The electron microscopy facility (EMF) at PSI is presently sustained by three divisions: the divisions for Biology and Chemistry (BIO; chair of EMF), for Nuclear Energy and Safety Research (NES) and for Energy and Environment (ENE).
With a focused ion beam instrument (Zeiss, NVision 40), three transmission electron microscopes (JEM ARM200F NeoARM, probe corrected for HRSTEM; JEM 2200FS, dedicated for cryo TEM; and JEM 2010 dedicated for materials science TEM, all JEOL) and plenty of preparation tools, it offers a direct access to electron microscopic techniques in the field of biology as well as materials science.
The facility is unique within Switzerland as it also allows the investigation of radioactive materials.
We provide opportunity of training and service for the members. Members have first priority regarding the availability of beam time at the instruments. Also non-members are welcome at the facility. For non-members the use of the instruments is charged on an hourly basis (fees).
Organisation of EMF
Users
Present Core Member Groups
- BIO:
Prof. Dr. Takashi Ishikawa, Prof. Dr. Vladimir Korkhov, Prof. Dr. Gebhard Schertler, Prof. Dr. Michel Steinmetz, Dr. Adrian Wanner - NES:
PD Dr. Manuel A. Pouchon, Dr. Jia-Chao Chen, Dr. Yong Dai, Dr. Johannes Bertsch, Dr. Hans-Peter Seifert, Dr. Stefan Ritter, Prof. PD Dr. Philippe Spätig, Prof. Dr. Patrick Julian Steinegger, Prof. Dr. Margit Schwikowski-Gigar - NUM:
Prof. Dr. L. Heyderman, Dr. Hans-Christian Kästli, Dr. Joachim Kohlbrecher, Prof. Dr. Thomas Lippert, Prof. Dr. Markus Strobl - ENE:
Dr. Felix Büchi, Dr. Mario El Kazzi, Dr. Lorenz Gubler, Prof. Dr. Oliver Kröcher, Prof. Dr. Christian Ludwig, Prof. Dr. Thomas Justus Schmidt, Dr. Sigita Trabesinger, Dr. Davide Ferri - PSD:
Dr. Oliver Bunk, Dr. Bernd Schmitt, Prof. Dr. Frithjof Nolting