Tomas Aidukas was appointed as an Assistant Professor of Physics in the School of Basic Sciences (SB), Institute of Physics (IPHYS) at EPFL. His research focuses on computational imaging method development for microscopy, where resolution and throughput improvements are achieved through joint data acquisition and reconstruction techniques. His current focus is on coherent diffractive imaging (ptychography) and its integration into computed tomography for high-performance 3D nanoscale measurements using X-ray sources. Beyond method development, his work targets diverse applications such as semiconductor metrology or brain imaging at synaptic resolution.
In June 2026, Tomas joined EPFL to lead the newly formed Laboratory for Nanoscale X-ray Metrology, backed by a highly competitive SNSF Starting Grant. The group will work on the NEXUS-3D project (Nanoscale Examination of Ultra-Small Structures in 3D Using X-rays), dedicated to developing advanced X-ray microscopy methods for semiconductor metrology. As semiconductor features continue to shrink, NEXUS-3D aims to fill a critical industry gap by delivering high-resolution, high-throughput 3D imaging tools. The project will be carried out in close partnership with PSI and the Computational X-ray Imaging group led by Prof. Manuel Guizar-Sicairos.
Biography
Tomas received his B.Sc. degree in Theoretical Physics from the University of Glasgow in 2016. He then joined the Center for Doctoral Training in Intelligent Sensing and Measurement (CDT-ISM), a joint program between the Universities of Edinburgh and Glasgow, earning his PhD in 2021. Based in the Imaging Concepts Group under Prof. Andrew R. Harvey, his doctoral research focused on Fourier Ptychography, culminating in the development of a low-cost open-source computational microscope and a high-speed multi-camera system. Tomas also has industrial experience and holds several patents through his work at ZEISS.
In 2021, Tomas joined the Paul Scherrer Institut (PSI) as a postdoctoral researcher in the cSAXS group at the Swiss Light Source, working with Dr. Mirko Holler to push the resolution limits of 3D ptychographic tomography. Following this, he also worked in the Operando Spectroscopy group led by Dr. Maarten Nachtegaal, where he developed computational methods for X-ray spectroscopy at the newly built Debye beamline in close collaboration with the Swiss Data Science Center (SDSC).
In June 2026, he was awarded an SNSF Starting Grant and was appointed as an Assistant Professor of Physics at EPFL, where he now leads the Laboratory for Nanoscale X-ray Metrology while maintaining a close research partnership with PSI.
Selected Publications
Full list at Google Scholar
Aidukas, T., Phillips, N. W., Diaz, A., Poghosyan, E., Müller, E., Levi, A. F. J., Aeppli, G., Guizar-Sicairos, M., & Holler, M. (2024). High-performance 4-nm-resolution X-ray tomography using burst ptychography. Nature, 632(8023), 81–88. https://doi.org/10.1038/s41586-024-07615-6
Bosch, C., Aidukas, T., Holler, M., Pacureanu, A., Müller, E., Peddie, C. J., ... & Schaefer, A. T. (2025). Nondestructive X-ray tomography of brain tissue ultrastructure. Nature Methods, 22. https://doi.org/10.1038/s41592-025-02891-0
Aidukas, T., et al. (2019). Low-cost, sub-micron resolution, wide-field computational microscopy using opensource hardware. Scientific Reports, 9(1), 1–12. https://doi.org/10.1038/s41598-019-43845-9
Aidukas, T., Konda, P. C., & Harvey, A. R. (2022). High-speed multi-objective Fourier ptychographic microscopy. Optics Express, 30(16), 29189–29205. https://doi.org/10.1364/OE.466075