Dr. Vladimir Strokov

Scientist (SX-ARPES)

Paul Scherrer Institut
Forschungsstrasse 111
5232 Villigen PSI
Schweiz






Position: Beamline Scientist

Research Interests
  • Electronic structure of bulk materials, surfaces and nanostructures, including the dynamic many-body properties of correlated electron systems.
  • Experimental research, using mostly ARPES in various energy ranges and VLEED spectroscopy of unoccupied electron states combined with computational analysis.
  • Instrumental developments of X-ray optics including beamlines and RIXS spectrometers.
Education
  • 1986: M.Sc. in Physics, St.Petersbourg State University
  • 1990: Ph.D., St.Petersbourg State University
  • 2000: Habilitation Degree, Institute of Analytic Instrumentation, St. Petersbourg
Research Positions
  • 2004-present: Beamline scientist, Swiss Light Source, Paul Scherrer Institute, Switzerland
  • 2000-2003: Postdoctoral Researcher, Augsburg University, Germany
  • 1999: Researcher, Université de la Méditerranée, France
  • 1997-1998: Visiting Scientist, Universität des Saarlandes, Germany
  • 1993-1999: Visiting Scientist, Chalmers University of Technology and Göteborg University, Sweden
  • 1992-2002: Senior researcher, International Institute for Interphase Interactions, Russia
  • 1986-1989: Ph.D. student, St.Petersburg State University, Russia
  • Spin–orbital separation in the quasi-one-dimensional Mott insulator Sr2CuO3, J. Schlappa, K. Wohlfeld, K. J. Zhou, M. Mourigal, M. W. Haverkort, V. N. Strocov, L. Hozoi, C. Monney, S. Nishimoto, S. Singh, A. Revcolevschi, J.-S. Caux, L. Patthey, H. M. Rønnow, J. van den Brink and T. Schmitt, Nature 485, 82 (2012).
  • Pseudogap in the chain states of YBa2Cu3O6.6, V.B. Zabolotnyy, A.A. Kordyuk, D. Evtushinsky, V.N. Strocov, L. Patthey, T. Schmitt, D. Haug, C.T. Lin, V. Hinkov, B. Keimer, B. Büchner and S.V. Borisenko, Phys. Rev. B 85, 064507 (2012).
  • Localized and delocalized Ti 3d carriers in LaAlO3/SrTiO3 superlattices revealed by resonant inelastic x-ray scattering, K. Zhou, M. Radovic, J. Schlappa, V.N. Strocov, R. Frison, J. Mesot, L. Patthey and T. Schmitt, Phys. Rev. B (Rapid Comm.) 83, 201402 (2011).
  • Spatial Quantum Beats in Vibrational Resonant Inelastic Soft X-Ray Scattering at Dissociating States in Oxygen, A. Pietzsch, Y.-P. Sun, F. Hennies, Z. Rinkevicius, H. O. Karlsson, T. Schmitt, V.N. Strocov, J. Andersson, B. Kennedy, J. Schlappa, A. Föhlisch, J.-E. Rubensson, and F. Gel’mukhanov, Phys. Rev. Lett. 106, 153004 (2011).
  • Numerical optimization of spherical variable-line-spacing grating X-ray spectrometers, N. Strocov, T. Schmitt, U. Flechsig, L. Patthey and G. S. Chiuzbaian, J. Synchrotron Rad. 18, 134 (2011).
  • High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies, V.N. Strocov, T. Schmitt, U. Flechsig, T. Schmidt, A. Imhof, Q. Chen, J. Raabe, R. Betemps, D. Zimoch, J. Krempasky, X. Wang, M. Grioni, A. Piazzalunga and L. Patthey, J. Synchrotron Rad. 17, 631 (2010).
  • Final-state effects in high-resolution angle-resolved photoemission from Ni(110), X.Y. Cui, E.E. Krasovskii, V.N. Strocov, A. Hofmann, J. Schäfer, R. Claessen and L. Patthey, Phys. Rev. B 81, 245118 (2010).
  • Concept of a Spectrometer for Resonant Inelastic X-ray Scattering with Parallel Detection in Incoming and Outgoing Photon Energies, V.N. Strocov, J. Synchrotron Rad. 17, 103 (2010).
  • Effects of three-dimensional band structure in angle- and spin-resolved photoemission from half-metallic La2∕3Sr1∕3MnO3, J. Krempaský, V. N. Strocov, L. Patthey, P. R. Willmott, R. Herger, M. Falub, P. Blaha, M. Hoesch, V. Petrov, M. C. Richter, O. Heckmann, and K. Hricovini, Phys. Rev. B 77, 165120 (2008).
  • Band mapping in the one-step photoemission theory: Multi-Bloch-wave structure of final states and interference effects, E.E. Krasovskii, V.N. Strocov, N. Barrett, H. Berger, W. Schattke and R. Claessen, Phys. Rev. B 75, 045432 (2007).
  • Three-dimensional band structure of layered TiTe2: Photoemission final-state effects, N. Strocov, E.E. Krasovskii, W. Schattke, N. Barrett, H. Berger, D. Schrupp and R. Claessen, Phys. Rev. B 74, 195125 (2006).
  • Momentum selectivity and anisotropy effects in the nitrogen K-edge resonant inelastic x-ray scattering from GaN, N. Strocov, T. Schmitt, J.-E. Rubensson, P. Blaha, T. Paskova, and P. O. Nilsson, Phys. Rev. B 72, 085221 (2005).
  • Excited States Mapped by Secondary Photoemission, Bovet, V.N. Strocov, F. Clerc, C. Koitzsch, D. Naumovic and P. Aebi, Phys. Rev. Lett. 93, 107601 (2004).
  • Nitrogen local electronic structure in Ga(In)AsN alloys by soft-x-ray absorption and emission: Implications for optical properties, V.N. Strocov, P.O. Nilsson, T. Schmitt, A. Augustsson, L. Gridneva, D. Debowska-Nilsson, R. Claessen, A.Yu. Egorov, V.M. Ustinov and Zh.I. Alferov, Phys. Rev. B 69 (2004) 035206.
  • Origin of photoemission final-state effects in Bi2Sr2CaCu2O8 by very-low-energy electron diffraction, V.N. Strocov, R. Claessen and P. Blaha, Phys. Rev. B 68, 144509 (2003).
  • Intrinsic accuracy in 3-dimensional photoemission band mapping, V.N. Strocov, J. Electron Spectrosc. Relat. Phenom. 130, 65 (2003).
  • Band- and k-dependent self-energy effects in unoccupied and occupied quasiparticle band structure of Cu, V.N. Strocov, F. Aryasetiawan, P.O. Nilsson, P. Blaha, and R. Claessen, Phys. Rev. B 66, 195104 (2002).
  • Unoccupied band structure of layered materials by very-low-energy electron diffraction: Implications in photoemission, V.N. Strocov, in Electron Spectroscopies applied to low-dimensional materials, Ed. H.I. Starnberg and H.P. Hughes (Kluwer, 2000).
  • Absolute band mapping by combined angle-dependent by very-low-energy electron diffraction and photoemission: Application to Cu, V.N. Strocov, R. Claessen, G. Nicolay, S. Hüfner, A. Kimura, A. Harasawa, S. Shin, A. Kakizaki, P.O. Nilsson, H.I. Starnberg, and P. Blaha, Phys. Rev. Lett. 81, 4943 (1998).
  • New method for absolute band structure determination by combining photoemission with Very-Low-Energy Electron Diffraction: Application to Layered VSe2, V.N. Strocov, H.I. Starnberg, P.O. Nilsson, H.E. Brauer, and L.J. Holleboom, Phys. Rev. Lett. 79, 467 (1997).
Full publication list