SuperXAS - X10DA
![SuperXAS beamline](/sites/default/files/styles/primer_content_xl/public/2023-11/superxas_v2.png?itok=buMHgzsl)
Person | Position | Phone | |
---|---|---|---|
Maarten Nachtegaal | Group leader | maarten.nachtegaal@psi.ch | +41 56 310 3056 |
Olga Safonova | Scientist | olga.safonova@psi.ch | +41 56 310 5805 |
Nina Genz | Scientist | nina.genz@psi.ch | +41 56 310 5310 |
Grigory Smolentsev | Scientist | grigory.smolentsev@psi.ch | +41 56 310 5173 |
Michael Kaufmann | Technician | michael.kaufmann@psi.ch | +41 56 310 2399 |
Seline Ziegler | Lab technician | seline.ziegler@psi.ch | +41 56 310 5343 |
SuperXAS is a dedicated beamline for X-ray absorption spectroscopy (XAS) and X-ray emission spectroscopy (XES) with enhanced chemical sensitivity and time resolution. The beamline offers flexible sample environments for in situ studies of catalysts and other functional materials.
Experiment types:
- XAS using ionization chambers for transmission detection and a 5-element or a thick sensor silicon drift detector (SDD) for fluorescence detection
- Quick scanning XAS (QEXAFS) using ionization chambers for transmission detection with ms to minute time resolution O.Mueller et al. J. Synchrotron Rad., 2016.
- High resolution XES using von Hamos-type spectrometer (for time-resolved XES and RXES). J.Szlachetko et al. Rev.Sci.Inst.,2012. And by using a Johann-type spectrometer in combination with a SDD detector (for valence-to-core XES). E.Kleymenov et al. Rev.Sci.Inst.,2011.
- Pump-sequential-probes XAS in the time range 30ns-100 µs. G.Smolentsev et al. Farad. Diss., 2014 pump-flow-probe XAS in the time range 50 µs – 1ms. G.Smolentsev et al. JPCC, 2013 and time-resolved measurements in the fluorescence mode with 20ms resolution. Several laser systems are available laser
- Combined operando SAXS and XAFS measurements. M. Povia et al. ACS Catalysis, 2018
- Operando sulfur speciation by non-resonant XES and a special operando cell. RCS Advances, 2020
Energy range | 4.5 - 35 keV |
Flux on sample | 1 x 1012 ph/s at 12 keV |
Spot size on sample± | 100 x 100 µm2 to 5 x 0.5 mm2 |
Intrinsic energy resolution (ΔE/E) | 2.0 x 10-4 for Si(111) 0.5 x 10-4 for Si(311) |