Dr. Mirko Holler

Mirko Holler
Portrait Mirko Holler

Senior Scientist - high-resolution 3D X-ray imaging

Paul Scherrer Institut
Forschungsstrasse 111
5232 Villigen PSI

Mirko Holler is a scientist at PSI and responsible for instrumentation for high-resolution hard X-ray 3D microscopy and related experiments. Before joining PSI Mirko Holler studied Physics at ETH Zurich and finished with a diploma degree in experimental physics in the group of Prof. Ursula Keller. He continued his work in Keller’s group developing a beamline for attosecond time resolved experiments. After finishing his PhD on “Attosecond strong field control” in 2010, he joined the Paul Scherrer Institut, Switzerland.

The development of innovative instrumentation for 3D X-ray imaging including the acquisition of funding, the build-up of the microscopes and the development of software and hardware related to the operation. The application of such microscopes to scientific questions is thereby key for the further development. This includes in-house measurement campaigns but also the operation with and for external user groups in disciplines from material science to biology.

Mirko Holler's research focuses mainly on the methodological development of high-resolution 3D X-ray imaging, mainly on the instrumentation. The goals are to simplify the application of the techniques and to achieve faster measurement times, increase resolution and sample volume. This also involves aspects such as sample preparation and radiation damage.

Three dedicated instruments for high-resolution ptychographic X-ray 3D imaging were developed over the past years. Two of these access 3D information via computed tomography, while the latest development measures in laminography geometry.

Mirko Holler regularly applies such instruments in measurement campaigns, recently focused to the non-destructive imaging of integrated circuits.

For an extensive overview we kindly refer you to our publication repository DORA


• Nature 543: 402 (2017), 10.1038/nature21698
High-resolution non-destructive three-dimensional imaging of integrated circuits
M. Holler, M. Guizar-Sicairos, E. H. R. Tsai, R. Dinapoli, E. Müller, O. Bunk, J. Raabe and G. Aeppli
• Nature Electronics 2: 464 (2019), 10.1038/s41928-019-0309-z
Three-dimensional imaging of integrated circuits with macro- to nanoscale zoom
M. Holler, M. Odstrcil, M. Guizar-Sicairos, M. Lebugle, E. Müller, S. Finizio, G. Tinti, C. David, J. Zusman, W. Unglaub, O. Bunk, J. Raabe, A. F. J. Levi, G. Aeppli
• Nature 547: 328 (2017), 10.1038/nature23006
Three-dimensional magnetization structures revealed with X-ray vector nanotomography
Donnelly, C., M. Guizar-Sicairos, V. Scagnoli, S. Gliga, M. Holler, J. Raabe and L. J. Heyderman
• Nature Nanotechnology (2020), 10.1038/s41565-020-0649-x
Time-resolved imaging of three-dimensional nanoscale magnetization dynamics
C. Donnelly, S. Finizio, S. Gliga, M. Holler, A. Hrabec, M. Odstrčil, S. Mayr, V. Scagnoli, L. J. Heyderman, M. Guizar-Sicairos, J. Raabe
• Scientific Reports 7: 6291 (2017), 10.1038/s41598-017-05587-4
Three-Dimensional Imaging of Biological Tissue by Cryo X-Ray Ptychography
S. Shahmoradian, E. Tsai, A. Diaz, M. Guizar-Sicairos, L. Spcyher, J. Raabe, M. Britschgi, A. Ruf, H. Stahlberg and M. Holler


• J. Synchrotron Radiat. 27:730, 10.1107/S1600577520003586
LamNI – an instrument for X-ray scanning microscopy in laminography geometry
M. Holler, M. Odstrcil, M. Guizar-Sicairos, M. Lebugle, U. Frommherz, T. Lachat, O. Bunk, J. Raabe, G. Aeppli
• J. Synchrotron Radiat. 27 (2020), 10.1107/S1600577519017028
A lathe system for micrometre-sized cylindrical sample preparation at room and cryogenic temperatures
M. Holler, J. Ihli, E. H. R. Tsai, F. Nudelman, M. Verezhak, W. D. J. van de Berg, S. H. Shahmoradian
• J. Synchrotron Radia. 26: 504 (2019), 10.1107/S160057751801785X
Fast positioning for X-ray scanning microscopy by a combined motion of sample and beam defining optics
M. Odstrcil, M. Lebugle, T. Lachat, J. Raabe, M. Holler
• Rev. Sci. Instrum. 89(4): 043706 (2018), 10.1063/1.5020247
OMNY—A tOMography Nano crYo stage
M. Holler, J. Raabe, A. Diaz, M. Guizar-Sicairos, R. Wepf, M. Odstrcil, F. R. Shaik, V. Panneels, A. Menzel, B. Sarafimov, S. Maag, X. Wang, V. Thominet, H. Walther, T. Lachat, M. Vitins and O. Bunk
• Rev. Sci. Instrum. 88(11): 113701 (2017), 10.1063/1.4996092
OMNY PIN-A versatile sample holder for tomographic measurements at room and cryogenic temperatures
M. Holler, J. Raabe, R. Wepf, S.H. Shahmoradian, A. Diaz, B. Sarafimov, T. Lachat, H. Walther, M. Vitins
• Optical Engineering 54(5), (2015), 10.1117/1.OE.54.5.054101
Error motion compensating tracking interferometer for the position measurement of objects with rotational degree of freedom
M. Holler and J. Raabe