Scanning Electron Microscopy

LNQ is operating a Zeiss Supra 55VP high resolution hot cathode field emission scanning electron microscope in the PICO cleanroom and a Hitachi Regulus 8239 high resolution cold cathode field emission scanning electron microscope in the Park Innovaare building, outside the PSI cleanroom.

Zeiss PICO
Regulus 8230 SEM PiA

Details of the Zeiss Supra 55 VP SEM

  • Column based on GEMINI principle
  • Installed in 2005
  • Cathode: thermal field emission tip (Schottky-emitter ZrO/W)


Detector possibilities

  1.  In Lens detector for secondary electrons gives highest spatial resolution with specification of 1nm at an acceleration voltage of 15kV (Au on C- sample)
  2. Everhardt Thornley detector for secondary electrons
  3. Backscattered electron detector Centaurus especially useful for enhanced material contrast
  4. Variable Pressure detector for imaging e.g. electrically nonconductive, degassing materials without the need for metal coating. This works by charge compensation (positively ionised gas molecules stabilise local charging). Spatial resolution: approx. 3nm @ 15kV