Aller au contenu principal
  • Paul Scherrer Institut PSI
  • PSI Research, Labs & User Services

Digital User Office

  • Digital User Office
  • DE
  • EN
  • FR
Paul Scherrer Institut (PSI)
Rechercher
Paul Scherrer Institut (PSI)

Hauptnavigation

  • Research at PSIOuvrir ce point de menu principal
    • Research Initiatives
    • Ethics and Research integrity
    • Scientific Highlights
    • Scientific Events
    • Scientific Career
    • PSI-FELLOW
    • PSI Data Policy
  • Research Divisions and LabsOuvrir ce point de menu principal
    • Overview
    • Research with Neutrons and Muons
    • Photon Science
    • Energy and Environment
    • Nuclear Energy and Safety
    • Biology and Chemistry
    • Scientific Computing, Theory and Data
    • Large Research Facilities
  • Facilities and InstrumentsOuvrir ce point de menu principal
    • Overview
    • Large Research Facilities
    • Facilities
    • PSI Facility Newsletter
  • PSI User ServicesOuvrir ce point de menu principal
    • User Office
    • Methods at the PSI User Facilities
    • Proposals for beam time
    • Proposal Deadlines
    • Data Analysis Service (PSD)
    • EU support programmes
  • New ProjectsOuvrir ce point de menu principal
    • SLS 2.0
    • IMPACT
  • DE
  • EN
  • FR

Digital User Office (mobile)

  • Digital User Office

Vous êtes ici:

  1. PSI Home
  2. Labs & User Services
  3. PSD
  4. LXN
  5. Research Groups
  6. X-ray Nano-Optics
  7. Wavefront Metrology and Manipulation
  8. Vortex Fresnel Zone Plates

Navigation secondaire

Laboratory for X-ray Nanoscience and Technologies (LXN)

  • About LXN
    • Organisational Structure
  • Open Positions
  • People
  • Research Groups Sous-menu élargi
    • X-ray Nano-Optics Sous-menu élargi
      • X-ray Optics for Imaging and Spectroscopy
        • Fresnel Zone Plate for X-ray Microscopy
        • Blazed X-ray Optics
        • Zernike X-ray Phase Contrast Microscopy
        • Fresnel Zone Plates for RIXS
        • Refractive Lenses by 2 Photon 3D Lithography
      • Wavefront Metrology and Manipulation Sous-menu élargi
        • Vortex Fresnel Zone Plates
        • Grating-based Wavefront Metrology
      • X-ray Optics for XFELs
        • Diamond Fresnel Zone Plates
        • Beam Splitter Gratings for Spectral Monitoring
        • A Delay Line for Ultrafast Pump-Probe Experiments
        • X-ray Streaking for Ultrafast Processes
    • Molecular Nanoscience
      • On-surface Chemistry
      • Spins in Molecular Monolayers
      • SiC: Surfaces and Interfaces
      • Our Research Team
    • Advanced Lithography and Metrology
      • EUV Interference Lithography
      • EUV Lensless Imaging
      • ALM Nanoscience
    • Quantum Photon Science
      • News and highlights
      • People
      • Open positions
      • Current projects
        • Imaging quantum many-body states
        • Nonlinear magnonics
        • Optical devices & methods
        • Rare-earth quantum magnets
        • Rydberg states in Si ∂-layers
        • Strained Ge laser (former research activity of H. Sigg & collaborators)
        • Van der Waals materials & devices
      • Infrastructure
        • Cristallina-Q
        • IR beamline
        • Nano-fabrication
      • Publications
      • QTC@PSI
    • Detectors
      • Projects
        • MYTHEN
        • GOTTHARD
        • EIGER
        • JUNGFRAU
        • MOENCH
        • AGIPD
        • Documentation
        • Software Releases
      • Research
      • Detectors Scientific Highlights
      • Publications
      • Team
  • Facilities and Equipment
    • Surface Science Lab
    • Scanning Electron Microscopy
    • Scanning Probe Microscopy
    • PEARL Beamline
    • XIL Facility at the SLS
    • Cleanroom Labs
  • Scientific Highlights and News
    • Archive
  • Publications
    • Archive

Info message

Ce contenu n'est pas disponible en français.

Vortex Fresnel Zone Plates

Optical vortices can be described as radiation which carries an orbital angular momentum. In contrast to circularly polarized light from synchrotron and free electron laser sources, it is not the electric and magnetic field vector but the phase of the electromagnetic field that rotates around a singularity in a helical fashion. The vortex can be characterized with an integer-numbered topological charge, which describes how often the phase rotates by 360°. Possible applications of these unique beams are the investigation of quadrupole transitions, angle-dependent emission of photoelectrons from supermolecular orbital states, defining torus-shaped beams, or scattering at magnetic vortices.

To demonstrate optical vortices at free electron lasers, we fabricated spiral zone plates, which yield a diffraction pattern with such a phase singularity. The material of choice for the extremely intense EUV radiation of the FERMI free electron laser is silicon. Thus, we etched spiral zone plates into ultraflat thin silicon membranes, and characterized the radiation using a Hartmann wavefront sensor downstream of the zone plate focal plane. The experiment enabled the first demonstration of orbital angular momentum in radiation created by a free electron laser in the extreme ultraviolet regime, with an extraordinary clean and defined wavefront.

Top row: Spiral zone plates with topological charge l=0 (Fresnel zone plate), l=1, l=2 and l=3. Bottom row: Resulting phase at the wavefront.
Figure. Top row: Spiral zone plates with topological charge l=0 (Fresnel zone plate), l=1, l=2 and l=3. Bottom row: Resulting phase at the wavefront.

Publications

  1. P. R. Ribič, B. Rösner, D. Gauthier, E. Allaria, F. Döring, L. Foglia, L. Gianessi, N. Mahne, M. Manfredda, C. Masciovecchio, R. Mincigrucci, N. Mirian, E. Principi, E. Roussel, A. Simoncig, S. Spampinati, C. David, G. de Ninno. (2017) Extreme-Ultraviolet Vortices from a Free-Electron Laser, Physical Review X 7, 2017, 031036.
  2. B. Rösner, F. Döring, P. R. Ribič, D. Gauthier, E. Principi, C. Masciovecchio, M. Zangrando, J. Vila-Comamala, G. de Ninno, C. David. (2017) High Resolution Beam Profiling of X-ray Free Electron Laser Radiation by Polymer Imprint Development, Optics Express 25, 30686-30695.

Sidebar

Contact

Dr. Christian David

Laboratory for X-ray Nano-Optics
Paul Scherrer Institut
5232 Villigen PSI
Switzerland

Telephone: +41 56 310 37 53
E-mail: christian.david@psi.ch

top

Pied de page

Paul Scherrer Institut

Forschungsstrasse 111
5232 Villigen PSI
Suisse

Téléphone: +41 56 310 21 11
Téléfax: +41 56 310 21 99

Comment nous trouver 
Contact

Centre de visiteurs psi forum
Laboratoire élèves iLab (en allemand)
Centre de protonthérapie
Centre de Formation du PSI (en allemand)
PSI Guest House (en anglais)
PSI Gastronomie (en allemand)
psi forum shop

Service & Support

  • Annuaire
  • User Office
  • Accelerator Status
  • Publications du PSI
  • Fournisseurs
  • E-facture
  • Computing (en anglais)
  • Sicherheit (en allemand)

Carrière

  • Travailler au PSI
  • Offres d'emploi
  • Formation initiale et formation continue
  • Career Center
  • Formation professionnelle (en allemand)
  • Centre de Formation du PSI

Pour les médias

  • Le PSI en bref
  • Chiffres et faits
  • Le coin médias
  • Communiqués de presse
  • Réseaux sociaux

Suivez le PSI: Twitter (in English) LinkedIn Youtube Facebook Instagram Issuu RSS

Footer legal

  • Impressum
  • Conditions d'utilisation
  • Login éditeurs