Correlating transmission electron and soft x-ray microscopy to bridge atomic- and mesoscales

Transmission electron and soft x-ray microscopy have contributed significantly to our understanding of phenomena in fields ranging from biology to materials science by providing highly complementary information from the atomic level to the nano- and micrometre scale, including from structural, electronic, magnetic, and chemical perspectives. In this review, we present recent developments in combining transmission electron and soft x-ray microscopy techniques, including progress in sample environment, and in situ and operando approaches. We highlight the unique opportunities offered by fully correlative transmission electron and soft x-ray microscopy to study topics ranging from nanocatalysis to functional materials and 2D materials, exemplified by research carried out at the SIM beamline (PSI) and at the EMC (EMPA), among others.

Original Publication: https://doi.org/10.1016/j.nantod.2025.102732 (link is external)