Surfaces / Interfaces: Microscopy (SIM) Beamline

The SIM beamline is dedicated to spatially and non-spatially resolved x-ray absorption spectroscopy using polarized soft x-rays covering topics ranging from catalysis to battery research and magnetism. The SIM beamline offers several endstations that are open to user via the SLS proposals system:

  • A Photo-Emission Electron Microscope (PEEM) (Model: SPELEEM, Elmitec GmbH) as a permanent endstation. The instrument allows to image samples using the photoelectric effect with very high spatial resolution (50 nm), chemical and magnetic sensitivity. With an energy analyzer the excited photoelectrons can be energy-selected. In addition to illumination by X-rays, illumination by low energy electrons is possible. In this low energy electron microscopy (LEEM) mode additional contrast mechanisms are available.
  • A multipurpose spectroscopy endstations (MultiXAS) - currently being commissioned.
  • A soft x-ray ptychography microscope (SOPHIE) operated by the Microspectroscopy Group.
  • An open port for user endstations available after consultation with the beamline scientists.

The SIM beamline is operated by the Microscopy and Magnetism Group.

Energy range260-1600 eV
Flux (1 keV)1 x 1015 photons/s/0.1%BW/ 0.4 A
Focused spot size30 µm x 30 µm (V x H)
Spectral resolution> 5000
PolarizationLinear: 0o (horizontal) , ± 45o, and 90o (vertical)
Circular: right / left
Endstation (ES1)Photo-emission electron microscope (PEEM) with spatial resolution = 50 nm, variable sample temperature: 50 - 1'800 K.
Endstation (ES2)X-ray absorption spectroscopy chamber (MultiXAS) for total electron yield (TEY) and fluorescence (TFY) measurements in applied field (130 mT) and variable sample temperature (10 - 400 K).
Endstation (ES3)Resonant x-ray scattering (RESOXS). Not open for users. Please contact Urs Staub.
Endstation (ES4)Soft x-ray ptychography microscope (SOPHIE) operated by the Microspectroscopy Group.
Open port (ES)External endstations such as near ambient pressure photo-emission (NAPP). These endstations belong to user groups and can only be used in collaboration with them.

News

Schematic of membrane flexure and domain modification under strain

Designing antiferromagnetic domains by stretching membranes in STXM

Researchers from an international collaboration between the United Kingdom and Switzerland have performed imaging of an antiferromagnetic iron oxide membrane using soft X-ray microscopy. By stretching the membranes using a gas cell, the team investigated the modification of domain structures under strain.

multiferroicity-in-rnio3-perovskites

Elusive multiferroicity in RNiO3 perovskites

In our recent paper we examined YNiO3 and proved that the RNiO3 type material known for its metal-insulator transition is in fact a type II multiferroic. We provide direct evidence of an electric-field-driven switch of the noncolliear magnetic state finally confirming the proposed type II multiferroic nature of YNiO3.

optical magnetization switching

Mechanism For All-Optical Magnetization Switching

X-rays reveal a non-collinear magnetic state as the base for all-optical magnetization switching.