Fast acquisition protocol for X-ray scattering tensor tomography

X-ray scattering tensor tomography facilitates the investigation of the microstructural organization in statistically large sample volumes. Established acquisition protocols based on scanning small-angle X-ray scattering and X-ray grating interferometry inherently require long scan times even with high brilliance X-ray sources. Recent developments in X-ray circular diffractive optics enable fast single-shot acquisition of the sample scattering properties with 2D omnidirectional sensitivity. Researchers from the TOMCAT beamline at Paul Scherrer Institut have proposed simple yet inherently rapid acquisition protocols (see Figure) for X-ray scattering tensor tomography leveraging these new optical elements. Results from both simulation and experimental data, supported by a null space analysis, suggest that the proposed acquisition protocols are rapid and corroborate, providing sufficient information for the accurate volumetric reconstruction of the scattering properties. The proposed acquisition protocols will be the cornerstones for rapid inspection or time-resolved tensor tomography of the microstructural organization over an extended field of view. The work is published in Scientific Reports on 29 November 2021.