The Board of the Swiss Federal Institutes of Technology has announced the appointment of Dr. Tomas Aidukas as an Assistant Professor of Physics in the the School of Basic Sciences (SB), Institute of Physics (IPHYS) at EPFL. Tomas is a specialist in computational imaging, particularly in the development and application of ptychographic techniques. Starting in June 2026, Tomas joins EPFL to lead the newly formed Laboratory for Nanoscale X-ray Metrology with a highly competitive SNSF Starting Grant. The group will work on the project NEXUS-3D (Nanoscale Examination of Ultra-Small Structures in 3D Using X-rays), dedicated to the development of advanced X-ray microscopy methods and their application to semiconductor metrology. As semiconductor features continue to shrink, NEXUS-3D aims to fill a critical industry gap by developing high-resolution, high-throughput 3D imaging tools currently missing in semiconductor metrology. The project will be carried out in close partnership with PSI and the Computational X-ray Imaging group led by Prof. Manuel Guizar-Sicairos.