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PolLux - X07DA: Scanning Transmission X-Ray Microspectroscopy

A Highly Versatile Scanning Transmission X-Ray Microspectroscope
Energy range 250-1600 eV
Spectral resolution >3000
Polarization Linear horizontal
Circular (right/left)
Endstation Scanning transmission x-ray microscopy (STXM)
spatial resolution (focus size) < 40 nm,
sample chamber vacuum (10-6 mbar) to 1 atm inert gas or He
This project is a collaboration between:
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Current Highlights and News

9 November 2020
High-resolution X-ray microscopy of a test pattern with 9 nm line width

World Record: 7 nm Resolution in Scanning Soft X-ray Microscopy

During the past decade, scientists have put high effort to achieve sub-10 nm resolution in X-ray microscopy. Recent developments in high-resolution lithography-based diffractive optics, combined with the extreme stability and precision of the PolLux and HERMES scanning X-ray microscopes, resulted now in a so far unreached resolution of seven nanometers in scanning soft X-ray microscopy. Utilizing this highly precise microscopy technique with the X-ray magnetic circular dichroism effect, dimensionality effects in an ensemble of interacting magnetic nanoparticles can be revealed.

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19 March 2020
Domain wall logic gate

Logic operations with domain walls

A collaboration of scientists from the ETH Zürich and the Paul Scherrer Institute successfully demonstrated the all-electric operation of a magnetic domain-wall based NAND logic gate, paving the way towards the development of logic applications beyond the conventional metal-oxide semiconductor technology. The work has been published in the journal Nature.

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18 March 2020
Cover page of the Advanced Materials issue

Optics for spins

In this work, published on the front cover page of Advanced Materials, an international collaboration of Italian, American, and Swiss scientists demonstrated a novel concept for the generation and manipulation of spin waves, paving the way towards the development of magnonic nano-processors.

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