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Laboratory for X-ray Nanoscience and Technologies (LXN)

  • About LXN
    • Organisational Structure
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  • Research Groups
    • X-ray Nano-Optics
      • X-ray Optics for Imaging and Spectroscopy
        • Fresnel Zone Plate for X-ray Microscopy
        • Blazed X-ray Optics
        • Zernike X-ray Phase Contrast Microscopy
        • Fresnel Zone Plates for RIXS
        • Refractive Lenses by 2 Photon 3D Lithography
      • Wavefront Metrology and Manipulation
        • Vortex Fresnel Zone Plates
        • Grating-based Wavefront Metrology
      • X-ray Optics for XFELs
        • Diamond Fresnel Zone Plates
        • Beam Splitter Gratings for Spectral Monitoring
        • A Delay Line for Ultrafast Pump-Probe Experiments
        • X-ray Streaking for Ultrafast Processes
    • Molecular Nanoscience
      • On-surface Chemistry
      • Scanning Probe Transport
      • Spins in Molecular Monolayers
      • SiC: Surfaces and Interfaces
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        • Imaging quantum many-body states
        • Nonlinear magnonics
        • Optical devices & methods
        • Rare-earth quantum magnets
        • Rydberg states in Si ∂-layers
        • Strained Ge laser (former research activity of H. Sigg & collaborators)
        • Van der Waals materials & devices
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    • Scanning Probe Microscopy
    • PEARL Beamline
    • XIL Facility at the SLS
    • Cleanroom Labs
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    • Archive
  • Publications
    • Archive

Dr. Anil Kumar Rajak

Anil Rajak

Post-Doc

Paul Scherrer Institut
Forschungsstrasse 111
5232 Villigen PSI
Schweiz
Telefon
+41 56 310 27 33
E-Mail
anil.rajak@psi.ch
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Paul Scherrer Institut

Forschungsstrasse 111
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Schweiz

Telefon: +41 56 310 21 11
Telefax: +41 56 310 21 99

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