Dr. Procopios Christou Constantinou

Procopios Constantinou is a Postdoctoral Fellow in the Spectroscopy and Novel Materials Group under supervision of Dr. Vladimir Strocov. He recieved his PhD from University College London (UCL), UK and MPhys 1st hons from Cardiff University, UK. At Cardiff University, he worked on modeling the convergent beam low-energy electron diffraction (CBLEED) patterns of the different reconstructed variants of silicon and during his time at UCL, he worked in the London Center for Nanotechnology, within the Center for Doctoral Training for the Advanced Characterization of Materials (CDT-ACM). Here, he was mostly involved in the fabrication of two-dimensional dopant 'delta'-layers buried in silicon and characterized their quantum properties using angle-resolved photoemission spectroscopy (ARPES). Currently, he is a postdoctoral fellow working at the ADDRESS beamlime.

Works at the ADRESS beamline and provides user support for soft x-ray ARPES experiments.

Procopios' research interests mainly involve studying semiconductor interfaces or two-dimensional systems using soft x-ray ARPES.

A full publication list can be accessed online through this link .

Atomic-Scale Patterning of Arsenic in Silicon by Scanning Tunneling Microscopy.
T. J. Z. Stock, O. Warschkow, P. C. Constantinou, J. Li, S. Fearn, E. Crane, E. V. S. Hofmann, A. Koelker, D. R. McKenzie, S. R. Schofield, N. J. Curson
ACS Nano (2020), 14, 3, 3316 – 3327, https://doi.org/10.1021/acsnano.9b08943

On the sensitivity of convergent beam low energy electron diffraction patterns to small atomic displacements.
P. C. Constantinou & D. E. Jesson.
Applied Surface Science (2019), 489, 504–509, https://doi.org/10.1016/j.apsusc.2019.05.274