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SIS - X09LA: Surface / Interface: Spectroscopy

The Surface and Interface Spectroscopy (SIS) beamline provides a state-of-the-art experimental set-up to study the electronic band structure of novel complex materials by spin- and angle-resolved photoelectron spectroscopies. The beamline has been designed for the energy range from 10 to 800 eV with high flux, high resolution, variable polarization, and low high-harmonic contamination.

The beamline serves two endstations:
  • High-resolution photoemission spectroscopy (HRPES)
    for angle-resolved photoelectron spectroscopy (ARPES)
    for spin- and angle-resolved photoelectron spectroscopy (SARPES)
Users can apply for beamtime with the provided endstations or with their own endstation (after prior consulation with the beamline scientist).

Energy range 10 - 800 eV
Resolving power (E/Δ E) 104
Polarization linear horizontal (10 - 800 eV)
linear vertical (100 - 800 eV)
circular left/right (50-800 eV)
Flux on sample (200 eV) 2*1013 ph/s/0.1%BW/0.4 A
Higher order mode contamination < 0.1 %
Spot size on sample (200 eV) 50 x 100 µm2 (FWHM)