Welcome to the Microscopy and Magnetism Group

The Microscopy and Magnetism Group has a long experience in synchrotron based experiments in condensed matter physics. In particular we study electronic and magnetic properties of thin films, multilayers, and bulk systems of metals and oxides, 3d- and 4f - electron systems employing X-ray microscopy and spectroscopy. We operate and further develop two beamlines at the SLS the SIM and the X-TREME. At these beamlines we perform our research and provide support for external users with various endstations with capabilities ranging from X-ray scattering and absorption experiments to pump probe techniques using femtosecond lasers to photoemission electron microscopy.
Two XA spectra recorded with circularly polarized x-rays
•Fundamentals of Nature

Primer on X-ray magnetic circular dichroism

Materials research

X-ray magnetic circular dichroism (XMCD) is a magneto-optical effect that describes the difference in absorption between left and right circularly polarized X-rays by a magnetized material. It has been widely applied to the study of magnetic systems and of magnetic phenomena and its unique capabilities make it a fundamental tool for the study of novel magnetic phenomena and new materials systems.

Image showing a schematics of TEM and SXM as well as illustrative TEM and SXM data
•Large research facilities

Correlating transmission electron and soft x-ray microscopy to bridge atomic- and mesoscales

Materials research

Transmission electron and soft x-ray microscopy have contributed significantly to our understanding of phenomena in fields ranging from biology to materials science. In this review, we present recent developments in combining transmission electron and soft x-ray microscopy techniques, including progress in sample environment, and in situ and operando approaches and highlight the unique opportunities offered by fully correlative transmission electron and soft x-ray microscopy.

TOC 2 Nanoletters
•Future Technologies

Antiferrodistortive and ferroeletric phase transitions in freestanding films of SrTiO3

Materials research SLS

Epitaxially grown thin films are commonly used to strain engineer electronic properties by the choice of a substrate, and therefore do not match bulk properties (leading to properties that deviate from the bulk material). Free standing ultrathin oxide films are expected to preserve the bulk-like properties due to the absence of substrate influence. However,  we show that this expectation is not fulfilled with ultrathin free standing SrTiO3, as they get ferroelectric at 80K.