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X-ray Optics and Applications

The X-Ray Optics and Applications group of LMN works on various fields of research involving the control of x-rays with ultimate precision. We develop instrumentation for large scale facilities such as synchrotrons and x-ray free electron lasers (X-FELs), by applying nanolithography techniques. This includes x-ray diffractive optics such as Fresnel zone plate lenses for imaging and probing of matter on a micro- and nanometer scale. Our optics are used at many synchrotron beam lines worldwide and hold the resolution record in x-ray microscopy. For applications that do not require ultimate resolution, we pursue novel approaches to obtain very high diffraction efficiencies.

Interferometric imaging techniques using hard x-rays also rely on specialized micro-fabricated gratings. The possibility to use this technique not only with synchrotron radiation but also with incoherent x-rays from tube sources makes the technique interesting for commercial applications. The extreme sensitivity of grating interferometry also provides a powerful tool for x-ray optics metrology and wavefront sensing.

The development of a new generation of x-ray sources based on the x-ray free-electron laser (X-FEL) principle have triggered the development of specialized diffractive optics. In order to withstand the extreme power levels of X-FELs, we make Fresnel zone plates based on diamond substrates. Similar devices are made for applications such as spectral monitoring or beam splitting. The latter is used to build multiple split-and-delay lines for ultra-fast pump-probe experiments with unprecedented timing precision.

For the fabrication of these devices, the X-Ray Optics and Applications Group runs LMN’s high performance electron-beam lithography tool Vistec EBPG 5000PlusES, that is also used by many other internal and external research groups.

Highlights

18 August 2017

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A new RIXS analyzer scheme based on transmission zone plates

PSI scientists have developed a new type of X-ray optics that allows for analyzing the emission in resonant inelastic x-ray scattering (RIXS) experiments. The new approach combines the energy dispersion with imaging capabilities. In a collaborative effort with research groups from Göttingen and Hamburg, two new classes of RIXS experiments, energy mapping and RIXS imaging, have been demonstrated.

9 August 2017

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Single-shot Monitoring of Ultrafast Processes via X-ray Streaking at a Free Electron Laser

The advent of x-ray free electron lasers has extended the unique capabilities of resonant x-ray spectroscopy techniques to ultrafast time scales. Here, in collaboration between researchers from PSI, Sorbonne Universités, HASYLAB/DESY, Synchrotron SOLEIL, CNRS, and Uppsala University, we report on a novel experimental method that allows retrieving with a single x-ray pulse the time evolution of an ultrafast process, not only at a few discrete time delays, but continuously over an extended time window.

9 March 2017

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Interlaced zone plates push the resolution limit in x-ray microscopy

A novel type of diffractive lenses based on interlaced structures enable x-ray imaging at resolutions below 10 nm. The fabrication method and the test results of these novel x-ray lenses have been published in the journal Scientific Reports.

References

For references see: List of Publications

Research Topics

Diffractive X-ray Lenses
    • Electroplated Zone Plates and Beam Shapers
    • Ultra-high Resolution Zone Plates
    • Double-Sided Zone Plates
    • Blazed X-ray Optics
    • Zernike X-ray Phase Contrast Microscopy

Grating-based X-ray Interferometry
    • Differential Phase Contrast and Dark-Field Imaging
    • Metrology Applications at Synchrotrons and XFELs
    • Grating Fabrication

Diamond X-ray Optics for XFEL Experiments
    • Diamond Zone Plates for XFELs
    • Beam Splitter Gratings for Spectral Monitoring
    • Ultra-Fast Pump-Probe Experiments