-free motion of Néel domain walls in perpendicularly magnetized superlattices Finizio S, Wintz S, Zeissler K, Sadovnikov A, Mayr S, Nikitov S, Marrows C, Raabe J
    NANO LETTERS -, acs.nanolett.8b04091 (2018).
    DOI: 10.1021/acs.nanolett.8b04091
  • Electrostatic Interaction across a Single-Layer Carbon Shell Stania R, Seitsonen A P, Kunhardt D, Buechner B, Popov A A, Muntwiler M, Greber T
    JOURNAL OF PHYSICAL CHEMISTRY LETTERS 9, 3586-3590 (2018).
    DOI: 10.1021/acs.jpclett.8b01326
  • Evaluation of EUV resists for 5nm technology node and beyond Wang X, Ekinci Y, Hoefnagels R, Rispens G, Custers R, Meeuwissen M, van LentProtasova L, Mochi I, Tasdemir Z
    International Conference on Extreme Ultraviolet Lithography 2018 , (2018).
    DOI: 10.1117/12.2502688
  • Exploiting atomic layer deposition for fabricating sub-10 nm X-ray lenses Rösner B, Koch F, Döring F, Bosgra J, Guzenko Vitaliy A, Kirk E, Meyer M, Ornelas Joshua L, Fink Rainer H, Stanescu S, Swaraj S, Belkhou R, Watts B, Raabe J, David C
    MICROELECTRONIC ENGINEERING 191, 91 (2018).
    DOI: 10.1016/j.mee.2018.01.033
  • Extreme-Ultraviolet Vortices at a Free-Electron Laser Ribic P, Rösner B, Gauthier D, Döring F, Masciovecchio C, Principi E, David C, De Ninno G
    MICROSCOPY AND MICROANALYSIS 24, 296 (2018).
    DOI: 10.1017/S1431927618013806
  • Fourier ptychography for lithography high NA systems Ekinci Y, Evanschitzky P, Erdmann A, Dejkameh A
    Computational Optics II , (2018).
    DOI: 10.1117/12.2311332
  • Full-Field Hard X-Ray Microscope Designed for Materials Science Applications Greving I, Flenner S, Larsson E, Storm M, Wilde F, Lilleodden E, Dose T, Burmester H, Lottermoser L, David C, Beckmann F
    MICROSCOPY AND MICROANALYSIS 24, 228 (2018).
    DOI: 10.1017/S143192761801348X
  • Generation and measurement of sub-micrometer relativistic electron beams Borrelli S, Orlandi G, Bednarzik M, David C, Ferrari E, Guzenko VA, Ozkan-Loch C, Prat E, Ischebeck R
    Communications Physics 1, 52 (2018).
    DOI: 10.1038/s42005-018-0048-x
  • High-intensity x-ray microbeam for macromolecular crystallography using silicon kinoform diffractive lenses Lebugle M, Dworkowski F, Pauluhn A, Guzenko Vitaliy A, Romano L, Meier N, Marschall F, Sanchez D, Grolimund D, Wang M, David C
    APPLIED OPTICS 57, 9032 (2018).
    DOI: 10.1364/AO.57.009032
  • High-resolution EUV lithography using a multi-trigger resist Ekinci Y, Theis W, Roth J, Dawson G, McClelland A, Kazazis D, Popescu C, Robinson Alex PG
    Extreme Ultraviolet (EUV) Lithography IX , (2018).
    DOI: 10.1117/12.2297406
  • Hybrid Detectors for High Resolution Imaging. Bergamaschi A, Andra M, Barten R, Bruckner M, Chiriotti S, David C, Dinapoli R, Frojdh E, Greiffenberg D, Lebugle M, Lopez-Cuenca C, Mezza D, Mozzanica A, Ramilli M, Redford S, Ruder C, Schmitt B, Shi X, Thattil D, Tinti G, Vetter S, Zhang J
    MICROSCOPY AND MICROANALYSIS 24, 320 (2018).
    DOI: 10.1017/S1431927618013910
  • Improving the resolution and throughput of achromatic Talbot lithography Kazazis D, Tseng L, Ekinci Y
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 36, 06J501 (2018).
    DOI: 10.1116/1.5048506
  • In-operando soft X-ray microspectroscopy of organic electronics devices Fink R, Rösner B, Du X, Späth A, Johnson M, Hawly T, Watts B, Raabe J, Gregoratti L, Amati M
    MICROSCOPY AND MICROANALYSIS 24, 424 (2018).
    DOI: 10.1017/S143192761801437X
  • Inspecting adaptive optics with at-wavelength wavefront metrology Mike? L, Patthey L, Wagner Ulrich H, Seaberg M, Seiboth F, Rau C, Cipiccia S, Batey D, Marathe S, Svetina C, Jaggi A, Koch F, David C, Vagovic P, Flechsig U, Krempasky Jura J
    Adaptive X-Ray Optics V , (2018).
    DOI: 10.1117/12.2320532
  • Model-free classification of X-ray scattering signals applied to image segmentation Lutz-Bueno V, Arboleda C, Leu L, Blunt MJ, Busch A, Georgiadis A, Bertier P, Schmatz J, Varga Z, Villanueva-Perez P, Wang Z, Lebugle M, David C, Stampanoni M, Diaz A, Guizar-Sicairos M, Menzel A
    JOURNAL OF APPLIED CRYSTALLOGRAPHY 51, 1378 (2018).
    DOI: 10.1107/S1600576718011032
  • Multi-trigger resist for electron beam and extreme ultraviolet lithography Roth J, Dawson G, McClelland A, Popescu C, Robinson Alex P, Theis W, Ekinci Y, Kazazis D
    34th European Mask and Lithography Conference , (2018).
    DOI: 10.1117/12.2316628
  • Nano-confinement of block copolymers in high accuracy topographical guiding patterns: modelling the emergence of defectivity due to incommensurability Gottlieb S, Kazazis D, Mochi I, Evangelio L, Fernández-Regúlez M, Ekinci Y, Perez-Murano F
    SOFT MATTER 14, 6799 (2018).
    DOI: 10.1039/C8SM01045E
  • Nanoimprint stamps with ultra-high resolution: Optimal fabrication techniques Graczyk Mariusz, Cattoni Andrea, Rosner Benedikt, Seniutinas Gediminas, Lofstrand Anette, Kvennefors Anders, Mailly Dominique, David Christian, Maximov Ivan
    MICROELECTRONIC ENGINEERING 190, 73-78 (2018).
    DOI: 10.1016/j.mee.2018.01.008
  • Nanotomography of Inverse Photonic Crystals Using Zernike Phase Contrast Flenner S, Larsson E, Furlan K, Laipple D, Storm M, Wilde F, Blick R, Schneider Gerold A, Zierold R, Janssen R, David C, Beckmann F, Muller M, Greving I
    MICROSCOPY AND MICROANALYSIS 24, 148 (2018).
    DOI: 10.1017/S1431927618013120
  • On the needle clogging of staked-in-needle pre-filled syringes: Mechanism of liquid entering the needle and solidification process De Bardi M, Müller R, Grünzweig C, Mannes D, Boillat P, Rigollet M, Bamberg F, Jung TA, Yang K
    EUROPEAN JOURNAL OF PHARMACEUTICS AND BIOPHARMACEUTICS 128, 272 (2018).
    DOI: 10.1016/j.ejpb.2018.05.006
  • On-Surface Growth Dynamics of Graphene Nanoribbons: The Role of Halogen Functionalization Di Giovannantonio M, Deniz O, Urgel José I, Widmer R, Dienel T, Stolz S, Sánchez-Sánchez C, Muntwiler M, Dumslaff T, Berger R, Narita A, Feng X, Müllen K, Ruffieux P, Fasel R
    ACS Nano 12, 74 (2018).
    DOI: 10.1021/acsnano.7b07077
  • Parallel and antiparallel angular momentum transfer of circularly polarized light to photoelectrons and Auger electrons at the Ni L3 absorption threshold Matsui F, Ota H, Sugita K, Muntwiler M, Stania R, Greber T
    PHYSICAL REVIEW B 97, 035424 (2018).
    DOI: 10.1103/PhysRevB.97.035424
  • Phase defect inspection on EUV masks using RESCAN Li-Teng T, Ekinci Y, Kazazis D, Helfenstein P, Mochi I, Fernandez S, Rajeev R
    International Conference on Extreme Ultraviolet Lithography 2018 , (2018).
    DOI: 10.1117/12.2502726
  • Photoacid generator?polymer interaction on the quantum yield of chemically amplified resists for extreme ultraviolet lithography Fallica R, Ekinci Y
    JOURNAL OF MATERIALS CHEMISTRY C 6, 7267 (2018).
    DOI: 10.1039/C8TC01446A
  • Pneumatically Controlled Nanofluidic Devices for Contact-Free Trapping and Manipulation of Nanoparticles Gerspach M, Mojarad N, Sharma D, Ekinci Y, Pfohl T
    PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION , 1800161 (2018).
    DOI: 10.1002/ppsc.201800161
  • Resolution extension by image summing in serial femtosecond crystallography of two-dimensional membrane-protein crystals Casadei Cecilia M, Tsai C, Barty A, Hunter Mark S, Zatsepin Nadia A, Padeste C, Capitani G, Benner WHenry, Boutet S, Hau-Riege Stefan P, Kupitz C, Messerschmidt M, Ogren John I, Pardini T, Rothschild Kenneth J, Sala L, Segelke B, Williams Garth J, Evans James E, Li X, Coleman M, Pedrini B, Frank M
    IUCRJ 5, 103 (2018).
    DOI: 10.1107/S2052252517017043
  • Resonant inelastic x-ray scattering studies of magnons and bimagnons in the lightly doped cuprate La2-xSrxCuO4 Chaix L, Huang EW, Gerber S, Lu X, Jia C, Huang Y, McNally DE, Wang Y, Vernay FH, Keren A, Shi M, Moritz B, Shen ZX, Schmitt T, Devereaux TP, Lee WS
    PHYSICAL REVIEW B 97, 155144 (2018).
    DOI: 10.1103/PhysRevB.97.155144
  • Robustness of the charge-ordered phases in IrTe2 against photoexcitation Monney C, Schuler A, Jaouen T, Mottas ML, Wolf Th, Merz M, Muntwiler M, Castiglioni L, Aebi P, Weber F, Hengsberger M
    PHYSICAL REVIEW B 97, 075110 (2018).
    DOI: 10.1103/PhysRevB.97.075110
  • STXMdeconv - a MATLAB Script for the Deconvolution of STXM Images Ornelas J, Rosner B, Spath A, Fink Rainer H
    MICROSCOPY AND MICROANALYSIS 24, 122 (2018).
    DOI: 10.1017/S1431927618012990
  • Scanning Hard X-Ray Microscopy Based on Be CRLs Schropp A, Bruckner D, Bulda J, Falkenberg G, Garrevoet J, Seiboth F, Wittwer F, Koch F, David C, Schroer Christian G
    MICROSCOPY AND MICROANALYSIS 24, 188 (2018).
    DOI: 10.1017/S1431927618013284
  • Site- and spin-dependent coupling at the highly ordered h -BN/Co(0001) interface Usachov Dmitry Yu, Tarasov Artem V, Bokai Kirill A, Shevelev Viktor O, Vilkov Oleg Yu, Petukhov Anatoly E, Rybkin Artem G, Ogorodnikov Ilya I, Kuznetsov Mikhail V, Muntwiler M, Matsui F, Yashina Lada V, Laubschat C, Vyalikh Denis V
    PHYSICAL REVIEW B 98, 195438 (2018).
    DOI: 10.1103/PhysRevB.98.195438
  • Status of the PolLux STXM Beamline. Watts B, Finizio S, Witte K, Langer M, Mayr S, Wintz S, Sarafimov B, Raabe J
    MICROSCOPY AND MICROANALYSIS 24, 476 (2018).
    DOI: 10.1017/S1431927618014617
  • Sub-10 nm electron and helium ion beam lithography using a recently developed alumina resist Cattoni Andrea, Mailly Dominique, Dalstein Olivier, Faustini Marco, Seniutinas Gediminas, Roesner Benedikt, David Christian
    MICROELECTRONIC ENGINEERING 193, 18-22 (2018).
    DOI: 10.1016/j.mee.2018.02.015
  • SwissFEL Aramis beamline photon diagnostics Juranic P, Rehanek J, Arrell Christopher A, Pradervand C, Ischebeck R, Erny C, Heimgartner P, Gorgisyan I, Thominet V, Tiedtke K, Sorokin A, Follath R, Makita M, Seniutinas G, David C, Milne Christopher J, Lemke H, Radovic M, Hauri Christoph P, Patthey L
    JOURNAL OF SYNCHROTRON RADIATION 25, 1238 (2018).
    DOI: 10.1107/S1600577518005775
  • The 4 pi k(z) periodicity in photoemission from graphite Matsui Fumihiko, Nishikawa Hiroaki, Daimon Hiroshi, Muntwiler Matthias, Takizawa Masaru, Namba Hidetoshi, Greber Thomas
    PHYSICAL REVIEW B 97, 045430 (2018).
    DOI: 10.1103/PhysRevB.97.045430
  • The ACHIP experimental chambers at the Paul Scherrer Institut Ferrari E, Ischebeck R, Bednarzik M, Bettoni S, Borrelli S, Braun H, Calvi M, David C, Dehler M, Frei F, Garvey T, Guzenko Vitaliy A, Hiller N, Hommelhoff P, McNeur J, Orlandi G, Ozkan-Loch C, Prat E, Reiche S, Romann A, Sarafinov B, Rivkin L
    Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Dectectors and Associated Equipment 907, 244 (2018).
    DOI: 10.1016/j.nima.2018.02.112
  • The Diamond I13-2 Transmission X-ray Microscope: Current Status and Future Developments Storm M, Cipiccia S, Marathe S, Kuppili VSC, Doring F, David C, Rau C
    MICROSCOPY AND MICROANALYSIS 24, 218 (2018).
    DOI: 10.1017/S1431927618013430
  • The Different Faces of 4?-Pyrimidinyl-Functionalized 4,2?:6?,4??-Terpyridines: Metal?Organic Assemblies from Solution and on Au(111) and Cu(111) Surface Platforms Nijs T, Klein YMaximilian, Mousavi SFatemeh, Ahsan A, Nowakowska S, Constable Edwin C, Housecroft Catherine E, Jung Thomas A
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY 140, 2933 (2018).
    DOI: 10.1021/jacs.7b12624
  • The MÖNCH Detector for Soft X-ray, High-Resolution, and Energy Resolved Applications Bergamaschi A, Andrä M, Barten R, Borca C, Brückner M, Chiriotti S, Dinapoli R, Fröjdh E, Greiffenberg D, Huthwelker T, Kleibert A, Langer M, Lebugle M, Lopez-Cuenca C, Mezza D, Mozzanica A, Raabe J, Redford S, Ruder C, Scagnoli V, Schmitt B, Shi X, Staub U, Thattil D, Tinti G, Vaz CF, Vetter S, Vila-Comamala J, Zhang J
    SYNCHROTRON RADIATION NEWS 31, 11 (2018).
    DOI: 10.1080/08940886.2018.1528428
  • The impact of the structure of graphene-based materials on the removal of organophosphorus pesticides from water Lazarevic-Pasti Tamara, Anicijevic Vladan, Baljozovic Milos, Anicijevic Dragana Vasic, Gutic Sanjin, Vasic Vesna, Skorodumova Natalia V, Pasti Igor A
    ENVIRONMENTAL SCIENCE-NANO 5, 1482-1494 (2018).
    DOI: 10.1039/c8en00171e
  • Thick permalloy films for the imaging of spin texture dynamics in perpendicularly magnetized systems Finizio S, Wintz S, Bracher D, Kirk E, Semisalova AS, Förster J, Zeissler K, Wessels T, Weigand M, Lenz K, Kleibert A, Raabe J
    PHYSICAL REVIEW B 98, 104415 (2018).
    DOI: 10.1103/PhysRevB.98.104415
  • Through-pellicle inspection of EUV masks Yasin E, Kazazis D, Fernandez S, Rajeev R, Helfenstein P, Mochi I
    Extreme Ultraviolet (EUV) Lithography IX , (2018).
    DOI: 10.1117/12.2297436
  • Ti, Zr, and Hf-based molecular hybrid materials as EUV photoresists Jung T, Ekinci Y, Vockenhuber M, Kazazis D, Portale G, Baljozovic M, Wu L, Castellanos Ortega S
    Extreme Ultraviolet (EUV) Lithography IX , (2018).
    DOI: 10.1117/12.2297167
  • Toward Hard X-ray Transmission Microscopy at the ANATOMIX Beamline of Synchrotron SOLEIL Scheel M, Perrin J, Koch F, Yurgens V, Le Roux V, Giorgetta J, Desjardins K, Menneglier C, Zhang S, Engblom C, Abiven Y, Cauchon G, Bourgoin C, Lestrade A, Moreno T, Polack F, David C, Weitkamp T
    MICROSCOPY AND MICROANALYSIS 24, 248 (2018).
    DOI: 10.1017/S1431927618013582
  • Transmission low-energy electron diffraction using double-gated single nanotip field emitter Lee C, Tsujino S, Miller RJDwayne
    APPLIED PHYSICS LETTERS 113, 013505 (2018).
    DOI: 10.1063/1.5030889
  • Transverse structure of the wave function of field emission electron beam determined by intrinsic transverse energy Tsujino S
    JOURNAL OF APPLIED PHYSICS 124, 044304 (2018).
    DOI: 10.1063/1.5035284
  • Ultra-sensitive EUV resists based on acid-catalyzed polymer backbone breaking Kazazis D, Ekinci Y, Manouras T, Koufakis E, Argitis P, Vamvakaki M
    Extreme Ultraviolet (EUV) Lithography IX , (2018).
    DOI: 10.1117/12.2299853
  • Understanding the thermo-mechanical behaviour of solid oxide fuel cell anodes using synchrotron X-ray diffraction Heenan TMM, Robinson JB, Lu X, Tjaden B, Cervellino A, Bailey JJ, Brett DJL, Shearing PR
    SOLID STATE IONICS 314, 156 (2018).
    DOI: 10.1016/j.ssi.2017.10.025
Top

Papers Published 2017

  • "Non-destructive" dimensional metrology of EUV resist gratings (Conference Presentation) Kline RJoseph, Sunday Daniel F, Windover D, Kulmala Tero S, Ekinci Y
    SPIE ADVANCED LITHOGRAPHY , (2017).
    DOI: 10.1117/12.2257690
  • A two-step method for fast and reliable EUV mask metrology Helfenstein P, Mochi I, Rajendran R, Yoshitake S, Ekinci Y
    SPIE ADVANCED LITHOGRAPHY , (2017).
    DOI: 10.1117/12.2259961
  • Absorption coefficient and exposure kinetics of photoresists at EUV Fallica R, Haitjema J, Wu L, Castellanos S, Brouwer F, Ekinci Y
    SPIE ADVANCED LITHOGRAPHY , (2017).
    DOI: 10.1117/12.2257240
  • Actinic inspection of EUV reticles with arbitrary pattern design Fernandez S, Rajendran R, Yoshitake S, Kazazis D, Ekinci Y, Helfenstein P, Mochi I
    International Conference on Extreme Ultraviolet Lithography 2017 , (2017).
    DOI: 10.1117/12.2280528
  • Adjustable sidewall slopes by electron-beam exposure layout Kaspar C, Butschke J, Irmscher M, Martens S, Sailer H, Kirchner R, Guzenko Vitaliy A, Schift H, Burghartz Joachim N
    Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 35, 06G501 (2017).
    DOI: 10.1116/1.4993724
  • Advanced development techniques for metal-based EUV resists Hotalen J, Murphy M, Earley W, Vockenhuber M, Ekinci Y, Freedman Daniel A, Brainard Robert L
    SPIE ADVANCED LITHOGRAPHY , (2017).
    DOI: 10.1117/12.2258126
  • Analysis of Thin Thermal Oxides on (0001) SiC Epitaxial Layers Woerle J, Camarda M, Schneider CW, Sigg H, Grossner U, Gobrecht J
    MATERIALS SCIENCE FORUM 897, 119 (2017).
    DOI: 10.4028/www.scientific.net/MSF.897.119
  • CHIMIA News
    CHIMIA International Journal for Chemistry 71, 1 (2017).
    DOI: 10.2533/chimia.2017.1
  • Catalyst support effects on hydrogen spillover Karim W, Spreafico C, Kleibert A, Gobrecht J, VandeVondele J, Ekinci Y, van Bokhoven JA
    NATURE 541, 68 (2017).
    DOI: 10.1038/nature20782
  • Chemical changes in hybrid photoresists before and after exposure by in situ NEXAFS analysis Fallica R, Watts B, Della Giustina G, Brigo L, Brusatin G, Ekinci Y
    SPIE ADVANCED LITHOGRAPHY , (2017).
    DOI: 10.1117/12.2258215
  • Coherent diffractive imaging methods for semiconductor manufacturing Helfenstein P, Mochi I, Rajeev R, Fernandez S, Ekinci Y
    Advanced Optical Technologies 6, (2017).
    DOI: 10.1515/aot-2017-0052
  • Contrast matching of line gratings obtained with NXE3XXX and EUV- interference lithography Tasdemir Z, Mochi I, Olvera K, Meeuwissen M, Rispens G, Hoefnagels R, Custers R, Yildirim O, Fallica R, Vockenhuber M, Ekinci Y
    International Conference on Extreme Ultraviolet Lithography 2017 10450, 104501T (2017).
    DOI: 10.1117/12.2280541
  • Control of the gyration dynamics of magnetic vortices by the magnetoelastic effect Finizio S, Wintz S, Kirk E, Suszka AK, Gliga S, Wohlhueter P, Zeissler K, Raabe J
    PHYSICAL REVIEW B 96, 054438 (2017).
    DOI: 10.1103/PhysRevB.96.054438
  • Direct protein crystallization on ultrathin membranes for diffraction measurements at X-ray free-electron lasers Opara N, Martiel I, Arnold Stefan A, Braun T, Stahlberg H, Makita M, David C, Padeste C
    JOURNAL OF APPLIED CRYSTALLOGRAPHY 50, 909 (2017).
    DOI: 10.1107/S1600576717005799
  • Effect of isopropanol on gold assisted chemical etching of silicon microstructures Romano L, Vila-Comamala J, Jefimovs K, Stampanoni M
    MICROELECTRONIC ENGINEERING 177, 59 (2017).
    DOI: 10.1016/j.mee.2017.02.008
  • Electronic band structure of the buried SiO 2 /SiC interface investigated by soft x-ray ARPES Woerle J, Bisti F, Husanu MA, Strocov VN, Schneider CW, Sigg H, Gobrecht J, Grossner U, Camarda M
    APPLIED PHYSICS LETTERS 110, 132101 (2017).
    DOI: 10.1063/1.4979102
  • Emergent dynamic chirality in a thermally driven artificial spin ratchet Gliga S, Hrkac G, Donnelly C, Büchi J, Kleibert A, Cui J, Farhan A, Kirk E, Chopdekar Rajesh V, Masaki Y, Bingham Nicholas S, Scholl A, Stamps Robert L, Heyderman Laura J
    NATURE MATERIALS 16, 1106 (2017).
    DOI: 10.1038/nmat5007
  • Enhanced thermal stability of a polymer solar cell blend induced by electron beam irradiation in the transmission electron microscope Bäcke O, Lindqvist C, de Zerio Mendaza A, Gustafsson S, Wang E, Andersson Mats R, Müller C, Kristiansen P, Olsson E
    ULTRAMICROSCOPY 173, 16 (2017).
    DOI: 10.1016/j.ultramic.2016.11.017
  • Extreme ultraviolet patterning of tin-oxo cages Haitjema J, Zhang Y, Vockenhuber M, Kazazis D, Ekinci Y, Brouwer Albert M
    SPIE ADVANCED LITHOGRAPHY , (2017).
    DOI: 10.1117/12.2257911
  • Extreme ultraviolet patterning of tin-oxo cages Brouwer Albert M, Ekinci Y, Kazazis D, Vockenhuber M, Zhang Y, Haitjema J
    Journal of Micro/Nanolithography, MEMS, and MOEMS 16, 1 (2017).
    DOI: 10.1117/1.JMM.16.3.033510
  • Extreme-Ultraviolet Vortices from a Free-Electron Laser Rebernik Ribi? P, Rösner B, Gauthier D, Allaria E, Döring F, Foglia L, Giannessi L, Mahne N, Manfredda M, Masciovecchio C, Mincigrucci R, Mirian N, Principi E, Roussel E, Simoncig A, Spampinati S, David C, De Ninno G
    PHYSICAL REVIEW X 7, 031036 (2017).
    DOI: 10.1103/PhysRevX.7.031036
  • Fabrication of diamond diffraction gratings for experiments with intense hard x-rays Makita M, Karvinen P, Guzenko VA, Kujala N, Vagovic P, David C
    MICROELECTRONIC ENGINEERING 176, 75 (2017).
    DOI: 10.1016/j.mee.2017.02.002
  • Femtosecond electron-phonon lock-in by photoemission and x-ray free-electron laser Gerber S, Yang S-L, Zhu D, Soifer H, Sobota J A, Rebec S, Lee J J, Jia T, Moritz B, Jia C, Gauthier A, Li Y, Leuenberger D, Zhang Y, Chaix L, Li W, Jang H, Lee J-S, Yi M, Dakovski G L, Song S, Glownia J M, Nelson S, Kim K W, Chuang Y-D, Hussain Z, Moore R G, Devereaux T P, Lee W-S, Kirchmann P S, Shen Z-X
    SCIENCE 357, 71 (2017).
    DOI: 10.1126/science.aak9946
  • From pH- to Light-Response: Postpolymerization Modification of Polymer Brushes Grafted onto Microporous Polymeric Membranes Dübner M, Naoum M, Spencer Nicholas D, Padeste C
    ACS Omega 2, 455 (2017).
    DOI: 10.1021/acsomega.6b00394
  • Heteroatom-Doped Perihexacene from a Double Helicene Precursor: On-Surface Synthesis and Properties Wang X, Dienel T, Di Giovannantonio M, Barin G, Kharche N, Deniz O, Urgel José I, Widmer R, Stolz S, De Lima L, Muntwiler M, Tommasini M, Meunier V, Ruffieux P, Feng X, Fasel R, Müllen K, Narita A
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY 139, 4671 (2017).
    DOI: 10.1021/jacs.7b02258
  • High aspect ratio metal microcasting by hot embossing for X-ray optics fabrication Romano L, Vila-Comamala J, Kagias M, Vogelsang K, Schift H, Stampanoni M, Jefimovs K
    MICROELECTRONIC ENGINEERING 176, 6 (2017).
    DOI: 10.1016/j.mee.2016.12.032
  • High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development Rösner B, Döring F, Ribi? Primo? R, Gauthier D, Principi E, Masciovecchio C, Zangrando M, Vila-Comamala J, De Ninno G, David C
    OPTICS EXPRESS 25, 30686 (2017).
    DOI: 10.1364/OE.25.030686
  • High-acceptance versatile microfocus module based on elliptical Fresnel zone plates for small-angle X-ray scattering Lebugle M, Liebi M, Wakonig K, Guzenko Vitaliy A, Holler M, Menzel A, Guizar-Sicairos M, Diaz A, David C
    OPTICS EXPRESS 25, 21145 (2017).
    DOI: 10.1364/OE.25.021145
  • High-aspect-ratio nanoimprint process chains Cadarso Víctor J, Chidambaram N, Jacot-Descombes L, Schift H
    Microsystems & Nanoengineering 3, 17017 (2017).
    DOI: 10.1038/micronano.2017.17
  • High-resolution grayscale patterning using extreme ultraviolet interference lithography Fallica R, Kirchner R, Schift H, Ekinci Y
    MICROELECTRONIC ENGINEERING 177, S0167931717300072 (2017).
    DOI: 10.1016/j.mee.2017.01.007
  • High-speed fixed-target serial virus crystallography Roedig P, Ginn H, Pakendorf T, Sutton G, Harlos K, Walter T, Meyer J, Fischer P, Duman R, Vartiainen I, Reime B, Warmer M, Brewster A, Young I, Michels-Clark T, Sauter N, Kotecha A, Kelly J, Rowlands D, Sikorsky M, Nelson S, Damiani D, Alonso-Mori R, Ren J, Fry E, David C, Stuart D, Wagner A, Meents A
    NATURE METHODS 14, 805 (2017).
    DOI: 10.1038/NMETH.4335
  • Hot embossing of Au- and Pb-based alloys for x-ray grating fabrication Romano L, Vila-Comamala J, Schift H, Stampanoni M, Jefimovs K
    Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 35, 06G302 (2017).
    DOI: 10.1116/1.4991807
  • How post-processing by selective thermal reflow can reduce the roughness of 3D lithography in micro-optical lenses Kirchner R, Chidambaram N, Altana M, Schift H
    SPIE LASE 10095, 1009507 (2017).
    DOI: 10.1117/12.2258090
  • Hydrogen Adsorption on Nanosized Platinum and Dynamics of Spillover onto Alumina and Titania Spreafico C, Karim W, Ekinci Y, van Bokhoven JA, Van de Vondele J
    The Journal of Physical Chemistry C , (2017).
    DOI: 10.1021/acs.jpcc.7b03733
  • Improvements in resist performance towards EUV HVM Yildirim O, Buitrago E, Hoefnagels R, Meeuwissen M, Wuister S, Rispens G, van Oosten A, Derks P, Finders J, Vockenhuber M, Ekinci Y
    SPIE ADVANCED LITHOGRAPHY , (2017).
    DOI: 10.1117/12.2257415
  • In-operando studies of Ag-TCNQ nanocrystals using Raman and soft x-ray microspectroscopy Rösner B, Schmidt U, Fink R
    JOURNAL OF PHYSICS: CONFERENCE SERIES 849, 012016 (2017).
    DOI: 10.1088/1742-6596/849/1/012016
  • Ink-Free Reversible Optical Writing in Monolayers by Polymerization of a Trifunctional Monomer: Toward Rewritable ?Molecular Paper? Müller V, Hungerland T, Baljozovic M, Jung T, Spencer Nicholas D, Eghlidi H, Payamyar P, Schlüter ADieter
    ADVANCED MATERIALS -, 1701220 (2017).
    DOI: 10.1002/adma.201701220
  • Interlaced zone plate optics for hard X-ray imaging in the 10 nm range Mohacsi I, Vartiainen I, Rösner B, Guizar-Sicairos M, Guzenko V A, McNulty I, Winarski R, Holt M V, David C
    Scientific Reports 7, 43624 (2017).
    DOI: 10.1038/srep43624
  • Investigation of transient dynamics of capillary assisted particle assembly yield Virganavicius D, Juodenas M, Tamulevicius T, Schift H, Tamulevicius S
    APPLIED SURFACE SCIENCE 406, 136-143 (2017).
    DOI: 10.1016/j.apsusc.2017.02.100
  • Lithographic performance of ZEP520A and mr-PosEBR resists exposed by electron beam and extreme ultraviolet lithography Fallica R, Kazazis D, Kirchner R, Voigt A, Mochi I, Schift H, Ekinci Y
    Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 35, 061603 (2017).
    DOI: 10.1116/1.5003476
  • Long-range ferrimagnetic order in a two-dimensional supramolecular Kondo lattice Girovsky J, Nowakowski J, Ali MdEhesan, Baljozovic M, Rossmann Harald R, Nijs T, Aeby Elise A, Nowakowska S, Siewert D, Srivastava G, Wäckerlin C, Dreiser J, Decurtins S, Liu S, Oppeneer Peter M, Jung TA, Ballav N
    NATURE COMMUNICATIONS 8, 15388 (2017).
    DOI: 10.1038/ncomms15388
  • Model-independent particle species disentanglement by X-ray cross-correlation scattering Pedrini B, Menzel A, Guzenko VA, David C, Abela R, Gutt C
    Scientific Reports 7, 45618 (2017).
    DOI: 10.1038/srep45618
  • Molecular Chessboard Assemblies Sorted by Site-Specific Interactions of Out-of-Plane d-Orbitals with a Semimetal Template Wäckerlin A, Fatayer S, Nijs T, Nowakowska S, Mousavi SFatemeh, Popova O, Ahsan A, Jung Thomas A, Wäckerlin C
    NANO LETTERS 17, 1956 (2017).
    DOI: 10.1021/acs.nanolett.6b05344
  • Multi-trigger resist for electron beam lithography Ekinci Y, Roth J, Dawson G, McClelland A, Popescu C, Robinson Alex P, Theis W, Kazazis D
    33rd European Mask and Lithography Conference , (2017).
    DOI: 10.1117/12.2279767
  • Multiphoton photoemission of gold nanopillars fabricated by carbon nanotube templates Monshipouri M, Abdi Y, Darbari S, Tsujino S
    Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 35, 02C110 (2017).
    DOI: 10.1116/1.4978655
  • Nanofluidic lab-on-a-chip trapping devices for screening electrostatics in concentration gradients Gerspach M, Mojarad N, Sharma D, Pfohl T, Ekinci Y
    MICROELECTRONIC ENGINEERING 175, 17 (2017).
    DOI: 10.1016/j.mee.2016.12.017
  • Nanotomography endstation at the P05 beamline: Status and perspectives Greving I, Ogurreck M, Marschall F, Last A, Wilde F, Dose T, Burmester H, Lottermoser L, Müller M, David C, Beckmann F
    JOURNAL OF PHYSICS: CONFERENCE SERIES 849, 012056 (2017).
    DOI: 10.1088/1742-6596/849/1/012056
  • Next-generation lithography - an outlook on EUV projection and nanoimprint Schoot J, Schift H
    Advanced Optical Technologies 6, 159 (2017).
    DOI: 10.1515/aot-2017-0040
  • Photosensitized Chemically Amplified Resist (PSCAR) 2.0 for high-throughput and high-resolution EUV lithography: dual photosensitization of acid generation and quencher decomposition by flood exposure Nagahara S, Carcasi M, Shiraishi G, Nakagawa H, Dei S, Shiozawa T, Nafus K, De Simone D, Vandenberghe G, Stock H, Küchler B, Hori M, Naruoka T, Nagai T, Minekawa Y, Iseki T, Kondo Y, Yoshihara K, Kamei Y, Tomono M, Shimada R, Biesemans S, Nakashima H, Foubert P, Buitrago E, Vockenhuber M, Ekinci Y, Oshima A, Tagawa S
    SPIE ADVANCED LITHOGRAPHY , (2017).
    DOI: 10.1117/12.2258217
  • Protective effect of ultrathin alumina film against diffusion of iron into carbon fiber during growth of carbon nanotubes for hierarchical composites investigated by ptychographic X-ray computed tomography Szmyt W, Vogel S, Diaz A, Holler M, Gobrecht J, Calame M, Dransfeld C
    CARBON 115, 347 (2017).
    DOI: 10.1016/j.carbon.2016.12.085
  • RESCAN: an actinic lensless microscope for defect inspection of EUV reticles Mochi I, Helfenstein P, Mohacsi I, Rajendran R, Yoshitake S, Ekinci Y
    SPIE ADVANCED LITHOGRAPHY , (2017).
    DOI: 10.1117/12.2258086
  • RESCAN: an actinic lensless microscope for defect inspection of EUV reticles Mochi I, Helfenstein P, Mohacsi I, Rajeev R, Kazazis D, Yoshitake S, Ekinci Y
    Journal of Micro/Nanolithography, MEMS, and MOEMS 16, 041003 (2017).
    DOI: 10.1117/1.JMM.16.4.041003
  • Reversible Light-Switching of Enzymatic Activity on Orthogonally Functionalized Polymer Brushes Dubner Matthias, Cadarso Victor J, Gevrek Tugce N, Sanyal Amitav, Spencer Nicholas D, Padeste Celestino
    ACS APPLIED MATERIALS & INTERFACES 9, 9245-9249 (2017).
    DOI: 10.1021/acsami.7b01154
  • Selective Surface Smoothening of Polymer Microlenses by Depth Confined Softening Chidambaram Nachiappan, Kirchner Robert, Fallica Roberto, Yu Libo, Altana Mirco, Schift Helmut
    ADVANCED MATERIALS TECHNOLOGIES 2, 1700018 (2017).
    DOI: 10.1002/admt.201700018
  • Selective surface smoothening of 3D micro-optical elements Schift H, Chidambaram N, Altana M, Kirchner R
    SPIE ADVANCED LITHOGRAPHY 10144, 101440B (2017).
    DOI: 10.1117/12.2256358
  • Sensitivity enhancement of the high-resolution xMT multi-trigger resist for EUV lithography Popescu C, Frommhold A, McClelland A, Roth J, Ekinci Y, Robinson Alex PG
    SPIE ADVANCED LITHOGRAPHY , (2017).
    DOI: 10.1117/12.2258098
  • Single positively charged particle trapping in nanofluidic systems Sharma D, Gerspach M, Pfohl T, Lim Roderick YH, Ekinci Y
    MICROELECTRONIC ENGINEERING 175, 43 (2017).
    DOI: 10.1016/j.mee.2017.01.001
  • Single-shot Monitoring of Ultrafast Processes via X-ray Streaking at a Free Electron Laser Buzzi Michele, Makita Mikako, Howald Ludovic, Kleibert Armin, Vodungbo Boris, Maldonado Pablo, Raabe Jorg, Jaouen Nicolas, Redlin Harald, Tiedtke Kai, Oppeneer Peter M, David Christian, Nolting Frithjof, Luning Jan
    Scientific Reports 7, 7253 (2017).
    DOI: 10.1038/s41598-017-07069-z
  • Soft electrostatic trapping in nanofluidics Gerspach Michael A, Mojarad N, Sharma D, Pfohl T, Ekinci Y
    Microsystems & Nanoengineering 3, 17051 (2017).
    DOI: 10.1038/micronano.2017.51
  • Spin-resolved electronic structure of ferroelectric ?-GeTe and multiferroic Ge 1-x Mn x Te Krempaský J, Fanciulli M, Pilet N, Minár J, Khan W, Muntwiler M, Bertran F, Muff S, Weber AP, Strocov VN, Volobuiev VV, Springholz G, Dil JH
    JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS , S0022369717314531 (2017).
    DOI: 10.1016/j.jpcs.2017.11.010
  • State-of-the-art EUV materials and processes for the 7nm node and beyond Buitrago E, Meeuwissen M, Yildirim O, Custers R, Hoefnagels R, Rispens G, Vockenhuber M, Mochi I, Fallica R, Tasdemir Z, Ekinci Y
    SPIE ADVANCED LITHOGRAPHY 10143, 101430T-1 (2017).
    DOI: 10.1117/12.2260153
  • State-of-the-art Nanofabrication in Catalysis Karim W, Tschupp SA, Herranz J, Schmidt TJ, Ekinci Y, van Bokhoven JA
    CHIMIA International Journal for Chemistry 71, 160 (2017).
    DOI: 10.2533/chimia.2017.160
  • Stimulated scintillation emission depletion X-ray imaging Alekhin MS, Patton G, Dujardin C, Douissard PA, Lebugle M, Novotny L, Stampanoni M
    OPTICS EXPRESS 25, 654 (2017).
    DOI: 10.1364/OE.25.000654
  • Strain and thermal conductivity in ultrathin suspended silicon nanowires Fan D, Sigg H, Spolenak R, Ekinci Y
    PHYSICAL REVIEW B 96, 115307 (2017).
    DOI: 10.1103/PhysRevB.96.115307
  • Structural characterization of a covalent monolayer sheet obtained by two-dimensional polymerization at an air/water interface Müller V, Shao F, Baljozovic M, Moradi M, Zhang Y, Jung T, Thompson William B, King Benjamin T, Zenobi R, Schlüter ADieter
    Angewandte Chemie International Edition , (2017).
    DOI: 10.1002/anie.201707140
  • Structural insights into the mechanism of the membrane integral N-acyltransferase step in bacterial lipoprotein synthesis. Wiktor M, Weichert D, Howe N, Huang CY, Olieric V, Boland C, Bailey J, Vogeley L, Stansfeld PJ, Buddelmeijer N, Wang M, Caffrey M
    NATURE COMMUNICATIONS 8, 15952 (2017).
    DOI: 10.1038/NCOMMS15952
  • Surface chemistry of rare-earth oxide surfaces at ambient conditions: reactions with water and hydrocarbons Külah E, Marot L, Steiner R, Romanyuk A, Jung Thomas A, Wäckerlin A, Meyer E
    Scientific Reports 7, 43369 (2017).
    DOI: 10.1038/srep43369
  • Surface enhanced infrared absorption of chemisorbed carbon monoxide using plasmonic nanoantennas Haase J, Bagiante S, Sigg H, van Bokhoven JA
    OPTICS LETTERS 42, 1931 (2017).
    DOI: 10.1364/OL.42.001931
  • Surface science at the PEARL beamline of the Swiss Light Source Muntwiler M, Zhang J, Stania R, Matsui F, Oberta P, Flechsig U, Patthey L, Quitmann C, Glatzel T, Widmer R, Meyer E, Jung TA, Aebi P, Fasel R, Greber T
    JOURNAL OF SYNCHROTRON RADIATION 24, 354 (2017).
    DOI: 10.1107/S1600577516018646
  • Systematic efficiency study of line-doubled zone plates Marschall F, Vila-Comamala J, Guzenko VA, David C
    MICROELECTRONIC ENGINEERING 177, 25 (2017).
    DOI: 10.1016/j.mee.2017.01.017
  • Temperature dependence of the partially localized state in a 2D molecular nanoporous network Piquero-Zulaica I, Nowakowska S, Ortega JEnrique, Stöhr M, Gade Lutz H, Jung Thomas A, Lobo-Checa J
    APPLIED SURFACE SCIENCE 391, 39 (2017).
    DOI: 10.1016/j.apsusc.2016.02.227
  • The hard X-ray Photon Single-Shot Spectrometer of SwissFEL - initial characterization (vol 12, P05024, 2017) Rehanek J, Makita M, Wiegand P, Heimgartner P, Pradervand C, Seniutinas G, Flechsig U, Thominet V, Schneider C W, Fernandez A Rodriguez, David C, Patthey L, Juranic P
    JOURNAL OF INSTRUMENTATION 12, A07001 (2017).
    DOI: 10.1088/1748-0221/12/07/A07001
  • The hard X-ray Photon Single-Shot Spectrometer of SwissFEL?initial characterization Rehanek J, Makita M, Wiegand P, Heimgartner P, Pradervand C, Seniutinas G, Flechsig U, Thominet V, Schneider CW, Fernandez ARodriguez, David C, Patthey L, Juranic P
    JOURNAL OF INSTRUMENTATION 12, P05024 (2017).
    DOI: 10.1088/1748-0221/12/05/P05024
  • Thermally induced anchoring of a zinc-carboxyphenylporphyrin on rutile TiO2 (110) Jöhr R, Hinaut A, Pawlak R, Zajac L, Olszowski P, Such B, Glatzel T, Zhang J, Muntwiler M, Bergkamp Jesse J, Mateo L, Decurtins S, Liu S, Meyer E
    The Journal of Chemical Physics 146, 184704 (2017).
    DOI: 10.1063/1.4982936
  • Tipping solutions: emerging 3D nano-fabrication/ -imaging technologies Seniutinas G, Balcytis A, Reklaitis I, Chen F, Davis J, David C, Juodkazis S
    Nanophotonics 6, (2017).
    DOI: 10.1515/nanoph-2017-0008
  • Top-down method to introduce ultra-high elastic strain Zabel T, Geiger R, Marin E, Müller E, Diaz A, Bonzon C, Süess Martin J, Spolenak R, Faist J, Sigg H
    JOURNAL OF MATERIALS RESEARCH 32, 726 (2017).
    DOI: 10.1557/jmr.2017.31
  • Towards a stand-alone high-throughput EUV actinic photomask inspection tool: RESCAN Rajendran R, Mochi I, Helfenstein P, Mohacsi I, Redford S, Mozzanica A, Schmitt B, Yoshitake S, Ekinci Y
    SPIE ADVANCED LITHOGRAPHY , (2017).
    DOI: 10.1117/12.2258379
  • Transmission zone plates as analyzers for efficient parallel 2D RIXS-mapping Marschall F, Yin Z, Rehanek J, Beye M, Döring F, Kubicek K, Raiser D, Veedu S, Buck J, Rothkirch A, Rösner B, Guzenko Vitaliy A, Viefhaus J, David C, Techert S
    Scientific Reports 7, 8849 (2017).
    DOI: 10.1038/s41598-017-09052-0
  • Tunable kinoform x-ray beam splitter Lebugle M, Seniutinas G, Marschall F, Guzenko VA, Grolimund D, David C
    OPTICS LETTERS 42, 4327 (2017).
    DOI: 10.1364/OL.42.004327
  • Two-dimensional calix[4]arene-based metal-organic coordination networks of tunable crystallinity Moradi M, Tulli Ludovico G, Nowakowski J, Baljozovic M, Jung Thomas A, Shahgaldian P
    Angewandte Chemie , (2017).
    DOI: 10.1002/ange.201703825
  • X-ray grating interferometer for in situ and at-wavelength wavefront metrology Kayser Y, David C, Flechsig U, Krempasky J, Schlott V, Abela R
    JOURNAL OF SYNCHROTRON RADIATION 24, 150 (2017).
    DOI: 10.1107/S1600577516017562
  • X-ray phase microtomography with a single grating for high-throughput investigations of biological tissue Zdora M, Vila-Comamala J, Schulz G, Khimchenko A, Hipp A, Cook Andrew C, Dilg D, David C, Grünzweig C, Rau C, Thibault P, Zanette I
    Biomedical Optics Express 8, 1257 (2017).
    DOI: 10.1364/BOE.8.001257
  • Zone plates as imaging analyzers for resonant inelastic x-ray scattering Marschall F, McNally D, Guzenko Vitaliy A, Rösner B, Dantz M, Lu X, Nue L, Strocov V, Schmitt T, David C
    OPTICS EXPRESS 25, 15624 (2017).
    DOI: 10.1364/OE.25.015624
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Earlier Publications

Papers published from 2011 to 2016
List of Publications 2007 - 2011 (PDF)