X-ray dual phase grating interferometry for the microstructural characterization of mineral- and wood-based building materials
The main goal of this project is to design and implement a lab-based dual-phase grating interferometer (DP-XGI) for a multi-scale characterization of mineral building materials (MBM) and wood-based materials (WBM). Taking advantage of the tunability of the dark-field signal, we pursue to analyze the scattering objects with features in a range of hundreds of nano-meters, which is well beyond the intrinsic system resolution.
This project has been organized in two phases. In Phase I carried out at the Paul Scherrer Institute (PSI), a simulation framework will be developed to optimize gratings design; after the fabrication of the gratings, the dual-phase interferometer will be tested, bench-marked and validated with the help of synchrotron beam time campaigns. In Phase II the dual-phase interferometer will be implemented at the high-resolution system µCT facilities in Ghent University, and used to measure specific building materials and wood based materials with the aim of assessing micro-structural features.