A new RIXS analyzer scheme based on transmission zone plates


Resonant inelastic X-ray scattering (RIXS) is a rapidly developing X-ray spectroscopy technique with the capability to study elementary excitations of electrons, phonons and spins. To date, RIXS instrumentation in the XUV and the soft X-ray range heavily relied on reflecting variable line spacing (VLS) analyzer gratings that collect the emitted light and disperse it across a detector. Such VLS gratings do not provide imaging capabilities, meaning that no information from the sample is conveyed along the non-dispersive direction of the detector.


In order to overcome this drawback, the X-Ray Optics and Applications Group at the Laboratory for Micro-and Nanotechnology of PSI has successfully implemented a new spectral analyzer scheme based on off-axis transmission Fresnel zone plates. The advantage of this new approach is that such optics feature imaging capabilities, which were verified in an initial experiment at the SLS-ADRESS beam line [1]. In a collaboration with scientists from Göttingen (MPI for Biophysical Chemistry and Institute for X-Ray Physics) and Hamburg (DESY), the novel detection scheme was successfully implemented at the P04 beamline of PETRA III at DESY. By varying the photon energy along a line focus on the sample, it was possible to simultaneously record the emission spectra of a jet of liquid acetonitrile over a range of excitation energies, providing a map of RIXS spectra in a single experiment. Moreover, by scanning a line focus across the sample in one dimension, spectrally resolved RIXS 2D images were recorded for the first time [2]. This new scheme of analyzer optics leads to an increase of the throughput of measurements by several orders of magnitude compared to conventional approaches. Additionally, it opens up a variety of novel measurement classes at synchrotrons and efficient, ultra-fast time resolved investigations at X-ray Free-Electron Laser sources.

Contact

Dr. Christian David
Laboratory for Micro- and Nanotechnology
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
Telephone: +41 56 310 3753
E-mail: christian.david@psi.ch

Dr. Thorsten Schmitt
Spectroscopy of Novel Materials
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
E-mail: thorsten.schmitt@psi.ch

Prof. Dr. Simone Techert
Georg-August Universität Göttingen &
Max-Planck-Institut für biophysikalische Chemie
D-37077 Göttingen, Germany
and
Deutsches Elektronensynchrotron
D- 22607 Hamburg, Germany
E-mail: simone.techert@desy.de

Original Publications

[1] Zone plates as imaging analyzers for resonant inelastic x-ray scattering
F. Marschall, D. McNally, V.A. Guzenko, B. Rösner, M. Dantz, X. Lu, L. Nue, V. Strocov, T. Schmitt,
and C. David
Optics Express 25, 15624 (2017), DOI: 10.1364/OE.25.015624

[2] Transmission zone plates as analyzers for efficient RIXS-mapping
F. Marschall, Z. Yin, J. Rehanek, M. Beye, F. Döring, K. Kubicek, D. Raiser, S. Thekku Veedu, J. Buck,
A. Rothkirch, B. Rösner, V.A. Guzenko, J. Viefhaus, C. David, and S. Techert
Scientific Reports 7, Article number: 8849 (2017) DOI: 10.1038/s41598-017-09052-0