PolLux - X07DA: Scanning Transmission X-Ray Microspectroscopy
|Energy range||250-1600 eV|
|Polarization|| Linear horizontal
|Endstation|| Scanning transmission x-ray microscopy (STXM)
spatial resolution (focus size) < 40 nm,
sample chamber vacuum (10-6 mbar) to 1 atm inert gas or He
Current Highlights and News
Chemical changes inside of breathable airborne particles can cause reactive oxygen species (ROS) and carbon centered radicals (CCRs) to form, which are harmful to our bodies and induce oxidative stress in lungs. Using X-ray spectromicroscopy at the PolLux beamline and mimicking the environmental and sunlit conditions aerosol particles experience in the atmosphere near the Earth Surface, it was recently found that highly viscous organic particles with low water content can attain high concentrations of ROS and CCRs that persist over long times. Natural particles like these will occur in ambient humidity below 60% and effectively trap ROS and CCRs inside that react when exposed to light.
During the past decade, scientists have put high effort to achieve sub-10 nm resolution in X-ray microscopy. Recent developments in high-resolution lithography-based diffractive optics, combined with the extreme stability and precision of the PolLux and HERMES scanning X-ray microscopes, resulted now in a so far unreached resolution of seven nanometers in scanning soft X-ray microscopy. Utilizing this highly precise microscopy technique with the X-ray magnetic circular dichroism effect, dimensionality effects in an ensemble of interacting magnetic nanoparticles can be revealed.
A collaboration of scientists from the ETH Zürich and the Paul Scherrer Institute successfully demonstrated the all-electric operation of a magnetic domain-wall based NAND logic gate, paving the way towards the development of logic applications beyond the conventional metal-oxide semiconductor technology. The work has been published in the journal Nature.