Publications

2005

  • Adsorption and surface mobility of cinchonidine on Pt(111) studied by STM von Arx M, Wahl M, Jung TA, Baiker A
    PHYSICAL CHEMISTRY CHEMICAL PHYSICS 7, 273-277 (2005).
    DOI: 10.1039/b406668e
  • Atmospheric pressure coated-wall flow-tube study of acetone adsorption on ice Bartels-Rausch T, Huthwelker T, Gaggeler HW, Ammann M
    JOURNAL OF PHYSICAL CHEMISTRY A 109, 4531 (2005).
    DOI: 10.1021/jp0451871
  • Beam-size effects in radiation damage in insulin and thaumatin crystals Schulze-Briese C, Wagner A, Tomizaki T, Oetiker M
    JOURNAL OF SYNCHROTRON RADIATION 12, 261 (2005).
    DOI: 10.1107/S0909049505003298
  • Chemical patterning of sub-50-nm half pitches via nanoimprint lithography Park S, Saxer S, Padeste C, Solak HH, Gobrecht J, Schift H
    MICROELECTRONIC ENGINEERING 78-79, 682 (2005).
    DOI: 10.1016/j.mee.2004.12.082
  • Coherent x-ray scattering (vol 16, pg 5003, 2004) van der Veen F, Pfeiffer F
    JOURNAL OF PHYSICS-CONDENSED MATTER 17, 6109 (2005).
    DOI: 10.1088/0953-8984/17/38/C01
  • Controlled and reproducible domain wall displacement by current pulses injected into ferromagnetic ring structures Klaui M, Vaz CAF, Bland JAC, Wernsdorfer W, Faini G, Cambril E, Heyderman LJ, Nolting F, Rudiger U
    PHYSICAL REVIEW LETTERS 94, 106601 (2005).
    DOI: 10.1103/PhysRevLett.94.106601
  • Controlling molecular assembly in two dimensions: The concentration dependence of thermally induced 2D aggregation of molecules on a metal surface Stohr M, Wahl M, Galka CH, Riehm T, Jung TA, Gade LH
    ANGEWANDTE CHEMIE-INTERNATIONAL EDITION 44, 7394-7398 (2005).
    DOI: 10.1002/anie.200502316
  • Electronic structure of Li-inserted V6O13 battery cathodes: Rigid band behavior and effects of hybridization Schmitt T, Augustsson A, Nordgren J, Duda LC, Howing J, Gustafsson T, Schwingenschlogl U, Eyert V
    APPLIED PHYSICS LETTERS 86, 064101 (2005).
    DOI: 10.1063/1.1861125
  • Energy level alignment at metal-octaethylporphyrin interfaces Alkauskas A, Ramoino L, Schintke S, von Arx M, Baratoff A, Guntherodt HJ, Jung TA
    JOURNAL OF PHYSICAL CHEMISTRY B 109, 23558-23563 (2005).
    DOI: 10.1021/jp054325j
  • Interface-roughness-induced broadening of intersubband electroluminescence in p-SiGe and n-GaInAs/AlInAs quantum-cascade structures Tsujino S, Borak A, Muller E, Scheinert M, Falub CV, Sigg H, Grutzmacher D, Giovannini M, Faist J
    APPLIED PHYSICS LETTERS 86, 062113 (2005).
    DOI: 10.1063/1.1862344
  • Intersubband absorption of strain-compensated Si1-xGex valence-band quantum wells with 0.7 <= x <= 0.85 Fromherz T, Meduna M, Bauer G, Borak A, Falub CV, Tsujino S, Sigg H, Grutzmacher D
    JOURNAL OF APPLIED PHYSICS 98, 044501 (2005).
    DOI: 10.1063/1.1997292
  • Intra-valence-band mixing in strain-compensated SiGe quantum wells Tsujino S, Borak A, Falub C, Fromherz T, Diehl L, Sigg H, Grutzmacher D
    PHYSICAL REVIEW B 72, 153315 (2005).
    DOI: 10.1103/PhysRevB.72.153315
  • Microcavity arrays for X-ray diffraction studies of ordering phenomena in confined colloid solutions Diaz A, David C, Guo H, Keymeulen H, Pfeiffer F, Wegdam G, Weitkamp T, van der Veen JF
    PHYSICA B-CONDENSED MATTER 357, 199 (2005).
    DOI: 10.1016/j.physb.2004.11.056
  • Momentum selectivity and anisotropy effects in the nitrogen K-edge resonant inelastic x-ray scattering from GaN Strocov VN, Schmitt T, Rubensson JE, Blaha P, Paskova T, Nilsson PO
    PHYSICAL REVIEW B 72, 085221 (2005).
    DOI: 10.1103/PhysRevB.72.085221
  • Multiplicity of magnetic domain states in circular elements probed by photoemission electron microscopy Vaz CAF, Klaui M, Heyderman LJ, David C, Nolting F, Bland JAC
    PHYSICAL REVIEW B 72, 224426 (2005).
    DOI: 10.1103/PhysRevB.72.224426
  • Observation of nonexponential magnetic penetration profiles in the Meissner state: A manifestation of nonlocal effects in superconductors Suter A, Morenzoni E, Garifianov N, Khasanov R, Kirk E, Luetkens H, Prokscha T, Horisberger M
    PHYSICAL REVIEW B 72, 024506 (2005).
    DOI: 10.1103/PhysRevB.72.024506
  • Optical conductivity and x-ray absorption and emission study of the band structure of MnN films Granville S, Ruck BJ, Budde F, Koo A, Downes JE, Trodahl HJ, Bittar A, Strickland N, Williams GVM, Lambrecht WRL, Learmonth T, Smith KE, Kennedy VJ, Markwitz A, Schmitt T
    PHYSICAL REVIEW B 72, 205127 (2005).
    DOI: 10.1103/PhysRevB.72.205127
  • Orbital dynamics of the 4f shell in DyB2C2 Staub U, Mulders AM, Zaharko O, Janssen S, Nakamura T, Lovesey SW
    PHYSICAL REVIEW LETTERS 94, 036408 (2005).
    DOI: 10.1103/PhysRevLett.94.036408
  • Photon energy dependent photoemission study of La0.7Sr0.3MnO3 Falub MC, Shi M, Krempasky J, Hricovini K, Mukovskii YM, Neumann M, Galakhov VR, Patthey L
    SURFACE SCIENCE 575, 29 (2005).
    DOI: 10.1016/j.susc.2004.10.053
  • Picosecond time-resolved X-ray Absorption Spectroscopy of solvated organometallic complexes Gawelda W, Bressler C, Saes M, Kaiser M, Tarnovsky AN, Grolimund D, Johnson SL, Abela R, Chergui M
    PHYSICA SCRIPTA T115, 102 (2005).
  • Recent results on the road to a SiGe quantum cascade laser Borak A, Tsujino S, Falub C, Scheinert M, Diehl L, Muller E, Sigg H, Grutzmacher D, Gennser U, Sagnes I, Blunier S, Fromherz T, Campidelli Y, Kermarrec O, Bensahel D, Faist J
    Group-IV Semiconductor Nanostructures 832, 69 (2005).
  • Resonant L-alpha,L-beta X-ray emission and L-3,L-2 X-ray absorption spectra of 3d metals in Co(2)MnZ (Z = Al, Ga, Sn, Sb) Heusler alloys as an element- selective probe of spin character of valence band Yablonskikh MV, Yarmoshenko YM, Solovyev IV, Kurmaev EZ, Duda LC, Schmitt T, Magnuson M, Nordgren J, Moewes A
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 144, 765 (2005).
    DOI: 10.1016/j.elspec.2005.01.064
  • Shearing interferometer for quantifying the coherence of hard x-ray beams Pfeiffer F, Bunk O, Schulze-Briese C, Diaz A, Weitkamp T, David C, van der Veen JF, Vartanyants I, Robinson IK
    PHYSICAL REVIEW LETTERS 94, 164801 (2005).
    DOI: 10.1103/PhysRevLett.94.164801
  • Spectroscopy of stripe order in La1.8Sr0.2NiO4 using resonant soft X-ray diffraction Schussler-Langeheine C, Schlappa J, Tanaka A, Hu Z, Chang CF, Schierle E, Benomar M, Ott H, Weschke E, Kaindl G, Friedt O, Sawatzky GA, Lin HJ, Chen CT, Braden M, Tjeng LH
    PHYSICAL REVIEW LETTERS 95, 156402 (2005).
    DOI: 10.1103/PhysRevLett.95.156402
  • Structural studies of strain-symmetrised modulation-doped Si/SiGe structures grown by molecular beam epitaxy Falub CV, Meduna M, Muller E, Tsujino S, Borak A, Sigg H, Grutzmacher D, Fromherz T, Bauer G
    JOURNAL OF CRYSTAL GROWTH 278, 495 (2005).
    DOI: 10.1016/j.jcrysgro.2004.12.145
  • Structure and temperature behavior of metallo-supramolecular assemblies Bodenthin Y, Pietsch U, Grenzer J, Geue T, Mohwald H, Kurth DG
    JOURNAL OF PHYSICAL CHEMISTRY B 109, 12795 (2005).
    DOI: 10.1021/jp0458001
  • Structure of aldehyde reductase holoenzyme in complex with the potent aldose reductase inhibitor fidarestat: Implications for inhibitor binding and selectivity El-Kabbani O, Carbone V, Darmanin C, Oka M, Mitschler A, Podjarny A, Schulze-Briese C, Chung RPT
    JOURNAL OF MEDICINAL CHEMISTRY 48, 5536 (2005).
    DOI: 10.1021/jm050412o
  • The Materials Science Beamline at the Swiss Light Source: design and realization Patterson BD, Abela R, Auderset H, Chen Q, Fauth F, Gozzo F, Ingold G, Kuhne H, Lange M, Maden D, Meister D, Pattison P, Schmidt T, Schmitt B, Schulze-Briese C, Shi M, Stampanoni M, Willmott PR
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 540, 42 (2005).
    DOI: 10.1016/j.nima.2004.11.018
  • The materials science beamline at the Swiss Light Source Patterson BD, Bronnimann C, Maden D, Gozzo F, Groso A, Schmitt B, Stampanoni M, Willmott PR
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 238, 224 (2005).
    DOI: 10.1016/j.nimb.2005.06.194
  • Translational operator of mRNA on the ribosome: How repressor proteins exclude ribosome binding Jenner L, Romby P, Rees B, Schulze-Briese C, Springer M, Ehresmann C, Ehresmann B, Moras D, Yusupova G, Yusupov M
    SCIENCE 308, 120 (2005).
    DOI: 10.1126/science.1105639
  • Transport and absorption in strain-compensated Si/Si1-xGex multiple quantum well and cascade structures deposited on Si0.5Ge0.5 pseudosubstrates Grutzmacher D, Tsujino S, Falub C, Borak A, Diehl L, Muller E, Sigg H, Gennser U, Fromherz T, Meduna M, Bauer G, Faist J, Kermarrec O
    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 8, 401 (2005).
    DOI: 10.1016/j.mssp.2004.09.102
  • Vibration welding of wood: X-ray tomography, additives, radical concentration Wieland S, Shi BZ, Pizzi A, Properzi M, Stampanoni M, Abela R, Lu X, Pichelin F
    FOREST PRODUCTS JOURNAL 55, 84 (2005).
  • Water in silicate glasses and melts of environmental interest: from volcanoes to cathedrals Farges F, Djanarthany S, de Wispelaere S, Munoz M, Magassouba B, Haddi A, Wilke M, Schmidt C, Borchert M, Trocellier P, Crichton W, Simionovici A, Petit PE, Mezouar M, Etcheverry MP, Pallot-Frossard I, Bargar JR, Brown GE, Grolimund D, Scheidegger A
    PHYSICS AND CHEMISTRY OF GLASSES 46, 350 (2005).
  • X-ray beam-position monitoring in the sub-micrometre and sub-second regime Bunk O, Pfeiffer F, Stampanoni M, Patterson BD, Schulze-Briese C, David C
    JOURNAL OF SYNCHROTRON RADIATION 12, 795 (2005).
    DOI: 10.1107/S0909049505028189
  • X-ray phase imaging with a grating interferometer Weitkamp T, Diaz A, David C, Pfeiffer F, Stampanoni M, Cloetens P, Ziegler E
    OPTICS EXPRESS 13, 6296 (2005).
    DOI: 10.1364/OPEX.13.006296
  • X-ray wavefront analysis and optics characterization with a grating interferometer Weitkamp T, Nohammer B, Diaz A, David C, Ziegler E
    APPLIED PHYSICS LETTERS 86, 054101 (2005).
    DOI: 10.1063/1.1857066
  • X-ray yield and selectively excited X-ray emission spectra of atenolol and nadolol Soderstrom J, Grasjo J, Kashtanov S, Bergstrom C, Agaker M, Schmitt T, Augustsson A, Duda L, Guo JH, Nordgren J, Luo Y, Artursson P, Rubensson JE
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 144, 283 (2005).
    DOI: 10.1016/j.elspec.2005.01.228