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Ce contenu n'est pas disponible en français.von Hamos-type x-ray emission spectrometer
Status
Available for user operation. Please contact beamline scientist before submitting proposals
Publications
A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies, J. Szlachetko, M. Nachtegaal, E. de Boni, M. Willimann, O. Safonova, J. Sa, G. Smolentsev, M. Szlachetko, J. A. van Bokhoven, J.-Cl. Dousse, J. Hoszowska, Y. Kayser, P. Jagodzinski, A. Bergamaschi, B. Schmitt, C. David, and A. Lücke, Review of Scientific Instruments 83, 103105 (2012)