Secondary Ion Mass-Spectrometer (SIMS)The ATOMIKA 4000 shielded SIMS has been installed in 1995 in PSI. It is specifically designed for the analysis of high irradiated samples, both fuel (UO2;, MOX…) and cladding materials (Zircaloy-2, M5…). The maximum authorized activity in the analysis chamber is of 1×101010 Bq 60Co equivalent.
Three primary ion sources are usable, depending on the type of investigation: 133Cs+ and (16O2)+ for in depth investigation (depth profile) and 69Ga+ for surface investigation (ion mapping). Main characteristics for the different primary ions beam:
The noticed beam diameters correspond to the lowest beam intensity (beam current).
|Energy (keV)||Beam diameter (µm)||Intensity range (nA)|
|69Ga+||25||0.3||0.01 - 5|
|(16O2)+||12||15||5 - 1500|
|133Cs+||10||15||5 - 1000|
PSI is a world leader in the application of the SIMS technique on radioactive samples:
- Li and B quantification in the outer oxide layer of irradiated cladding (performed using implanted reference materials).
- Analysis of irradiated fuel: distribution of fission products and minor actinides isotopes along a pellet diameter (Pu isotopes, U isotopes, O, Cs, I…).
- Fission gases (Xe and Kr) investigation: distribution of bubbles along the pellet diameter.
- 18O diffusion profile through the first 10 µm of material (Solid Oxide Fuel Cells).